Dr. Alberto Quispe Profile

Dr. Alberto Quispe

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Publications (1)

Proceedings Article | 15 August 2023 Poster + Paper

Interferograms analysis for measuring the thickness of aluminum thin films

Ivan Choque, Miguel Asmad, Josue Miranda, Alberto Quispe

Proceedings Volume 12618, 1261823 (2023) https://doi.org/10.1117/12.2672620

KEYWORDS: Thin films, Interferograms, Aluminum, Film thickness, Microscopes, Phase shifts, Optical surfaces, Phase interferometry, Interferometry, Ferroelectric materials

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