Nanoimprint lithography, NIL, has been developed for semiconductor lithography technology. In order to extend the field of NIL application, we have proposed templates for transferring three-dimensional shapes, such as dual damascene, and dense hole templates processed by LELE technique, which require high overlay accuracy of EB writing tools. In this presentation, we will discuss the performance of our template fabricated by using various multiple patterning technique. The layout of these templates includes both single layered fine features and multilayered structures, considering applications for random logic patterns and periphery of memory.
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