Dr. Adrian Trinchi Profile

Dr. Adrian Trinchi

at CSIRO

SPIE Involvement:

Author

Publications (6)

Proceedings Article | 2 September 2010 Paper

Data-constrained microstructure modeling with multi-spectrum x-ray CT

Y. Yang, A. Tulloh, T. Muster, A. Trinchi, S. Mayo, S. Wilkins

Proceedings Volume 7804, 78040N (2010) https://doi.org/10.1117/12.861964

KEYWORDS: X-rays, Data modeling, Electron beams, Strontium, Signal attenuation, Corrosion, Tomography, Scanning electron microscopy, 3D modeling, Titanium dioxide

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Proceedings Article | 24 April 2003 Paper

Layered SAW nitrogen dioxide sensor with WO3 selective layer

Samuel Ippolito, Kourosh Kalantar-zadeh, Adrian Trinchi, David Powell, Wojtek Wlodarski

Proceedings Volume 5116, (2003) https://doi.org/10.1117/12.512086

KEYWORDS: Sensors, Zinc oxide, Acoustics, Transducers, Thin films, NOx, Wave propagation, Atmospheric propagation, Tungsten, Metals

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Proceedings Article | 13 November 2002 Paper

Investigation of Pt/Ga2O3-ZnO/SiC Schottky-diode-based hydrocarbon gas sensors

Adrian Trinchi, Yong Xing Li, Wojtek Wlodarski, Saulius Kaciulis, Luca Pandolfi, Sesto Viticoli

Proceedings Volume 4936, (2002) https://doi.org/10.1117/12.469674

KEYWORDS: Diodes, Sensors, Silicon carbide, Gas sensors, Gallium, Metals, Hydrogen, Thin films, Platinum, Oxides

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Proceedings Article | 21 November 2001 Paper

Mass sensitivity of layered shear-horizontal surface acoustic wave devices for sensing applications

Kourosh Kalantar-Zadeh, Adrian Trinchi, Wojtek Wlodarski, Anthony Holland, Kosmas Galatsis

Proceedings Volume 4591, (2001) https://doi.org/10.1117/12.449140

KEYWORDS: Zinc oxide, Acoustics, Wave propagation, Crystals, Quartz, Sensors, Liquids, Sputter deposition, Scanning electron microscopy, Wave sensors

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Proceedings Article | 19 November 2001 Paper

Investigation of MoO3-WO3 thin film microstructure for gas sensing applications

Kosmas Galatsis, Muralihar Ghantasala, Yongxiang Li, Kourosh Kalantar-Zadeh, Adrian Trinchi, Wojtek Wlodarski, A. Taurino, Pietro Siciliano, Lara Cukrov

Proceedings Volume 4590, (2001) https://doi.org/10.1117/12.454610

KEYWORDS: Molybdenum, Oxides, Silicon, Carbon monoxide, Metals, Transmission electron microscopy, Crystals, Diffraction, Thin films, Gas sensors

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