Paper
23 May 2005 Stress profiling of arc-induced long-period gratings written in pure-silica-core fibers
Gaspar Rego, J. C. C. Carvalho, P. V. S. Marques, Alberto Fernandez Fernandez, F. Duerr, Hans G. Limberger
Author Affiliations +
Proceedings Volume 5855, 17th International Conference on Optical Fibre Sensors; (2005) https://doi.org/10.1117/12.624285
Event: 17th International Conference on Optical Fibre Sensors, 2005, Bruges, Belgium
Abstract
Long-period gratings were written in a pure-silica-core fiber using the electric arc technique. To assess the influence of stress relaxation on grating formation, tomographic stress measurements were performed inside the grating. No stress annealing could be observed within the accuracy of the stress measurement, suggesting a negligible photo-elastic contribution to the arc-induced perturbation of the index profile. In contrast, stress relaxation was found inside a splice of pure-silica-core fiber where discharge conditions are different, indicating the general potential to alter the fibers stress and thus the index profile using an electric arc.
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gaspar Rego, J. C. C. Carvalho, P. V. S. Marques, Alberto Fernandez Fernandez, F. Duerr, and Hans G. Limberger "Stress profiling of arc-induced long-period gratings written in pure-silica-core fibers", Proc. SPIE 5855, 17th International Conference on Optical Fibre Sensors, (23 May 2005); https://doi.org/10.1117/12.624285
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KEYWORDS
Optical fibers

Cladding

Gas lasers

Diffusion

Profiling

Silica

Tomography

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