Paper
26 July 2011 New optical techniques to improve the visibility of graphene on multiple substrates
Hugo Gonçalves, Peter Schellenberg, Michael Belsley, Luís Alves, Cacilda Moura, Tobias Stauber
Author Affiliations +
Proceedings Volume 8001, International Conference on Applications of Optics and Photonics; 80014G (2011) https://doi.org/10.1117/12.892147
Event: International Conference on Applications of Optics and Photonics, 2011, Braga, Portugal
Abstract
Optical microscopy as a means to identify graphene is hampered by the low absorptivity of its monolayers and few-layer structures. However for many of the upcoming applications for graphene, it is essential to develop techniques to readily deliver images of graphene based structures. We report on two novel techniques and additionally on a well-known, but modified technique for the identification of graphene. All of the described methods employ standard optical reflection and transmission microsocopy and can be readily adapted in most laboratories. One of the novel techniques is based on the enhancement of the optical contrast by refractive index matching using oil immersion microscopy. The second technique, microdroplet condensation, exploits the hydrophobicity difference between the carbonic sheets and almost any arbitrary substrate. The third technique is a modification of the already well known technique to enhance the visibility contrast of graphene using interferometric effects by employing a Si wafer coated with a dielectric of specific thickness.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hugo Gonçalves, Peter Schellenberg, Michael Belsley, Luís Alves, Cacilda Moura, and Tobias Stauber "New optical techniques to improve the visibility of graphene on multiple substrates", Proc. SPIE 8001, International Conference on Applications of Optics and Photonics, 80014G (26 July 2011); https://doi.org/10.1117/12.892147
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Cited by 2 scholarly publications.
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KEYWORDS
Graphene

Dielectrics

Refractive index

Reflection

Polymethylmethacrylate

Silicon

Visibility

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