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Surface topography measurement for metal additive manufacturing (AM) is a challenging task for contact and noncontact methods. We present an experimental investigation of the use of coherence scanning interferometry (CSI) for measuring AM surfaces. Our approach takes advantage of recent technical enhancements in CSI, including high dynamic range for light level and adjustable data acquisition rates for noise reduction. The investigation covers several typical metal AM surfaces made from different materials and AM processes. Recommendations for measurement optimization balance three aspects: data coverage, measurement area, and measurement time. This study also presents insight into areas of interest for future rigorous examination, such as measuring noise and further development of guidelines for measuring metal AM surfaces.
Carlos Gomez,Rong Su,Adam Thompson,Jack DiSciacca,Simon Lawes, andRichard K. Leach
"Optimization of surface measurement for metal additive manufacturing using coherence scanning interferometry," Optical Engineering 56(11), 111714 (25 July 2017). https://doi.org/10.1117/1.OE.56.11.111714
Received: 7 April 2017; Accepted: 10 July 2017; Published: 25 July 2017
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Carlos Gomez, Rong Su, Adam Thompson, Jack DiSciacca, Simon Lawes, Richard K. Leach, "Optimization of surface measurement for metal additive manufacturing using coherence scanning interferometry," Opt. Eng. 56(11) 111714 (25 July 2017) https://doi.org/10.1117/1.OE.56.11.111714