Open Access
1 May 2010 Lateral shearing interferometry, dynamic wavefront sensing, and high-speed videokeratoscopy for noninvasive assessment of tear film surface characteristics: a comparative study
Dorota Helena Szczesna, David Alonso-Caneiro, D. Robert Iskander, Scott A. Read, Michael J. Collins
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Abstract
There are several noninvasive techniques for assessing the kinetics of tear film, but no comparative studies have been conducted to evaluate their efficacies. Our aim is to test and compare techniques based on high-speed videokeratoscopy (HSV), dynamic wavefront sensing (DWS), and lateral shearing interferometry (LSI). Algorithms are developed to estimate the tear film build-up time TBLD, and the average tear film surface quality in the stable phase of the interblink interval TFSQAv. Moderate but significant correlations are found between TBLD measured with LSI and DWS based on vertical coma (Pearson's r2=0.34, p<0.01) and higher order rms (r2=0.31, p<0.01), as well as between TFSQAv measured with LSI and HSV (r2=0.35, p<0.01), and between LSI and DWS based on the rms fit error (r2=0.40, p<0.01). No significant correlation is found between HSV and DWS. All three techniques estimate tear film build-up time to be below 2.5 sec, and they achieve a remarkably close median value of 0.7 sec. HSV appears to be the most precise method for measuring tear film surface quality. LSI appears to be the most sensitive method for analyzing tear film build-up.
©(2010) Society of Photo-Optical Instrumentation Engineers (SPIE)
Dorota Helena Szczesna, David Alonso-Caneiro, D. Robert Iskander, Scott A. Read, and Michael J. Collins "Lateral shearing interferometry, dynamic wavefront sensing, and high-speed videokeratoscopy for noninvasive assessment of tear film surface characteristics: a comparative study," Journal of Biomedical Optics 15(3), 037005 (1 May 2010). https://doi.org/10.1117/1.3431103
Published: 1 May 2010
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Cited by 31 scholarly publications.
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KEYWORDS
RGB color model

Monochromatic aberrations

Interferometry

Wavefront sensors

Eye

Wavefront aberrations

Zernike polynomials

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