3D measurement using circular gratings

Kevin Harding

doi:10.1117/12.2023523

30 September 2013 3D measurement using circular gratings

Kevin Harding

Author Affiliations +

Proceedings Volume 8833, Tribute to H. John Caulfield; 883305 (2013) https://doi.org/10.1117/12.2023523
Event: SPIE Optical Engineering + Applications, 2013, San Diego, California, United States

Abstract

3D measurement using methods of structured light are well known in the industry. Most such systems use some variation of straight lines, either as simple lines or with some form of encoding. This geometry assumes the lines will be projected from one side and viewed from another to generate the profile information. But what about applications where a wide triangulation angle may not be practical, particularly at longer standoff distances. This paper explores the use of circular grating patterns projected from a center point to achieve 3D information. Originally suggested by John Caulfield around 1990, the method had some interesting potential, particularly if combined with alternate means of measurement from traditional triangulation including depth from focus methods. The possible advantages of a central reference point in the projected pattern may offer some different capabilities not as easily attained with a linear grating pattern. This paper will explore the pros and cons of the method and present some examples of possible applications.

Citation Download Citation

Kevin Harding "3D measurement using circular gratings", Proc. SPIE 8833, Tribute to H. John Caulfield, 883305 (30 September 2013); https://doi.org/10.1117/12.2023523

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KEYWORDS

Moire patterns

3D metrology

Fluctuations and noise

Structured light

Ions

Lithium

Computer programming

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