Measuring ultra-sonic in-plane vibrations with the scanning confocal heterodyne interferometer

C. Rembe; F. Ur-Rehman; F. Heimes; S. Boedecker; A. Dräbenstedt

doi:10.1117/12.853890

14 May 2010 Measuring ultra-sonic in-plane vibrations with the scanning confocal heterodyne interferometer

C. Rembe, F. Ur-Rehman, F. Heimes, S. Boedecker, A. Dräbenstedt

Proceedings Volume 7718, Optical Micro- and Nanometrology III; 771810 (2010) https://doi.org/10.1117/12.853890
Event: SPIE Photonics Europe, 2010, Brussels, Belgium

Abstract

The advanced progress in miniaturization technologies of mechanical systems and structures has led to a growing demand of measurement tools for three-dimensional vibrations at ultra-high frequencies. Particularly radio-frequency, micro-electro-mechanical (RF-MEM) technology is a planar technology and, thus, the resonating structures are much larger in lateral dimensions compared to the height. Consequently, most ultra-high-frequency devices have larger inplane vibration amplitudes than out-of-plane amplitudes. Recently, we have presented a heterodyne interferometer for vibration frequencies up to 1.2 GHz. In this paper we demonstrate a new method to extract broad-bandwidth spectra of in-plane vibrations with our new heterodyne interferometer. To accomplish this goal we have combined heterodyne interferometry, scanning vibrometry, edge-knife technique, amplitude demodulation, and digital-image processing. With our experimental setup we can realize in-plane vibration measurements up to 600 MHz. We will also show our first measurements of a broad-bandwidth, in-plane vibration around 200 MHz. Our in-plane and out-of-plane vibration measurements are phase-correlated and, therefore, our technique is suitable for broad-bandwidth, full-3D vibration measurements of ultrasonic microdevices.

Citation Download Citation

C. Rembe, F. Ur-Rehman, F. Heimes, S. Boedecker, and A. Dräbenstedt "Measuring ultra-sonic in-plane vibrations with the scanning confocal heterodyne interferometer", Proc. SPIE 7718, Optical Micro- and Nanometrology III, 771810 (14 May 2010); https://doi.org/10.1117/12.853890

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