Dr. Adam F. G. Leontowich Profile

Dr. Adam F. G. Leontowich

Postdoctorate at Canadian Light Source Inc

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 19 September 2017 Presentation

A new cryo scanning transmission x-ray microscope at the Canadian Light Source (Conference Presentation)

Jan Geilhufe, Adam F. Leontowich, Russ Berg, Chris Regier, Darwin Taylor, Jian Wang, John Swirsky, Chithra Karunakaran, Robert Peters, Mirwais Aktary, Adam Hitchcock, Stephen Urquhart

Proceedings Volume 10389, 103890P (2017) https://doi.org/10.1117/12.2275779

KEYWORDS: X-rays, Microscopes, Light sources, X-ray imaging, Tomography, Absorption spectroscopy, Liquids, Cryogenics, Temperature metrology, Nanoprobes

Read Abstract +

Proceedings Article | 3 May 2013 Paper

Characterizing the focus of a multilayer coated off-axis parabola for FLASH beam at λ = 4.3 nm

Adam F. Leontowich, Andrew Aquila, Francesco Stellato, Richard Bean, Holger Fleckenstein, Mauro Prasciolu, Mengning Liang, Daniel DePonte, Anton Barty, Fenglin Wang, Jakob Andreasson, Janos Hajdu, Henry Chapman, Saša Bajt

Proceedings Volume 8777, 87770T (2013) https://doi.org/10.1117/12.2022403

KEYWORDS: Multilayers, Free electron lasers, Photomicroscopy, Polymethylmethacrylate, Optical testing, Signal attenuation, Mirrors, Reflectivity, Photons, X-ray optics

Read Abstract +

Proceedings Article | 21 March 2012 Paper

Zone plate focused soft x-ray lithography for fabrication of nanofluidic devices

Adam F. Leontowich, Adam Hitchcock

Proceedings Volume 8323, 83231D (2012) https://doi.org/10.1117/12.915803

KEYWORDS: Polymethylmethacrylate, X-rays, Absorption, Optical lithography, X-ray lithography, Nanolithography, Polymers, Scanning electron microscopy, Lithography, Electron beam lithography

Read Abstract +

Proceedings Article | 19 May 2011 Paper

Measurement of the point spread function of a soft x-ray microscope by single pixel exposure of photoresists

Adam F. Leontowich, Tolek Tyliszczak, Adam Hitchcock

Proceedings Volume 8077, 80770N (2011) https://doi.org/10.1117/12.887553

KEYWORDS: Point spread functions, X-rays, Zone plates, Microscopes, Photoresist materials, X-ray lithography, Polymethylmethacrylate, Electron beam lithography, Atomic force microscopy, Light sources

Read Abstract +

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years