New moire interferometry for measuring three-dimensional displacements

Yinyan Wang; Fu-Pen Chiang

doi:10.1117/12.177106

1 August 1994 New moiré interferometry for measuring three-dimensional displacements

Yinyan Wang, Fu-Pen Chiang

Author Affiliations +

Optical Engineering, Vol. 33, Issue 8, (August 1994). https://doi.org/10.1117/12.177106

Abstract

A new modified moiré interferometry for measuring u, v, and w displacement fields is proposed. The method is actually integrated with in-plane moiré interferometry and a new interferometry that can attain out-of-plane displacements. The sensitivity of the measurement of the out-of-plane displacement is as high as a half-wavelength of the illuminating light. The measured in-plane and out-of-plane displacement fields are mutually independent and definitely defined.

Citation Download Citation

Yinyan Wang and Fu-Pen Chiang "New moiré interferometry for measuring three-dimensional displacements," Optical Engineering 33(8), (1 August 1994). https://doi.org/10.1117/12.177106

Published: 1 August 1994

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