Characterization and comparison of 128x128 element nuclear optical dynamic display system resistive arrays

Alexander G. Hayes; Fino J. Caraco; David C. Harrison; John M. Sorvari

doi:10.1117/12.663802

16 May 2006 Characterization and comparison of 128x128 element nuclear optical dynamic display system resistive arrays

Alexander G. Hayes, Fino J. Caraco, David C. Harrison, John M. Sorvari

Proceedings Volume 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI; 62080X (2006) https://doi.org/10.1117/12.663802
Event: Defense and Security Symposium, 2006, Orlando (Kissimmee), Florida, United States

Abstract

Dynamic infrared scene projection is a common technology used to provide end to end testing and characterization of infrared sensor systems. Scene projection technology will play an increasing role in infrared system evaluation and development as the cost and risk of flight testing increases and new display technologies begin to emerge. This paper describes a series of tests performed in the Seeker Experimental System (SES) at MIT Lincoln Laboratory (MIT LL). A small collection of 128×128 element Nuclear Optical Dynamic Display System (NODDS) resistive arrays were tested and compared using FIESTA drive electronics developed by ATK Mission Research. The residual spatial nonuniformity of the NODDS arrays were calculated after applying a sparse grid based nonuniformity correction algorithm developed at MIT LL. The nonuniformity correction algorithm is a slightly modified version of the industry standard sparse grid technique and is outlined in this paper. Additional metrics used to compare the arrays include emitter temporal response, raw nonuniformity, transfer function smoothness, dynamic range, and bad display pixel characteristics.

Citation Download Citation

Alexander G. Hayes, Fino J. Caraco, David C. Harrison, and John M. Sorvari "Characterization and comparison of 128x128 element nuclear optical dynamic display system resistive arrays", Proc. SPIE 6208, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XI, 62080X (16 May 2006); https://doi.org/10.1117/12.663802

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