Paper
17 September 2005 Exact sampling results for 1-D and 2-D signals with finite rate of innovation using Strang-Fix conditions and local reconstruction algorithms
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Proceedings Volume 5914, Wavelets XI; 59140Y (2005) https://doi.org/10.1117/12.616903
Event: Optics and Photonics 2005, 2005, San Diego, California, United States
Abstract
Recently, it was shown that it is possible to sample classes of signals with finite rate of innovation. These sampling schemes, however, use kernels with infinite support and this leads to complex and instable reconstruction algorithms. In this paper, we show that many signals with finite rate of innovation can be sampled and perfectly reconstructed using kernels of compact support and a local reconstruction algorithm. The class of kernels that we can use is very rich and includes any function satisfying Strang-Fix conditions, Exponential Splines and functions with rational Fourier transforms. Our sampling schemes can be used for either 1-D or 2-D signals with finite rate of innovation.
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Pier Luigi Dragotti "Exact sampling results for 1-D and 2-D signals with finite rate of innovation using Strang-Fix conditions and local reconstruction algorithms", Proc. SPIE 5914, Wavelets XI, 59140Y (17 September 2005); https://doi.org/10.1117/12.616903
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KEYWORDS
Reconstruction algorithms

Electronic filtering

Fourier transforms

Statistical analysis

Composites

Filtering (signal processing)

Signal processing

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