3D quantitative phase imaging at the atomic scale based on electron tomography

Yongsoo Yang

doi:10.1117/12.3000113

13 March 2024 3D quantitative phase imaging at the atomic scale based on electron tomography

Yongsoo Yang

Author Affiliations +

Proceedings Volume PC12852, Quantitative Phase Imaging X; PC1285202 (2024) https://doi.org/10.1117/12.3000113
Event: SPIE BiOS, 2024, San Francisco, California, United States

Abstract

Modern science and technology rely on functional materials, and the physical properties of these materials often strongly depend on defects, local disorder, nanoscale heterogeneities, and grain structures at the atomic scale. Atomic electron tomography (AET) is now able to locate the 3D coordinates of individual atoms and their dynamics with picometer precision and elemental specificity. However, the majority of AET results have been based on incoherent imaging methods, which limit the application of AET for radiation-sensitive materials and light chemical elements. In this talk, I will briefly discuss the current capability of AET and introduce ideas based on quantitative phase imaging to enhance dose efficiencies and enable the detection of light elements [1]. [1]. J. Lee et al., Phys. Rev. Applied 19, 054062 (2023).

Conference Presentation

Citation Download Citation

Yongsoo Yang "3D quantitative phase imaging at the atomic scale based on electron tomography", Proc. SPIE PC12852, Quantitative Phase Imaging X, PC1285202 (13 March 2024); https://doi.org/10.1117/12.3000113

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