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11 July 2016 Depth enhancement in spectral domain optical coherence tomography using bidirectional imaging modality with a single spectrometer
Naresh Kumar Ravichandran, Ruchire Eranga Wijesinghe, Muhammad Faizan Shirazi, Kibeom Park, Mansik Jeon, Woonggyu Jung, Jeehyun Kim
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Journal of Biomedical Optics, Vol. 21, Issue 7, 076005 (July 2016). https://doi.org/10.1117/1.JBO.21.7.076005
Abstract
A method for depth enhancement is presented using a bidirectional imaging modality for spectral domain optical coherence tomography (SD-OCT). Two precisely aligned sample arms along with two reference arms were utilized in the optical configuration to scan the samples. Using exemplary images of the optical resolution target, Scotch tape, a silicon sheet with two needles, and a leaf, we demonstrated how the developed bidirectional SD-OCT imaging method increases the ability to characterize depth-enhanced images. The results of the developed system were validated by comparing the images with the standard OCT configuration (single-sample arm setup). Given the advantages of higher resolution and the ability to visualize deep morphological structures, this method can be utilized to increase the depth dependent fall-off in samples with limited thickness. Thus, the proposed bidirectional imaging modality is apt for cross-sectional imaging of entire samples, which has the potential capability to improve the diagnostic ability.
© 2016 Society of Photo-Optical Instrumentation Engineers (SPIE) 1083-3668/2016/$25.00 © 2016 SPIE
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Naresh Kumar Ravichandran, Ruchire Eranga Wijesinghe, Muhammad Faizan Shirazi, Kibeom Park, Mansik Jeon, Woonggyu Jung, and Jeehyun Kim "Depth enhancement in spectral domain optical coherence tomography using bidirectional imaging modality with a single spectrometer," Journal of Biomedical Optics 21(7), 076005 (11 July 2016). https://doi.org/10.1117/1.JBO.21.7.076005
Published: 11 July 2016
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Cited by 25 scholarly publications.
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KEYWORDS
Optical coherence tomography
Imaging systems
3D image processing
Interferometers
Signal processing
Silicon
Spectroscopy
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