Sensitivity of VIIRS polarization measurements

Eugene Waluschka

doi:10.1117/12.861433

27 August 2010 Sensitivity of VIIRS polarization measurements

Eugene Waluschka

Proceedings Volume 7807, Earth Observing Systems XV; 780704 (2010) https://doi.org/10.1117/12.861433
Event: SPIE Optical Engineering + Applications, 2010, San Diego, California, United States

Abstract

The design of an optical system typically involves a sensitivity analysis where the various lens parameters, such as lens spacing and curvatures, to name two parameters, are (slightly) varied to see what, if any, effect this has on the performance and to establish manufacturing tolerances. A similar analysis was performed for the VIIRS instruments polarization measurements to see how real world departures from perfectly linearly polarized light entering VIIRS effects the polarization measurement. The methodology and a few of the results of this polarization sensitivity analysis are presented and applied to the construction of a single polarizer which will cover the VIIRS VIS/NIR spectral range.

Citation Download Citation

Eugene Waluschka "Sensitivity of VIIRS polarization measurements", Proc. SPIE 7807, Earth Observing Systems XV, 780704 (27 August 2010); https://doi.org/10.1117/12.861433

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