Light stress effect and by nitrogen deficiency in plants of Petiveria alliacea measured with two-chlorophyll-fluorescence technique

H. Zuluaga; A. Oviedo; Efrain Solarte; E. J. Pena

doi:10.1117/12.589468

21 October 2004 Light stress effect and by nitrogen deficiency in plants of Petiveria alliacea measured with two-chlorophyll-fluorescence technique

H. Zuluaga, A. Oviedo, Efrain Solarte, E. J. Pena

Author Affiliations +

Proceedings Volume 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications; (2004) https://doi.org/10.1117/12.589468
Event: 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, 2004, Porlamar, Venezuela

Abstract

The chlorophyll fluorescence was studied in Petiveria alliacea plants exposed to different nitrogen concentrations and light radiation, the response was measured by two different forms; (1) measuring the photosynthetic efficiency with a pulse amplitude modulated fluorometro (PAM) emitted by a 650 nm diode and (2) measuring the fluorescence spectra caused by high power 452 nm diode with a SD2000 spectrometer. It was found out that the photosynthetic efficiency decreased in the plants exposed to high radiance and low nitrogen. Two chlorophyll fluorescence peaks were observed on 684 nm and 739 nm, the intensities in this wavelengths are inversely related with the light radiance. The correlation between the FIR and photosynthetic efficiency was very strong (r² = -0.809, p <<0.01); this let us conclude that the fluorescence spectral analysis induced by the diode (excitation at 452 nm) is an efficient technique to detect stress by high light intensity and nitrogen in P. Alliacea plants.

Citation Download Citation

H. Zuluaga, A. Oviedo, Efrain Solarte, and E. J. Pena "Light stress effect and by nitrogen deficiency in plants of Petiveria alliacea measured with two-chlorophyll-fluorescence technique", Proc. SPIE 5622, 5th Iberoamerican Meeting on Optics and 8th Latin American Meeting on Optics, Lasers, and Their Applications, (21 October 2004); https://doi.org/10.1117/12.589468

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