Paper
4 March 2013 Multispectral CMOS sensors with on-chip nanostructures for wavelength monitoring of LED devices
Stephan Junger, Nanko Verwaal, Wladimir Tschekalinskij, Norbert Weber
Author Affiliations +
Abstract
High-end illumination devices based on LEDs require precise color matching, because the dominant wavelength depends on temperature and changes due to aging. We demonstrate the performance of multispectral sensors fabricated using a complementary metal-oxide semiconductor (CMOS) process for color-sensing feedback. Various plasmonic nanostructures were simulated and implemented to achieve band pass and cut-off filters, placed on top of photodiodes. These devices for multispectral sensing can be fabricated in high volume and measurements indicate that a wavelength change of 3 nm yields a relative signal change of more than 20 % due to the steep-edge characteristics of the filters.
© (2013) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Stephan Junger, Nanko Verwaal, Wladimir Tschekalinskij, and Norbert Weber "Multispectral CMOS sensors with on-chip nanostructures for wavelength monitoring of LED devices", Proc. SPIE 8641, Light-Emitting Diodes: Materials, Devices, and Applications for Solid State Lighting XVII, 86411B (4 March 2013); https://doi.org/10.1117/12.2004497
Lens.org Logo
CITATIONS
Cited by 2 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Photodiodes

Nanostructures

Sensors

Optical filters

Light emitting diodes

CMOS sensors

Metals

Back to Top