Atom interferometry for practical and fundamental applications

Michael Holynski

doi:10.1117/12.2617004

9 March 2022 Atom interferometry for practical and fundamental applications

Michael Holynski

Proceedings Volume PC12016, Optical and Quantum Sensing and Precision Metrology II; PC1201606 (2022) https://doi.org/10.1117/12.2617004
Event: SPIE OPTO, 2022, San Francisco, California, United States

Abstract

Atom interferometry for practical and fundamental applications was recorded at SPIE Photonics West held in San Francisco, California, United States 2022.

Conference Presentation

Citation Download Citation

Michael Holynski "Atom interferometry for practical and fundamental applications", Proc. SPIE PC12016, Optical and Quantum Sensing and Precision Metrology II, PC1201606 (9 March 2022); https://doi.org/10.1117/12.2617004

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