Development of Ni-based multilayers for future focusing soft gamma ray telescopes

David A. Girou; Sonny Massahi; Erlend K. Sleire; Anders C. Jakobsen; Finn E. Christensen

doi:10.1117/12.2186814

4 September 2015 Development of Ni-based multilayers for future focusing soft gamma ray telescopes

David A. Girou, Sonny Massahi, Erlend K. Sleire, Anders C. Jakobsen, Finn E. Christensen

Proceedings Volume 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII; 96031D (2015) https://doi.org/10.1117/12.2186814
Event: SPIE Optical Engineering + Applications, 2015, San Diego, California, United States

Abstract

Ni-based multilayers are a possible solution to extend the upper energy range of hard X-ray focusing telescopes currently limited at ≈79:4 keV by the Pt-K absorption edge. In this study 10 bilayers multilayers with a constant bilayer thickness were coated with the DC magnetron sputtering facility at DTU Space, characterized at 8 keV using X-ray reectometry and fitted using the IMD software. Ni/C multilayers were found to have a mean interface roughness ≈ 1:5 times lower than Ni/B₄C multilayers. Reactive sputtering with ≈ 76% of Ar and ≈ 24% of N₂ reduced the mean interface roughness by a factor of ≈ 1:7. It also increased the coating rate of C by a factor of ≈ 3:1 and lead to a coating process going ≈ 1:6 times faster. Honeycomb collimation proved to limit the increase in mean interface roughness when the bilayer thickness increases at the price of a coating process going ≈ 1:9 times longer than with separator plates. Finally a Ni/C 150 bilayers depth-graded mutilayer was coated with reactive sputtering and honeycomb collimation and then characterized from 10 keV to 150 keV. It showed 10% reectance up to 85 keV.

Citation Download Citation

David A. Girou, Sonny Massahi, Erlend K. Sleire, Anders C. Jakobsen, and Finn E. Christensen "Development of Ni-based multilayers for future focusing soft gamma ray telescopes", Proc. SPIE 9603, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VII, 96031D (4 September 2015); https://doi.org/10.1117/12.2186814

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available