Abstract
This PDF file contains the front matter associated with SPIE Proceedings Volume 9574 including the Title Page, Copyright information, Table of Contents, Introduction, and Conference Committee listing.

The papers included in this volume were part of the technical conference cited on the cover and title page. Papers were selected and subject to review by the editors and conference program committee. Some conference presentations may not be available for publication. The papers published in these proceedings reflect the work and thoughts of the authors and are published herein as submitted. The publisher is not responsible for the validity of the information or for any outcomes resulting from reliance thereon.

Please use the following format to cite material from this book:

Author(s), “Title of Paper,” in Material Technologies and Applications to Optics, Structures, Components, and Sub-Systems II, edited by Matthias Krödel, Joseph L. Robichaud, William A. Goodman, Proceedings of SPIE Vol. 9574 (SPIE, Bellingham, WA, 2015) Article CID Number.

ISSN: 0277-786X

ISBN: 9781628417401

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  • The last two digits indicate publication order within the volume using a Base 36 numbering system employing both numerals and letters. These two-number sets start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B … 0Z, followed by 10-1Z, 20-2Z, etc.

The CID Number appears on each page of the manuscript. The complete citation is used on the first page, and an abbreviated version on subsequent pages.

Authors

Numbers in the index correspond to the last two digits of the six-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first four digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

Acreman, Martyn, 06

Ait-Zaid, Sonia, 0J

Bae, Jong-In, 0D

Beckert, Erik, 0M

Béhar-Lafenêtre, S., 0J

Benkenstein, Tino, 0K

Burkhardt, Diana, 0M

Burkhardt, Thomas, 0M

Calvert, Jeff, 02

Campbell, Jeffrey, 03

Clune, Jason, 08

Cornillon, Laurence, 0J

Eberhardt, Ramona, 07, 0M

Ehrhardt, Sascha, 0K

Engel, Axel, 0O

Fischer, Peter, 0O

Gebhardt, Andreas, 07

Ghasemi Nejhad, Mehrdad N., 0E

Gleißner, U., 0L

Goodman, William A., 0E

Grabowski, Kevin, 0K

Hanemann, T., 0L

Hardesty, Robert, 05, 09

Harnisch, Gerd, 0K

Hartung, Johannes, 07

Hashiguchi, Don H., 03

Heberling, Jody, 03

Hibbard, D., 0I

Ho, Joseph, 02

Hobmaier, J., 0L

Hornaff, Marcel, 0M

Jedamzik, Ralf, 0O

Kalkowski, Gerhard, 0K

Kamm, Andreas, 0M

Kinast, Jan, 07

Krödel, Matthias, 0F, 0G

Kunisch, Clemens, 0O

Lee, Haeng-Bok, 0D

Michel, Robert, 08

Middelmann, Thomas, 0N

Morales, Amanda, 03

Myatt, Ray, 04, 06

Parker, Kelsey, 05, 09

Redd, Lafe, 04

Risse, Stefan, 07, 0K

Rogers, Brady, 02

Ruzan, Jeff, 02

Sayer, Aaron, 03

Schmidt, Erik, 0M

Schödel, René, 0N

Sellers, Del, 04

Sheikh, David A., 0C

Soose, Claus Peter, 0F

Stahr, Frank, 0F

Steinkopf, Ralf, 07

Stephenson, Timothy, 08

Stout, M., 0I

Su, Guo-Dung J., 0S

Suk, Jin-Young, 0D

Sweeney, Michael, 02, 04, 06

Tarrant, Andrew, 08

Thompson, Mike, 06

Tricker, David, 08

Tünnermann, Andreas, 0M

Uchida, Dave, 04

Vettese, Tom, 02, 04, 06

Wächter, Daniel, 0F

Walkov, Alexander, 0N

Warren, Mark, 02

Welson, Darren, 0E

Westenberger, Gerhard, 0O

Westerhoff, Thomas, 0O

Wright, Stan, 0E

Zauner, Christoph, 0G

Zeitner, Uwe, 0K

Zhang, Yi-Wei, 0S

Conference Committee

Program Track Chair

  • H. Philip Stahl, NASA Marshall Space Flight Center (United States)

Conference Chairs

  • Matthias Krödel, ECM GmbH (Germany)

  • Joseph L. Robichaud, L-3 Communications SSG (United States)

  • William A. Goodman, Trex Enterprises Corporation (United States)

Conference Program Committee

  • Shyam S. Bayya, U.S. Naval Research Laboratory (United States)

  • A. Marcel Bluth, ATK Aerospace Structures (United States)

  • Nathan Carlie, SCHOTT North America, Inc. (United States)

  • Vince M. Cowan, Air Force Research Laboratory (United States)

  • Hans-Peter Dumm, Air Force Research Laboratory (United States)

  • Richard A. Haber, Rutgers, The State University of New Jersey (United States)

  • Haeng Bok Lee, Agency for Defense Development (Korea, Republic of)

  • Robert Michel, Materion Brush Beryllium & Composites (United States)

  • Ted Mooney, Harris Corporation (United States)

  • Takao Nakagawa, Japan Aerospace Exploration Agency (Japan)

  • Tsuyoshi Ozaki, Composites Research and Development Company, Ltd. (Japan)

  • John W. Pepi, L-3 Communications SSG-Tinsley (United States)

  • Margie F. Pinnell, University of Dayton (United States)

  • Stefan Risse, Fraunhofer-Institut für Angewandte Optik und Feinmechanik (Germany)

  • Michael N. Sweeney, General Dynamics-Global Imaging Technologies (United States)

  • David B. Witkin, The Aerospace Corporation (United States)

Session Chairs

  • 1 Metal Materials I

    Robert Michel, Materion Brush Beryllium & Composites (United States)

  • 2 Metal Materials II

    Robert Michel, Materion Brush Beryllium & Composites (United States)

  • 3 Ceramic Materials I

    Joseph L. Robichaud, L-3 Communications SSG (United States)

  • 4 Ceramic Materials II

    William A. Goodman, Trex Enterprises Corporation (United States)

  • 5 Glass Materials

    Ted Mooney, Harris Corporation (United States)

  • 6 Innovative Metrology Concepts

    Matthias Krödel, ECM Engineered Ceramic Materials GmbH (Germany)

Introduction

This is the second volume of the Material Technologies and Application to Optics, Structures, Components and Subsystems. These proceedings have expanded upon our legacy volumes on Optical Materials and Structures to include other topics related to subsystems, components, and assemblies made of different materials like metals, ceramics, and glass. In addition, we have also added a session on high accuracy material testing.

In this volume you will find interesting contributions of different material technologies:

  • - Metal materials like Be, AlBe

  • - Ceramic Materials like SiC, HB-Cesic, and T300HoneySic

  • - Low-expansion ceramics and glasses like Zerodur

  • - Gradient index refractive materials

In addition to the material papers, you will also find information about a broad band of applications already implemented in current programs or R&D projects.

We have done our best to collect papers about novel technologies and applications from an international community. We hope that you will find this volume exciting and educational.

Matthias Krödel Joseph L. Robichaud William A. Goodman

© (2015) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 9574", Proc. SPIE 9574, Material Technologies and Applications to Optics, Structures, Components, and Sub-Systems II, 957401 (14 September 2015); https://doi.org/10.1117/12.2208520
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KEYWORDS
Ceramics

Beryllium

Metals

Composites

Technologies and applications

Additive manufacturing

Current controlled current source

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