Paper
3 April 2008 Particle tracking from in-line holograms by using single wavelet coefficient
Author Affiliations +
Proceedings Volume 6793, International Workshop and Conference on Photonics and Nanotechnology 2007; 679305 (2008) https://doi.org/10.1117/12.798951
Event: International Workshop and Conference on Photonics and Nanotechnology 2007, 2007, Pattaya, Thailand
Abstract
We propose a new digital method for tracking position of particles from in-line holograms by using single wavelet coefficient. By computing a wavelet transform of the 1-D intensity profile of a hologram, resultant wavelet coefficients provide space-varying frequency information of an interference pattern. Our study finds that a dilation which is given by the maximum value of the real wavelet coefficient appeared at the center position of the interference pattern is determined by a recording distance and a wavelength of a coherent illuminating light. Therefore, this dilation can be used for extracting the recording distance of particles from the holograms. A feasibility of this method is experimentally verified by analyzing holograms of a line object.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
S. Soontaranon and J. Widjaja "Particle tracking from in-line holograms by using single wavelet coefficient", Proc. SPIE 6793, International Workshop and Conference on Photonics and Nanotechnology 2007, 679305 (3 April 2008); https://doi.org/10.1117/12.798951
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KEYWORDS
Holograms

Wavelets

Particles

Distance measurement

Wavelet transforms

CCD image sensors

Holography

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