Paper
8 December 2011 Parameters selection study of high-operating temperature MCT photoconductor detectors
Wei Wang, Jingtong Xu, Peilu Jiang, Pengxiao Xu, Xiang-yang Li
Author Affiliations +
Proceedings Volume 8002, MIPPR 2011: Multispectral Image Acquisition, Processing, and Analysis; 80020D (2011) https://doi.org/10.1117/12.901974
Event: Seventh International Symposium on Multispectral Image Processing and Pattern Recognition (MIPPR2011), 2011, Guilin, China
Abstract
This paper concerned HgCdTe (MCT) infrared photoconductor detectors with high operating temperature. The near room temperature operations of detectors had advantages of light weight, less cost and convenient usage. The selection of material could greatly reduce cost caused by low performance detectors, with usage of unsuitable wafers. Many characteristic parameters were tested before the production period, material were chosen to produce the high yield detectors. Using these parameters for model construction and hypothesis testing, we could efficiently select the material most suitable for high performance detectors. Using the methods of statistical inferences, the product's fabrication management and maintenance abilities could also be greatly improved. In this paper, data of detectors were collected from detectors used in railway observation. The MCT detector was photoconductive with an 800μm× 800μm active area, which responses to radiation from 3μm to 5μm, the detector material was grown by the Bridgeman technique. The hypothesis test was a measure of how close the performance of selected fiber was to the empirical distribution, the Kolmogrov-Smirnov test, Anderson-Darling test and Chi-square goodness-of-fit test were used in this paper. The selection of material had a statistical credibility if the null hypothesis was not rejected. The reliability of detectors could also be improved with the selection of detector parameters.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei Wang, Jingtong Xu, Peilu Jiang, Pengxiao Xu, and Xiang-yang Li "Parameters selection study of high-operating temperature MCT photoconductor detectors", Proc. SPIE 8002, MIPPR 2011: Multispectral Image Acquisition, Processing, and Analysis, 80020D (8 December 2011); https://doi.org/10.1117/12.901974
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KEYWORDS
Sensors

Semiconducting wafers

Photoresistors

Resistance

Data modeling

Sensor performance

Doping

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