High power diode lasers reliability experiment

Guoguang Lu; Shaofeng Xie; Mingming Hao; Yun Huang; Yunfei En

doi:10.1117/12.2045410

31 December 2013 High power diode lasers reliability experiment

Guoguang Lu, Shaofeng Xie, Mingming Hao, Yun Huang, Yunfei En

Proceedings Volume 9042, 2013 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments; 90421H (2013) https://doi.org/10.1117/12.2045410
Event: International Conference on Optical Instruments and Technology (OIT2013), 2013, Beijing, China

Abstract

In order to evaluate and obtain the actual lifetime data of high power laser diodes, an automated high power laser diodes reliability experiment was developed and reported in this paper. This computer controlled setup operates the laser diodes 24 hours a day, the parameters such as output power, wavelength were test once in one hour. The experiment has 60 work stations, the temperature control range is from 25°C to 70°C, and the output power of the aging device is beyond 20W.

Citation Download Citation

Guoguang Lu, Shaofeng Xie, Mingming Hao, Yun Huang, and Yunfei En "High power diode lasers reliability experiment", Proc. SPIE 9042, 2013 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 90421H (31 December 2013); https://doi.org/10.1117/12.2045410

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available