Recovery behavior of mixed layer organic light-emitting devices

Shun-Wei Liu; Juen-Kai Wang; Chih-Chien Lee; Chin-Ti Chen; Yih Chang

doi:10.1117/12.609813

8 October 2005 Recovery behavior of mixed layer organic light-emitting devices

Shun-Wei Liu, Juen-Kai Wang, Chih-Chien Lee, Chin-Ti Chen, Yih Chang

Proceedings Volume 5937, Organic Light-Emitting Materials and Devices IX; 59371B (2005) https://doi.org/10.1117/12.609813
Event: Optics and Photonics 2005, 2005, San Diego, California, United States

Abstract

In this report, we have investigated electroluminsecence (EL) characteristics and field-induced recovery of organic light-emitting devices (OLEDs) with a mixed emitting layer (EML). The mixed EML which is composed of a mixture of a hole transport layer (HTL), N,N'-diphenyl-N,N'-bis(1,1'-biphenyl)-4,4'-diamine (NPB), and an electron transport layer (ETL), bis(10-hydroxybenzo[h]quinolinato) beryllium (Bebq₂), was fabricated by co-evaporation. Evident recovery of luminance-voltage characteristic was observed in the mixed device. It is explained by a dipole rearrangement model. The lifetime of this mixed layer OLED can reach 348 min. with initial luminance of 11,000 cd/m² which is two times better that of the comparable heterojunction device.

Citation Download Citation

Shun-Wei Liu, Juen-Kai Wang, Chih-Chien Lee, Chin-Ti Chen, and Yih Chang "Recovery behavior of mixed layer organic light-emitting devices", Proc. SPIE 5937, Organic Light-Emitting Materials and Devices IX, 59371B (8 October 2005); https://doi.org/10.1117/12.609813

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