Paper
20 August 2009 Dielectric and electrical properties of sol-gel/DNA blends
R. A. Norwood, C. T. DeRose, R. Himmelhuber, N. Peyghambarian, J. Wang, L. Li, F. Ouchen, J. G. Grote
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Abstract
We investigate the dielectric and electrical properties of sol-gel/DNA-CTMA blends, with particular interest in capacitor applications in energy storage. Methacryloyloxypropyltrimethoxysilane (MAPTMS) was the sol-gel precursor, and DNA-CTMA was blended in to the resulting sol-gel at 5 weight%. The blend was then tested for its dielectric properties and dielectric breakdown strength; at frequencies below 10kHz the blend was found to have a dielectric constant in the range of 7.5, while the breakdown strength was greater than 800 V/μm, an exceptional value. We discuss these results as well as other aspects of the dielectric and electrical properties of these blends.
© (2009) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. A. Norwood, C. T. DeRose, R. Himmelhuber, N. Peyghambarian, J. Wang, L. Li, F. Ouchen, and J. G. Grote "Dielectric and electrical properties of sol-gel/DNA blends", Proc. SPIE 7403, Nanobiosystems: Processing, Characterization, and Applications II, 74030A (20 August 2009); https://doi.org/10.1117/12.830978
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Cited by 11 scholarly publications.
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KEYWORDS
Dielectrics

Sol-gels

Capacitors

Thin films

Polymers

Dielectric breakdown

Temperature metrology

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