Pump-probe laser development for the European X-ray Free-Electron Laser facility

Max J. Lederer; Mikhail Pergament; Martin Kellert; Cruz Mendez

doi:10.1117/12.928961

15 October 2012 Pump-probe laser development for the European X-ray Free-Electron Laser facility

Max J. Lederer, Mikhail Pergament, Martin Kellert, Cruz Mendez

Proceedings Volume 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications; 85040L (2012) https://doi.org/10.1117/12.928961
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

The successful implementation of superconducting LINAC technology at the European XFEL will boost the time averaged X-RAY power density substantially above current values. In fact, the XFEL will operate at repetition rates of up to 4.5MHz. However, this high pulse rate occurs only during 600μs long bursts of 10Hz repetition rate, rendering up to 27000 pulses per second. Matching this peculiar burst mode operation is a requirement also for the pump-probe femtosecond laser used in experiments. There is currently no commercially available femtosecond laser technology offering this kind of output at close to mJ-level energies per pulse and sub-20fs pulse width. We will outline the scheme of the pump-probe laser currently under development at the European XFEL. The laser design is based on a noncollinear optical parametric amplifier (NOPA) which will be pumped by sub-picosecond pulses from a high power, frequency-doubled Yb:YAG slab amplifier, delivering up to 20kW of fundamental average power during a burst. The design aims at highest possible flexibility regarding intra-burst rep-rates and pulse energies. Also, the use of uncompressed as well as compressed NOPA pump pulses at fundamental wavelength will enhance the flexibility in experiments.

Citation Download Citation

Max J. Lederer, Mikhail Pergament, Martin Kellert, and Cruz Mendez "Pump-probe laser development for the European X-ray Free-Electron Laser facility", Proc. SPIE 8504, X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications, 85040L (15 October 2012); https://doi.org/10.1117/12.928961

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