Diffraction signature analysis methods for improving scatterometry precision

Mike Littau; Darren Forman; Josh Bruce; Christopher J. Raymond; Steven G. Hummel

doi:10.1117/12.656729

24 March 2006 Diffraction signature analysis methods for improving scatterometry precision

Mike Littau, Darren Forman, Josh Bruce, Christopher J. Raymond, Steven G. Hummel

Proceedings Volume 6152, Metrology, Inspection, and Process Control for Microlithography XX; 615236 (2006) https://doi.org/10.1117/12.656729
Event: SPIE 31st International Symposium on Advanced Lithography, 2006, San Jose, California, United States

Abstract

Scatterometry is a fast, non-destructive critical dimension (CD) optical metrology technique based on the analysis of light scattered from a periodic array of features. With technological advances in manufacturing, semiconductor devices are made in ever shrinking geometries. In recent years, the ability of scatterometry metrology tools to measure these devices at a gage-capable level for parameters such as CD, thickness or profile has become more challenging. The focus of this research is to analyze the acquired diffraction signature and determine an optimum diffraction signature "scan path." An optimized scan path can result in higher precision, reduced development time, smaller pre-generated library databases and faster real-time optimization speeds. In this work, we will first review several methods for scan path selection and optimization. Our results indicate that the method choice can influence the scan path selection, and that some of the methods are complementary to one another. For example, one method, which we term orthogonal sensitivity, uses intelligent algorithms to select optimal scan path points based on enhancing single parameter sensitivity. While the method works well, it neglects parameter correlation effects. Thus, we will also review a method where correlation effects are considered. Finally, we will calculate and summarize the effectiveness of optimal scan path selection techniques using challenging lithography applications.

Citation Download Citation

Mike Littau, Darren Forman, Josh Bruce, Christopher J. Raymond, and Steven G. Hummel "Diffraction signature analysis methods for improving scatterometry precision", Proc. SPIE 6152, Metrology, Inspection, and Process Control for Microlithography XX, 615236 (24 March 2006); https://doi.org/10.1117/12.656729

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