Detection for low light leakage based on CCD and image processing technology

Ting-wan Wu; Cui Yin; Yi-hui Duan

doi:10.1117/12.836004

5 August 2009 Detection for low light leakage based on CCD and image processing technology

Ting-wan Wu, Cui Yin, Yi-hui Duan

Proceedings Volume 7383, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications; 73834Y (2009) https://doi.org/10.1117/12.836004
Event: International Symposium on Photoelectronic Detection and Imaging 2009, 2009, Beijing, China

Abstract

In this paper, new results on detecting the low light leakage of piston ring with charge coupled device (CCD) and image processing method proposed. For that the high-resolution images of low light leakage collected by CCD optical imaging collection system, then processed and analyzed for computing the relevant parameters of light leakage. The paper also gives an improved algorithm of image denoising based on a new wavelet threshold function, which effectively reduce the interference of image noise so that the visual characters improved obviously. This paper provides a reliable measurement approach for determining whether the light leakage of piston ring is qualified or not. What's more, the most important practical signification of the work is that it achieves the non-contact online and high-precision weak light detection.

Citation Download Citation

Ting-wan Wu, Cui Yin, and Yi-hui Duan "Detection for low light leakage based on CCD and image processing technology", Proc. SPIE 7383, International Symposium on Photoelectronic Detection and Imaging 2009: Advances in Infrared Imaging and Applications, 73834Y (5 August 2009); https://doi.org/10.1117/12.836004

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