Aberration analysis and calculation in system of Gaussian beam illuminates lenslet array

Zhu Zhao; Mei Hui; Ping Zhou; Tianquan Su; Yun Feng; Yuejin Zhao

doi:10.1117/12.2060476

8 September 2014 Aberration analysis and calculation in system of Gaussian beam illuminates lenslet array

Zhu Zhao, Mei Hui, Ping Zhou, Tianquan Su, Yun Feng, Yuejin Zhao

Proceedings Volume 9195, Optical System Alignment, Tolerancing, and Verification VIII; 91950I (2014) https://doi.org/10.1117/12.2060476
Event: SPIE Optical Engineering + Applications, 2014, San Diego, California, United States

Abstract

Low order aberration was founded when focused Gaussian beam imaging at Kodak KAI -16000 image detector, which is integrated with lenslet array. Effect of focused Gaussian beam and numerical simulation calculation of the aberration were presented in this paper. First, we set up a model of optical imaging system based on previous experiment. Focused Gaussian beam passed through a pinhole and was received by Kodak KAI -16000 image detector whose microlenses of lenslet array were exactly focused on sensor surface. Then, we illustrated the characteristics of focused Gaussian beam and the effect of relative space position relations between waist of Gaussian beam and front spherical surface of microlenses to the aberration. Finally, we analyzed the main element of low order aberration and calculated the spherical aberration caused by lenslet array according to the results of above two steps. Our theoretical calculations shown that , the numerical simulation had a good agreement with the experimental result. Our research results proved that spherical aberration was the main element and made up about 93.44% of the 48 nm error, which was demonstrated in previous experiment. The spherical aberration is inversely proportional to the value of divergence distance between microlens and waist, and directly proportional to the value of the Gaussian beam waist radius.

Citation Download Citation

Zhu Zhao, Mei Hui, Ping Zhou, Tianquan Su, Yun Feng, and Yuejin Zhao "Aberration analysis and calculation in system of Gaussian beam illuminates lenslet array", Proc. SPIE 9195, Optical System Alignment, Tolerancing, and Verification VIII, 91950I (8 September 2014); https://doi.org/10.1117/12.2060476

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
7 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Gaussian beams

Microlens

Monochromatic aberrations

Sensors

Image sensors

Spherical lenses

Ions

Show All Keywords

Keywords/Phrases

Search In:

Publication Years