Paper
23 May 2005 Cross-correlation method to obtain temperature profiles from power reflection spectra of a chirped fiber Bragg grating
Daniel J. Kitcher, Anbhawa Nand, Scott A. Wade, Gregory W. Baxter, Stephen F. Collins
Author Affiliations +
Proceedings Volume 5855, 17th International Conference on Optical Fibre Sensors; (2005) https://doi.org/10.1117/12.624241
Event: 17th International Conference on Optical Fibre Sensors, 2005, Bruges, Belgium
Abstract
A method of determining the temperature profile along a short length of optical fiber containing a chirped grating is presented. This provides an alternative to the known method of integrating differences between power-only reflectance spectra to recover a distributed measurement of temperature or strain within a chirped grating without the additional equipment requirements of a phase spectrum measurement. In contrast to other methods of processing the spectra of chirped gratings, the windowed cross-correlation method monitors local wavelength shifts directly, and offers immunity to spurious temperature or strain gradients arising from amplitude measurement errors.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Daniel J. Kitcher, Anbhawa Nand, Scott A. Wade, Gregory W. Baxter, and Stephen F. Collins "Cross-correlation method to obtain temperature profiles from power reflection spectra of a chirped fiber Bragg grating", Proc. SPIE 5855, 17th International Conference on Optical Fibre Sensors, (23 May 2005); https://doi.org/10.1117/12.624241
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KEYWORDS
Fiber Bragg gratings

Reflectivity

Temperature metrology

Optical fibers

Phase measurement

Calibration

Aluminum

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