Characterization and source identification of fugitive dusts by light and electron microscopy

Richard S. Brown

doi:10.1117/12.885022

8 June 2011 Characterization and source identification of fugitive dusts by light and electron microscopy

Richard S. Brown

Proceedings Volume 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences; 803607 (2011) https://doi.org/10.1117/12.885022
Event: SPIE Defense, Security, and Sensing, 2011, Orlando, Florida, United States

Abstract

Industrial emissions are characteristic of the manufacturing process that produced them. The storage, production and transportation of raw materials, finished product and byproducts create particles that can be characterized using a combination of light and electron microscopy. Complex mixtures of dust that settle on surfaces and individuals inside and outside of a manufacturing facility provide particles that can be compared directly to reference materials from suspected sources. Characterization of settled dusts can also guide an investigation by suggesting potential sources of the particulate comprising the dust.

Citation Download Citation

Richard S. Brown "Characterization and source identification of fugitive dusts by light and electron microscopy", Proc. SPIE 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences, 803607 (8 June 2011); https://doi.org/10.1117/12.885022

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