Open Access Presentation
3 October 2022 Online collaborative approach to teaching hands-on photonic integrated circuit (PIC) device testing (Conference Presentation)
Author Affiliations +
Abstract
PIC device concepts are difficult to grasp, and explanations typically require the solution of Maxwell’s equations. Laboratory experiments which demonstrate the testing of these devices can offer some intuition into device functionality. However, photonics device test on an unpackaged die requires a complicated equipment set-up because devices, both passive (all optical) and active (opto-electronic), need precise (~nm) optical alignment. Online asynchronous courses, Integrated Photonics Test: Passive Devices (IPT:Passive) and Integrated Photonics Test: Active Devices (IPT:Active), that teach hands-on laboratory testing of volume-manufactured photonic integrated circuit (PIC) devices are created as a multi-instructor collaborative approach with lectures and laboratory videos and exercises.
Conference Presentation
© (2022) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Juejun Hu, Jerome Michon, Mikhail Shalaginov, Gillian Micale, Jaime Cardenas, Jelena Notaros, Milica Notaros, Jifeng Liu, Samuel Serna, Pradnya Nagarkar, Lionel C. Kimerling, and Anuradha M. Agarwal "Online collaborative approach to teaching hands-on photonic integrated circuit (PIC) device testing (Conference Presentation)", Proc. SPIE PC12213, Optics Education and Outreach VII, PC1221301 (3 October 2022); https://doi.org/10.1117/12.2633210
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KEYWORDS
Photonic integrated circuits

Integrated photonics

Design for manufacturing

Light sources

Modulators

Video

Resonators

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