Poster
28 August 2024 Performance of optical to near infrared TiN/Ti/TiN tri-Layer microwave kinetic inductance detectors
Author Affiliations +
Conference Poster
Abstract
MKIDs made from alternating stacks of Ti and TiN have shown impressive results in far-IR and sub-mm detectors to date, which promises improvements for Optical to Near-IR MKIDs. TiN/Ti/TiN tri-layers offer different advantages between sub-stoichiometric and stoichiometric recipes. We will elaborate on the expected effects of using sub-stoichiometric vs. stoichiometric TiN in triple layers on the wavelength signal-to-noise ratio of MKIDs. We characterise the photon detection performance of TiN/Ti/TiN Optical to Near Infrared MKIDs deposited on silicon wafers. We present measurements of resolving power, quasi-particle lifetime and sensitivity to near-infrared photons with differing pixel fabrication procedures and design.
(2024) Published by SPIE. Downloading of the abstract is permitted for personal use only.
Cáthal McAleer, Gary Donegan, Colm Bracken, Gerhard Ulbricht, Oisin Creaner, Mario De Lucia, and Tom Ray "Performance of optical to near infrared TiN/Ti/TiN tri-Layer microwave kinetic inductance detectors", Proc. SPIE PC13103, X-Ray, Optical, and Infrared Detectors for Astronomy XI, PC131030V (28 August 2024); https://doi.org/10.1117/12.3019043
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