Paper
10 November 2007 Feature extraction of attributed scattering centers on high resolution SAR imagery
Jin Yang, Dong-mei Yan, Chao Wang, Hong Zhang
Author Affiliations +
Proceedings Volume 6795, Second International Conference on Space Information Technology; 67951R (2007) https://doi.org/10.1117/12.773984
Event: Second International Conference on Spatial Information Technology, 2007, Wuhan, China
Abstract
The attributed scattering center model is based on the solutions from both physical optics and the geometric theory of diffraction. In this paper, the attributed scattering center model and the method of extracting the feature of attributed scattering centers from high resolution SAR image are discussed. The method includes four steps: image segmentation, the selection of the model type, the estimate of initial value and the parameter optimization. Seven parameters of one scattering center can be obtained through the above four steps. Then we can get the parameters of all the scattering centers in the imagery by the recurrence procession. The validity of this method can be proved by the results of simulation.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jin Yang, Dong-mei Yan, Chao Wang, and Hong Zhang "Feature extraction of attributed scattering centers on high resolution SAR imagery", Proc. SPIE 6795, Second International Conference on Space Information Technology, 67951R (10 November 2007); https://doi.org/10.1117/12.773984
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Cited by 4 scholarly publications.
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