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Abdelmalek Boukhenoufa
at GREYC
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Publications (1)
Proceedings Article | 25 May 2004 Paper
Experimental and theoretical analysis of 1/f noise in polysilicon thin film transistors
Abdelmalek Boukhenoufa, Laurent Pichon, Christophe Cordier, Hicham El Din Kotb, Tayeb Mohamed-Brahim
Proceedings Volume 5470, (2004) https://doi.org/10.1117/12.547031
KEYWORDS: Transistors, Interfaces, Thin films, Silicon, Crystals, Solids, Crystallography, Image processing, LCDs, Amorphous silicon
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