Comprehensive study of thermal optical coefficient for enhanced design of anti-thermal optical devices

Jimmy H. Ni

doi:10.1117/12.3027228

3 October 2024 Comprehensive study of thermal optical coefficient for enhanced design of anti-thermal optical devices

Jimmy H. Ni

Proceedings Volume PC13109, Metamaterials, Metadevices, and Metasystems 2024; PC131090B (2024) https://doi.org/10.1117/12.3027228
Event: Nanoscience + Engineering, 2024, San Diego, California, United States

Abstract

This study investigates the thermal optical coefficient (TOC) of Si, SiNx, SiO2, and TiO2, establishing a comprehensive database across temperatures (20°C-80°C) and wavelengths (400nm-1800nm). This dataset informs the design of anti-thermal optical devices. For instance, utilizing TOC disparities at 1550nm, we developed an anti-thermal quarter-wave plate optical mirror with Si and TiO2. This innovative approach harnesses material-specific thermal responses, showcasing potential applications in designing reliable optical platforms. Our research contributes not only to understanding TOC variations but also provides a practical foundation for advancing anti-thermal optical technologies.

Conference Presentation

Citation Download Citation

Jimmy H. Ni "Comprehensive study of thermal optical coefficient for enhanced design of anti-thermal optical devices", Proc. SPIE PC13109, Metamaterials, Metadevices, and Metasystems 2024, PC131090B (3 October 2024); https://doi.org/10.1117/12.3027228

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