High-efficiency blue organic light-emitting devices based on phosphorescent dopant material

Jiang Zhong; Yadong Jiang; Lei Zhang; Junsheng Yu

doi:10.1117/12.831016

21 May 2009 High-efficiency blue organic light-emitting devices based on phosphorescent dopant material

Jiang Zhong, Yadong Jiang, Lei Zhang, Junsheng Yu

Proceedings Volume 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies; 728233 (2009) https://doi.org/10.1117/12.831016
Event: AOMATT 2008 - 4th International Symposium on Advanced Optical Manufacturing, 2008, Chengdu, Chengdu, China

Abstract

A novel kind of multilayer blue electrophosphorescent organic light-emitting diode (PHOLED) is developed via vacuum thermal deposition method. Host and dopant materials are co-deposited to fabricate as an emissive layer (EML) in one vacuum chamber. The (tpbi)₂Ir(acac) as dopant material is synthesized based on noble metal element iridium. The film thickness of each layer is in situ controlled with a quartz crystal microbalance. The typical device structure is ITO/CuPc (30nm)/NPB (40nm)/TPBi(30nm):(tpbi)₂Ir(acac) (X wt%)/Alq₃ (20nm)/LiF (1nm)/Al (100nm), where X wt% stands for the doping concentration ranging from 1 to 4 wt%. Optoelectronic characteristics including current, bias voltage, brightness, efficiency and spectrum of the devices is characterized. The results showed that the current of the device under low applied voltage is consistent with the Richaardon-Schotty emission, and has linear relationship under different voltages. When X wt% is 3 wt%, a maximum luminance efficiency of the PHOLED of 5.37lm/W with a luminance of 317cd/m² at 7.0V is obtained. When the driving voltage is 15 V, the brightness of the device reached to 7,827 cd/m², corresponding to the CIE coordinates of x=0.142, y=0.217.

Citation Download Citation

Jiang Zhong, Yadong Jiang, Lei Zhang, and Junsheng Yu "High-efficiency blue organic light-emitting devices based on phosphorescent dopant material", Proc. SPIE 7282, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies, 728233 (21 May 2009); https://doi.org/10.1117/12.831016

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