17 April 2017 Characterization of a low-cost, commercially available, vanadium oxide microbolometer array for spectroscopic imaging
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Funded by: U.S. Department of Homeland Security (DHS), Science and Technology Directorate, Office of University Programs
Abstract
Many long-wave infrared spectroscopic imaging applications are limited by the portability and cost of detector arrays. We present a characterization of a newly available, low-cost, uncooled vanadium oxide microbolometer array, the Seek Compact, in accordance with common infrared detector specifications: noise-equivalent differential temperature (NEDT), optical responsivity spectra, and Allan variance. The Compact’s imaging array consists of 156×206  pixels with a 12-μm pixel pitch, 93% of the pixels yield useful temperature readings. Characterization results show optical response between λ=7.4 and 12  μm with an NEDT of 148 mK (at 7  fps). Comparing these results to a research-grade camera, the Seek Compact exhibits a 4× and 48× reduction in weight (2.0/0.5  lbs) and cost ($12,000/$250) but takes 93× longer to achieve the same NEDT (1.55  s/16.6  ms for 45 mK). Additionally, a proof-of-concept spectral imaging experiment of SiN thin films is conducted. Leveraging this price reduction and spectroscopic imaging capability, the Seek Compact has potential in enabling field-deployable and distributed active midinfrared spectroscopic imaging, where cost and portability are the dominate inhibitors and high frame rates are not required.
© 2017 Society of Photo-Optical Instrumentation Engineers (SPIE) 0091-3286/2017/$25.00 © 2017 SPIE
David Benirschke and Scott Howard "Characterization of a low-cost, commercially available, vanadium oxide microbolometer array for spectroscopic imaging," Optical Engineering 56(4), 040502 (17 April 2017). https://doi.org/10.1117/1.OE.56.4.040502
Received: 19 December 2016; Accepted: 27 March 2017; Published: 17 April 2017
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CITATIONS
Cited by 10 scholarly publications.
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KEYWORDS
Imaging spectroscopy

Spectroscopy

Microbolometers

Imaging arrays

Long wavelength infrared

Temperature metrology

Oxides

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