3D shape measurement using curvature data (Erratum)

ByoungChang Kim; MinChel Kwon; ByoungUck Choo; InJeong Yoon

doi:10.1117/12.853927

24 November 2009 3D shape measurement using curvature data (Erratum)

ByoungChang Kim, MinChel Kwon, ByoungUck Choo, InJeong Yoon

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Proceedings Volume 7389, Optical Measurement Systems for Industrial Inspection VI; 73893M (2009) https://doi.org/10.1117/12.853927
Event: SPIE Europe Optical Metrology, 2009, Munich, Germany

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ByoungChang Kim, MinChel Kwon, ByoungUck Choo, and InJeong Yoon "3D shape measurement using curvature data (Erratum)", Proc. SPIE 7389, Optical Measurement Systems for Industrial Inspection VI, 73893M (24 November 2009); https://doi.org/10.1117/12.853927

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KEYWORDS

3D metrology

Interferometers

Aspheric lenses

Mirrors

Photovoltaics

Sensors

Profilometers

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