For imaging, an ideal lens should give images with high-resolution across a large field-of-view (FOV). However, designing and manufacturing such lens is almost impossible due to the intrinsic properties of real materials. Fourier ptychography microscopy (FPM), a computational imaging method, attracts board interests as it improves over imperfections of a real objective. With the aid of computation, FPM can provide aberration-free, high-resolution images over a large FOV. However, its iterative reconstruction is non-convex and may not converge to a real solution. Moreover, its aberration correction algorithm does not work well under large aberrations. In this talk, I will present a new imaging method, termed analytical multiangle illumination microscopy (AMIM), that performs complex field reconstructions using all analytical methods. By using critical-angle and darkfield measurements, AMIM extracts the aberration and reconstructs the complex field in a purely analytical way. We show that AMIM works well with extremely large aberrations and can reconstruct the complex field in a non-iterative way.
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