ZnO is a wide bandgap semiconductor that exhibits properties that are near-ideal for light-emitting diodes, but presents
materials challenges that must be overcome in order to achieve highly efficient light emission. The most significant
issue with ZnO is p-type doping. Related materials issues include understanding electron-hole transport across pn
junctions, as well as understanding and minimizing leakage current paths within the bulk and on the surface. In this
paper, the formation and properties of phosphorus-doped Zn1-xMgxO films, ZnO-based pn homojunctions and
heterojunctions is discussed. The behavior of phosphorus within the ZnO and ZnMgO matrices will be described.
Comparisons with other acceptor dopants will be made. Discussion will include stability of transport properties,
stabilization of surfaces, and device characteristics.
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