Dr. Anand K. Asundi Profile

Dr. Anand K. Asundi

Principal Consultant at d'Optron Pte Ltd

SPIE Involvement:

Author | Editor

Area of Expertise:

Optical Metrology , Photomechanics , Fiber Optic Sensors , Quantitative Phase Imaging , Computational 3D Imaging and Measurement , Optical Non-Destructive Testing

Websites:

Company Website

Publications (266)

Proceedings Article | 30 September 2024 Presentation + Paper

Presentation + Paper

Cameras: then and now

Anand Asundi

Proceedings Volume 13135, 1313502 (2024) https://doi.org/10.1117/12.3028887

KEYWORDS: Cameras, Artificial intelligence, Stereoscopy, Image processing, Inspection, Digital cameras, Photography, Industry, Visualization, Manufacturing

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Proceedings Article | 15 February 2024 Paper

Paper

3D quantitative phase imaging of human red blood cells

Anusha Pillai, Saritha Kamath U, Sushma Belurkar, Anand Asundi, Ajeetkumar Patil

Proceedings Volume 13069, 130690P (2024) https://doi.org/10.1117/12.3023411

KEYWORDS: Red blood cells, 3D image processing, Phase imaging, Polystyrene, Biological samples, Diseases and disorders, Biological imaging, Visualization, 3D metrology

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Proceedings Article | 16 October 2019 Paper

Paper

Fast correction method for the fringe order error in multi-frequency phase unwrapping algorithm

Chunwei Zhang, Hong Zhao, Zhenyang Zhang, Jiacheng Qiao, Juntong Xi, Anand Asundi

Proceedings Volume 11205, 112050F (2019) https://doi.org/10.1117/12.2541665

KEYWORDS: Edge detection, Fringe analysis, Error analysis, 3D metrology, Mechanical engineering, Optics manufacturing, Optical testing, Interferometry

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Proceedings Article | 10 September 2019 Presentation

Presentation

Comparison of interferometer and d’nanoimager for profiling large objects (Conference Presentation)

Dingfu Chen, Yingjie Yu, Jianfei Sun, Prathan Buranasiri, Sutha Sutthiruangwong, Thanthanat Srisuwan, Anand Asundi

Proceedings Volume 11102, 111020J (2019) https://doi.org/10.1117/12.2524704

KEYWORDS: Interferometers, Profiling, Biomedical optics, Nanotechnology, Holographic interferometry, Holograms, Interferometry, Spherical lenses, Cylindrical lenses, Corrosion

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Proceedings Article | 24 July 2018 Paper

Paper

Fun with optics: a novel optical engineering kit

Chongtian Huang, Hongtao Zhong, Anand Asundi

Proceedings Volume 10827, 1082714 (2018) https://doi.org/10.1117/12.2503159

KEYWORDS: Sensors, Robotics, Image processing, 3D modeling, Image sensors, Optical engineering, Robots, Virtual reality, Speckle, Visualization

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Proceedings Article | 24 July 2018 Paper

Paper

Calibration of telecentric cameras with distortion center estimation

Yan Hu, Shijie Feng, Tianyang Tao, Chao Zuo, Qian Chen, Anand Asundi

Proceedings Volume 10827, 1082720 (2018) https://doi.org/10.1117/12.2500463

KEYWORDS: Distortion, Calibration, Cameras, Sensors, Imaging systems, 3D image reconstruction, Metals, Image processing, 3D metrology, Error analysis

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Proceedings Article | 24 July 2018 Paper

Paper

Primary exploration on water-based magnetic-ultrasonic assisted laser drilling/trepanning technique

Houxiao Wang, Chenjun Yue, Tao Song, Guoxiang Xu, Anand Asundi, Sukai Zhu, Ye Xu

Proceedings Volume 10827, 108271Z (2018) https://doi.org/10.1117/12.2500214

KEYWORDS: Laser drilling, Ultrasonics, Magnetism, Pulsed laser operation, Optical simulations, Metals, Nickel, Numerical analysis, Laser processing, Heat flux

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SPIE Journal Paper | 15 May 2018

Automatic checkerboard detection for camera calibration using self-correlation

Yizhen Yan, Peng Yang, Lei Yan, Jie Wan, Yanbiao Sun, Kevin Tansey, Anand Asundi, Hongying Zhao

JEI, Vol. 27, Issue 03, 033014, (May 2018) https://doi.org/10.1117/12.10.1117/1.JEI.27.3.033014

KEYWORDS: Calibration, Cameras, Corner detection, Image processing, MATLAB, Image resolution, 3D image processing, Sensors, Optical filters, Sun

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SPIE Journal Paper | 20 March 2018

Depth profile measurement with lenslet images of the plenoptic camera

Peng Yang, Zhaomin Wang, Wei Zhang, Hongying Zhao, Weijuan Qu, Haimeng Zhao, Anand Asundi, Lei Yan

OE, Vol. 57, Issue 03, 033106, (March 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.3.033106

KEYWORDS: Microlens, Calibration, Microlens array, Optical engineering, Sensors, Error analysis, Detector arrays, Cameras, Image processing, Image resolution

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Proceedings Article | 13 June 2017 Paper

Paper

Transmittance measurement using scanning LED

Yao Ping, Rosmin Elsa Mohan, Gih-Keong Lau, Anand Krishna Asundi

Proceedings Volume 10449, 104492R (2017) https://doi.org/10.1117/12.2270892

KEYWORDS: Transmittance, Light emitting diodes, Cameras, LED displays, Imaging systems, RGB color model, Glasses, Diffusers, Spectroscopy, Optical engineering

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Proceedings Article | 13 June 2017 Paper

Paper

Instrument transfer function for digital holography system

Tao Sun, Anand Asundi, Yingjie Yu

Proceedings Volume 10449, 104491D (2017) https://doi.org/10.1117/12.2270644

KEYWORDS: Digital holography, Quality measurement, Spatial frequencies, 3D metrology, Dimensional metrology

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Proceedings Article | 13 June 2017 Paper

Paper

Fruit ripening using hyperspectral imaging

Swetha ., Santhosh Chidangil, Tanvi Karpate, Anand Asundi

Proceedings Volume 10449, 104492O (2017) https://doi.org/10.1117/12.2270888

KEYWORDS: Imaging spectroscopy, Light emitting diodes, Visible radiation, Spectroscopy, Hyperspectral imaging, Imaging systems, Reflectivity, Image processing, Machine vision, 3D displays

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Proceedings Article | 13 June 2017 Paper

Paper

Controlled micro-wrinkling of ultrathin indium-tin-oxide films for transparency tuning

Deyuan Wei, Milan Shrestha, Anand Asundi, Gih-Keong Lau

Proceedings Volume 10449, 104492Q (2017) https://doi.org/10.1117/12.2270891

KEYWORDS: Switches, Polymers, Liquid crystals

Read Abstract +

Smart windows can electrically switch between clear and opaque states. Current smart windows based on polymer dispersed liquid crystal are expensive and they have moderate range of transparency tuning. Elastomeric tunable window devices are being researched as the low-cost alternates. They consist of a transparent elastomer substrate with surface electrodes that provide electrically controlled micro-wrinkling. They diffusely scatter the transmitted light and thus appear opaque when the surfaces are micro-wrinkled. On electrical activation the wrinkles are flattened, thus making the windows transparent like window blinds. However, the initial prototypes of these electrically tunable window devices showed limited transparency tuning because their transparent electrodes cannot be completely flattened. For example, the brownish e-beam evaporated indium-tin-oxide thin films (50 nm thick) remains mildly wrinkled (with 52.08% transmittance) even when subjected to 37% areal expansion, while its opaque state allows 39.14% transmittance. There is a need for more transparent thin-film electrode with better controllability of surface micro-wrinkling. This work reports a greatly improved tunable window device with enlarged range of transmittance tuning: a clear state of 71.5% transmittance and an opaque state of 2% transmittance. This new device made use of ultra-thin (6 nm) ITO thin films as the transparent compliant electrodes, which were initially wrinkled and can be flatten by 12.2% voltage-induced areal expansion. These ultra-thin ITO thin films are clearer with fewer thermally-induced wrinkles on the flat elastomer substrate (VHB 4905) as they were deposited at a lower surface growth temperature using the RF magnetron sputtering technique. In addition, they make compliant electrodes of higher electrical conductivity and can electrically unfold the mechanically induced micro-wrinkles by a small voltage-induced areal expansion (~12.2%). With the greatly enhanced performance, this electrically tunable window device is promising approach for low-cost smart windows.

Proceedings Article | 13 June 2017 Paper

Paper

Spectroscopic imaging ellipsometry for thin film detection on uniaxial crystal

Lichao Guan, Jiexiong Ding, Li Du, Achyut Adhikari, Anand Krishna Asundi

Proceedings Volume 10449, 1044921 (2017) https://doi.org/10.1117/12.2270796

KEYWORDS: Crystals, Crystal optics, Thin films, Ellipsometry, Polarization, Imaging spectroscopy, Spectroscopy, Data processing, Data modeling, Optical properties

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Proceedings Article | 13 June 2017 Paper

Paper

3D/4D multiscale imaging in acute lymphoblastic leukemia cells: visualizing dynamics of cell death

Sreelatha Sarangapani, Rosmin Elsa Mohan, Ajeetkumar Patil, Matthew Lang, Anand Asundi

Proceedings Volume 10449, 1044936 (2017) https://doi.org/10.1117/12.2270979

KEYWORDS: Functional imaging, Cell death, 3D displays, 3D acquisition, 3D image processing, 3D modeling, Biomedical optics, In vitro testing, Proteins, Tumor growth modeling, Cell biology

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Proceedings Article | 13 June 2017 Paper

Paper

Imaging quality analysis of computer-generated holograms using the point-based method and slice-based method

Zhen Zhang, Siqing Chen, Huadong Zheng, Tao Sun, Yingjie Yu, Hongyue Gao, Anand Asundi

Proceedings Volume 10449, 104491U (2017) https://doi.org/10.1117/12.2270772

KEYWORDS: Holography, Holograms, Computer generated holography, Near field diffraction, Speckle, 3D image reconstruction, 3D displays, Optical engineering

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Proceedings Article | 17 April 2017 Presentation + Paper

Presentation + Paper

Electrically tunable window based on microwrinkled ZnO/Ag thin film

Milan Shrestha, Anand Asundi, Gih-Keong Lau

Proceedings Volume 10163, 101631Y (2017) https://doi.org/10.1117/12.2259918

KEYWORDS: Thin films, Electrodes, Zinc oxide, Silver, Transmittance, Transparency, Opacity, Dielectrics, Dielectric elastomer actuators, Coating

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Proceedings Article | 10 February 2017 Paper

Paper

Practical considerations for high speed real-time 3D measurements by the fringe projection

Shijie Feng, Qian Chen, Chao Zuo, Anand Asundi

Proceedings Volume 10250, 1025016 (2017) https://doi.org/10.1117/12.2266934

KEYWORDS: 3D metrology, Phase measurement, Fourier transforms

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Proceedings Article | 28 August 2016 Presentation + Paper

Presentation + Paper

Subwavelength metrology of Al wire grating employing finite difference time domain method and Mueller matrix polarimeter

Achyut Adhikari, Kapil Dev, Anand Asundi

Proceedings Volume 9960, 99600F (2016) https://doi.org/10.1117/12.2240639

KEYWORDS: Polarimetry, Metrology, Finite-difference time-domain method, Polarizers, Polarization, Aluminum, Polysomnography, Diffraction, Glasses, Statistical analysis

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SPIE Journal Paper | 3 August 2016

Online fringe projection profilometry based on scale-invariant feature transform

Hongru Li, Guoying Feng, Peng Yang, Zhaomin Wang, Shouhuan Zhou, Anand Asundi

OE, Vol. 55, Issue 08, 084101, (August 2016) https://doi.org/10.1117/12.10.1117/1.OE.55.8.084101

KEYWORDS: Modulation, Fringe analysis, Optical engineering, Principal component analysis, Phase shifts, Lithium, Calibration, Phase retrieval, Reconstruction algorithms, Image enhancement

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Proceedings Article | 22 December 2015 Paper

Paper

Damage monitoring using fiber optic sensors and by analysing electro-mechanical admittance signatures obtained from piezo sensor

Muneesh Maheshwari, Venu Gopal Annamdas, John Hock Lye Pang, Swee Tjin, Anand Asundi

Proceedings Volume 9668, 966816 (2015) https://doi.org/10.1117/12.2202547

KEYWORDS: Fiber optics sensors, Sensors, Fiber Bragg gratings, Smart materials, Structured optical fibers, Polarimetry, Semiconducting wafers, Active sensors, Active optics, Structural health monitoring, Phase modulation, Photodiodes, Fiber optics

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Proceedings Article | 23 September 2015 Paper

Paper

Modeling, simulation, and analysis of birefringent effects in plastic optics

Achyut Adhikari, Anand Asundi

Proceedings Volume 9626, 96260I (2015) https://doi.org/10.1117/12.2191230

KEYWORDS: Birefringence, Photoelasticity, Optics manufacturing, Finite element methods, Computer aided design, Solids, Manufacturing, Mechanics, Image processing, Phase shifting

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Proceedings Article | 17 July 2015 Paper

Paper

Digital off-axis holography with angular multiplexing and synthetic aperture

Zhaomin Wang, Weijuan Qu, Fang Yang, Yongfu Wen, Asundi Anand

Proceedings Volume 9524, 95241C (2015) https://doi.org/10.1117/12.2189442

KEYWORDS: Digital holography, Multiplexing, Holograms, Cameras, Holography, Image resolution, CCD cameras, Spatial resolution, 3D image reconstruction, Molybdenum

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Proceedings Article | 17 July 2015 Paper

Paper

Wavefront subaperture stitching with Shack-Hartmann sensor

Hongru Li, Guoying Feng, Jianfei Sun, Thomas Bourgade, Shouhuan Zhou, Anand Asundi

Proceedings Volume 9524, 95241E (2015) https://doi.org/10.1117/12.2189452

KEYWORDS: Wavefront sensors, Wavefronts, Sensors, Interferometers, Spherical lenses, Optical testing, Mirrors, Interferometry, Optical components, Gaussian beams

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Proceedings Article | 17 July 2015 Paper

Paper

Phase shift reflectometry for wafer inspection

Kuang Peng, Yiping Cao, Hongru Li, Jianfei Sun, Thomas Bourgade, Anand Krishna Asundi

Proceedings Volume 9524, 95242T (2015) https://doi.org/10.1117/12.2190644

KEYWORDS: Semiconducting wafers, Reflectometry, Wafer inspection, Phase shifts, Calibration, 3D metrology, Cameras, Inspection, Imaging systems, Beam splitters

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Proceedings Article | 17 July 2015 Paper

Paper

Three-dimensional imaging of microstructures by an improved compact digital holographic microscope (ICDHM) with dual wavelength

Yongfu Wen, Weijuan Qu, Haobo Cheng, Anand Asundi

Proceedings Volume 9524, 95242M (2015) https://doi.org/10.1117/12.2190197

KEYWORDS: Digital holography, Holography, Microscopes, Holograms, Microelectromechanical systems, 3D image processing, 3D microstructuring, Microscopy, Charge-coupled devices, Fiber couplers

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Proceedings Article | 1 April 2015 Paper

Paper

Fibre optic sensors for load-displacement measurements and comparisons to piezo sensor based electromechanical admittance signatures

Muneesh Maheshwari, Venu Gopal Madhav Annamdas, John Pang, Swee Chuan Tjin, Anand Asundi

Proceedings Volume 9437, 94370V (2015) https://doi.org/10.1117/12.2084039

KEYWORDS: Fiber Bragg gratings, Sensors, Structural health monitoring, Smart materials, Fiber optics sensors, Polarimetry, Telecommunications, Fiber optics, Polarization, Aluminum

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Proceedings Article | 12 March 2015 Paper

Paper

Phase retrieval in arbitrarily shaped aperture with the transport-of-intensity equation

Lei Huang, Chao Zuo, Mourad Idir, Weijuan Qu, Anand Asundi

Proceedings Volume 9401, 94010B (2015) https://doi.org/10.1117/12.2087754

KEYWORDS: Phase retrieval, Charge-coupled devices, Transform theory, Fourier transforms, Phase compensation, Optical alignment, Aerospace engineering, Wavefront sensors, Image acquisition, Microscopes

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Proceedings Article | 4 March 2015 Paper

Paper

Failure assessment of aluminum liner based filament-wound hybrid riser subjected to internal hydrostatic pressure

Vishwesh Dikshit, Ong Lin Seng, Muneesh Maheshwari, A. Asundi

Proceedings Volume 9302, 93021P (2015) https://doi.org/10.1117/12.2081041

KEYWORDS: Composites, Aluminum, Fiber Bragg gratings, Sensors, Prototyping, Fiber optics sensors, Manufacturing, Failure analysis, Standards development, Aerospace engineering

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Proceedings Article | 4 March 2015 Paper

Paper

Phase errors elimination in compact digital holoscope (CDH) based on a reasonable mathematical model

Yongfu Wen, Weijuan Qu, Cheeyuen Cheng, Zhaomin Wang, Anand Asundi

Proceedings Volume 9302, 930207 (2015) https://doi.org/10.1117/12.2077044

KEYWORDS: Displays, Projection systems, Modulation, Silicon, Image quality, Modulators, Electromechanical design, Image resolution, Diffraction, Mirrors

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Proceedings Article | 4 March 2015 Paper

Paper

A new phase error compensation method in digital holographic microscopy

Zhaomin Wang, Weijuan Qu, Yongfu Wen, Fang Yang, Anand Asundi

Proceedings Volume 9302, 93023M (2015) https://doi.org/10.1117/12.2076855

KEYWORDS: Digital holography, Zernike polynomials, Wavefronts, Holograms, Monochromatic aberrations, Holography, Microscopy, Optical aberrations, Digital recording, Microlens

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Proceedings Article | 4 March 2015 Paper

Paper

Capability enhancement in compact digital holographic microscopy

Weijuan Qu, Yongfu Wen, Zhaomin Wang, Fang Yang, Anand Asundi

Proceedings Volume 9302, 93020I (2015) https://doi.org/10.1117/12.2081128

KEYWORDS: Digital holography, Holography, Reflection, Microscopy, Inspection, Microelectromechanical systems, Charge-coupled devices, Holograms, Optical resolution, Spherical lenses

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Proceedings Article | 4 March 2015 Paper

Paper

Silicon wafer microstructure imaging using InfraRed Transport of Intensity Equation

Hongru Li, Guoying Feng, Thomas Bourgade, Chao Zuo, Yongzhao Du, Shouhuan Zhou, Anand Asundi

Proceedings Volume 9302, 93023I (2015) https://doi.org/10.1117/12.2078579

KEYWORDS: Semiconducting wafers, Infrared imaging, Silicon, Infrared radiation, Imaging systems, Phase imaging, Phase retrieval, Cameras, Inspection, Aerospace engineering

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Proceedings Article | 4 March 2015 Paper

Paper

Birefringence characterization of injection molded microplates

Achyut Adhikari, Anand Asundi

Proceedings Volume 9302, 93022Q (2015) https://doi.org/10.1117/12.2080933

KEYWORDS: Birefringence, Manufacturing, Modulators, Polarization, Polymers, Polarimetry, Refractive index, Modulation, Sensors, Optics manufacturing

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Proceedings Article | 4 March 2015 Paper

Paper

Fibre Bragg grating sensors for in-situ measurement of resin pressure in curing composites

A. Ganapathi, Muneesh Maheshwari, Sunil Joshi, Zhong Chen, Anand Asundi, Swee Chuan Tjin

Proceedings Volume 9302, 93021T (2015) https://doi.org/10.1117/12.2084783

KEYWORDS: Sensors, Fiber Bragg gratings, Liquids, Silicon, Composites, Protactinium, Fiber optics sensors, Temperature metrology, Optical fibers, Composite resins

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Proceedings Article | 19 February 2015 Paper

Paper

Phase-space analysis of transport of intensity equation under partially coherent illumination

Chao Zuo, Qian Chen, Anand Asundi

Proceedings Volume 9449, 94490K (2015) https://doi.org/10.1117/12.2083271

KEYWORDS: Wigner distribution functions, Imaging systems, Phase retrieval, Sensors, Geometrical optics, Wavefront sensors, Point spread functions, Spatial frequencies, Optical sensors, Optical microscopy

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Proceedings Article | 19 February 2015 Paper

Paper

Microstructure measurement of digital holography

Jicheng Li, Ailing Tian, Hongjun Wang, Xueliang Zhu, Chunhui Wang, Bingcai Liu, Anand Asundi

Proceedings Volume 9449, 94493O (2015) https://doi.org/10.1117/12.2080511

KEYWORDS: Digital holography, Holography, Reconstruction algorithms, Holograms, Charge-coupled devices, 3D image reconstruction, Image quality, Digital recording, 3D image processing, Convolution

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Proceedings Article | 19 February 2015 Paper

Paper

The phase error reduction using window functions in digital holography

Facai Yan, Hao Yan, Anand Asundi

Proceedings Volume 9449, 94490O (2015) https://doi.org/10.1117/12.2074711

KEYWORDS: Digital holography, Holograms, Charge-coupled devices, Diffraction, 3D image reconstruction, Error analysis, Holography, Image resolution, Optical simulations, Aerospace engineering

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Proceedings Article | 19 February 2015 Paper

Paper

A new autofocus method based on angular spectrum method in digital holography

Zhaomin Wang, Weijuan Qu, Fang Yang, Yongfu Wen, Asundi Anand

Proceedings Volume 9449, 94492H (2015) https://doi.org/10.1117/12.2076853

KEYWORDS: Digital holography, Fourier transforms, Wavefronts, Computing systems, Aerospace engineering, Photonics, Holograms, Beam splitters, Laser applications, Roads

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Proceedings Article | 11 November 2014 Paper

Paper

Transport of intensity equation: a new approach to phase and light field

Chao Zuo, Qian Chen, Anand Asundi

Proceedings Volume 9271, 92710H (2014) https://doi.org/10.1117/12.2071713

KEYWORDS: Phase retrieval, Wigner distribution functions, Sensors, Interferometry, Error analysis, Digital holography, Phase measurement, Cameras, Wavefront sensors, Geometrical optics

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Proceedings Article | 2 June 2014 Paper

Paper

New developments in transport of intensity equation for phase retrieval and computational imaging

Anand Asundi, Chao Zuo

Proceedings Volume 9234, 92340O (2014) https://doi.org/10.1117/12.2054325

KEYWORDS: Phase retrieval, Wigner distribution functions, Phase imaging, Geometrical optics, Digital holography, Computational imaging, Signal to noise ratio, Numerical analysis, Wave propagation, Wavefronts

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Proceedings Article | 2 June 2014 Paper

Paper

Phase space representation of transport of intensity phase retrieval for partially coherent fields

Chao Zuo, Qian Chen, Anand Asundi

Proceedings Volume 9234, 923418 (2014) https://doi.org/10.1117/12.2054320

KEYWORDS: Wigner distribution functions, Phase retrieval, Imaging systems, Point spread functions, Phase measurement, Transmittance, Aerospace engineering, Microscopy, Wave propagation, Experimental mechanics

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Proceedings Article | 1 May 2014 Paper

Paper

Digital holography to light field

Anand Asundi, Chao Zuo

Proceedings Volume 9132, 91320U (2014) https://doi.org/10.1117/12.2059775

KEYWORDS: Geometrical optics, Wigner distribution functions, Sensors, Phase measurement, Digital holography, Holography, Wavefront sensors, Diffraction, Interferometry, Cameras

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Proceedings Article | 9 August 2013 Paper

Paper

Effect of the location and size of a single crack on first fundamental frequency of a cantilever beam using fiber optic polarimetric sensors and characterisation of FBG sensors

Muneesh Maheshwari, A. Asundi, Swee Tjin

Proceedings Volume 8793, 87930G (2013) https://doi.org/10.1117/12.2027726

KEYWORDS: Fiber Bragg gratings, Sensors, Fiber optics sensors, Nondestructive evaluation, Fiber optics, Polarimetry, Aluminum, Structural health monitoring, Damage detection, Oscilloscopes

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Proceedings Article | 22 June 2013 Paper

Paper

Single-shot quantitative phase microscopy with the transport-of-intensity equation

Chao Zuo, Qian Chen, Weijuan Qu, Anand Asundi

Proceedings Volume 8769, 876931 (2013) https://doi.org/10.1117/12.2018760

KEYWORDS: Microscopy, Spatial light modulators, Phase imaging, Cameras, Microlens, Imaging systems, Digital cameras, Free space, Free space optics, Charge-coupled devices

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Proceedings Article | 22 June 2013 Paper

Paper

4D metrology of flapping-wing micro air vehicle based on fringe projection

Qican Zhang, Lei Huang, Yao-Wei Chin, Lau-Gih Keong, Anand Asundi

Proceedings Volume 8769, 87692Y (2013) https://doi.org/10.1117/12.2021034

KEYWORDS: Micro unmanned aerial vehicles, Fringe analysis, 3D metrology, Cameras, Metrology, Aerodynamics, 3D image processing, High speed cameras, Signal processing, Fourier transforms

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Proceedings Article | 22 June 2013 Paper

Paper

Weighing of moving vehicles using fiber optic polarimetric sensor

Hooi Leng Ng-Lee, Kannathal N., Jun Kiat Lau, Zi Chen Desmond Song, Wei Siong Seah, Anand Asundi

Proceedings Volume 8769, 87693N (2013) https://doi.org/10.1117/12.2021247

KEYWORDS: Fiber optics sensors, Sensors, Phase modulation, Polarimetry, Fiber optics, Roads, Software development, Sensing systems, Mathematical modeling, Polarization

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Proceedings Article | 22 June 2013 Paper

Paper

Specular 3D shape measurement with a compact fringe reflection system

Lei Huang, Jun Xian Wong, Anand Asundi

Proceedings Volume 8769, 87691K (2013) https://doi.org/10.1117/12.2018927

KEYWORDS: Reflection, 3D metrology, Cameras, Calibration, Fringe analysis, Beam splitters, Computer aided design, Imaging systems, LCDs, Phase shifting

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Proceedings Article | 22 June 2013 Paper

Paper

Dual wavelength digital holography for improving the measurement accuracy

Jianglei Di, Weijuan Qu, Bingjing Wu, Xin Chen, Jianlin Zhao, Anand Asundi

Proceedings Volume 8769, 87690G (2013) https://doi.org/10.1117/12.2020394

KEYWORDS: Digital holography, Holograms, Microlens, 3D image reconstruction, Refractive index, Charge-coupled devices, Phase measurement, Optical testing, 3D metrology, Digital recording

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Proceedings Article | 22 June 2013 Paper

Paper

Quantitative phase from defocused intensity by image deconvolution

Chao Zuo, Qian Chen, Anand Asundi

Proceedings Volume 8769, 87691Q (2013) https://doi.org/10.1117/12.2018759

KEYWORDS: Optical transfer functions, Image processing, Phase retrieval, Phase contrast, Inverse optics, Signal to noise ratio, Image acquisition, Electronic filtering, Spatial frequencies, Microscopes

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Proceedings Article | 22 June 2013 Paper

Paper

Investigation of surface and subsurface profile, techniques of measurement, and replication of the Chinese Magic Mirror

Eden Kang Min, Sook May Watt, Parthasarathy Sreemathy, Lei Huang, Anand Asundi

Proceedings Volume 8769, 876930 (2013) https://doi.org/10.1117/12.2021112

KEYWORDS: Mirrors, Interferometers, Microscopes, Fringe analysis, Aluminum, Reflectivity, Reflectometry, Surface finishing, Manufacturing, Scanning electron microscopy

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Proceedings Article | 22 June 2013 Paper

Paper

Digital holography display (3)

Cheok Peng Lee, Huadong Zheng, Yong Poo Chia, Chee Yuen Cheng, Yang Yu, Yingjie Yu, Anand Asundi

Proceedings Volume 8769, 876937 (2013) https://doi.org/10.1117/12.2018884

KEYWORDS: Digital holography, Holograms, Digital micromirror devices, Diffusers, Mirrors, Micromirrors, RGB color model, Semiconductor lasers, Holography, 3D image processing

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Proceedings Article | 22 June 2013 Paper

Paper

Physical phase compensation in digital holographic microscopy by using of electrical tunable lens

Weijuan Qu, Chee Yuen Cheng, Anand Asundi

Proceedings Volume 8769, 87693C (2013) https://doi.org/10.1117/12.2021092

KEYWORDS: Digital holography, Phase compensation, Wavefronts, Holography, Microscopy, Spherical lenses, Microscopes, Holograms, Objectives, Phase measurement

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Proceedings Article | 1 March 2013 Paper

Paper

Compound common-path digital holographic microscope

Weijuan Qu, Zhaomin Wang, Chee Yuen Cheng, Anand Asundi

Proceedings Volume 8644, 864414 (2013) https://doi.org/10.1117/12.2003755

KEYWORDS: Digital holography, Holography, Microscopes, Microscopy, Holograms, Reflection, Phase compensation, Wavefronts, Micro optics, Semiconducting wafers

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Proceedings Article | 6 December 2012 Paper

Paper

Phase shift reflectometry for sub-surface defect detection

Anand Asundi, Huang Lei, Teoh Kang Min Eden, Parthasarathy Sreemathy, Watt Sook May

Proceedings Volume 8563, 85630G (2012) https://doi.org/10.1117/12.1000032

KEYWORDS: Mirrors, Phase shifts, Reflectometry, Interferometers, Defect detection, Microscopes, Confocal microscopy, Scanning electron microscopy, Optical components, Surface finishing

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Proceedings Article | 27 November 2012 Paper

Paper

Compact digital holoscope with dual wavelength

Jianglei Di, Jianlin Zhao, Anand Asundi

Proceedings Volume 8559, 855908 (2012) https://doi.org/10.1117/12.2001862

KEYWORDS: Digital holography, Holograms, Wavefronts, Charge-coupled devices, Digital recording, Fiber lasers, Fourier transforms, 3D image reconstruction, Solids, Nondestructive evaluation

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Proceedings Article | 13 September 2012 Paper

Paper

Calibration of the DOE lens array based multipoint diffraction strain sensor

Hui Zhu, Anand Asundi

Proceedings Volume 8494, 849405 (2012) https://doi.org/10.1117/12.928023

KEYWORDS: Calibration, Diffractive optical elements, Diffraction, Sensors, Lens design, Spatial light modulators, Liquid crystals, Interferometers, Sensing systems, Precision measurement

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Proceedings Article | 8 May 2012 Paper

Paper

Investigation of cell morphology by the TRUImagE digital holographic microscopy system

Oi Choo Chee, Weijuan Qu, Kim Kheong Chai, Anand Asundi

Proceedings Volume 8427, 84272G (2012) https://doi.org/10.1117/12.921613

KEYWORDS: Photodynamic therapy, Digital holography, Cell death, Holography, Microscopy, Imaging systems, Plasma, 3D image processing, Microscopes, Picosecond phenomena

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Proceedings Article | 28 April 2012 Paper

Paper

Improvement of least squares integration method with iterative compensation for shape reconstruction from gradient

Lei Huang, Anand Asundi

Proceedings Volume 8430, 84300S (2012) https://doi.org/10.1117/12.921402

KEYWORDS: Matrices, Data integration, 3D metrology, Wavefronts, Data modeling, Aerospace engineering, Laser optics, Reflection, Error analysis, Metrology

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Proceedings Article | 23 September 2011 Paper

Paper

Whole field curvature and residual stress determination of silicon wafers by reflectometry

Chi Seng Ng, Anand Asundi

Proceedings Volume 8105, 81050N (2011) https://doi.org/10.1117/12.894396

KEYWORDS: Semiconducting wafers, Calibration, Reflectometry, Silicon, Mirrors, Phase shifts, Reflection, Titanium, Monochromatic aberrations, Computing systems

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Proceedings Article | 20 September 2011 Paper

Paper

Rapid defect detections of bonded wafer using near infrared polariscope

Chi Seng Ng, Anand Asundi

Proceedings Volume 8105, 81050P (2011) https://doi.org/10.1117/12.894402

KEYWORDS: Semiconducting wafers, Particles, Interfaces, Silicon, Wafer bonding, Inspection, Infrared imaging, Defect detection, Infrared radiation, Near infrared

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Proceedings Article | 30 August 2011 Paper

Paper

Study on three-dimensional shape measurement of partially diffuse and specular reflective surfaces with fringe projection technique and fringe reflection technique

Lei Huang, Anand Asundi

Proceedings Volume 8133, 813304 (2011) https://doi.org/10.1117/12.891876

KEYWORDS: 3D metrology, Reflection, Calibration, Reflectivity, Projection systems, Cameras, Fringe analysis, Reflectometry, LCDs, 3D acquisition

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Proceedings Article | 17 November 2010 Paper

Paper

Comparison of two-dimensional phase retrieval methods from single interference fringe pattern

Huang Lei, Kemao Qian, Anand Asundi

Proceedings Volume 7851, 785107 (2010) https://doi.org/10.1117/12.875071

KEYWORDS: Fringe analysis, Fourier transforms, Phase retrieval, Speckle, Wavelet transforms, Reflectivity, Transform theory, Aerospace engineering, Phase measurement, 3D metrology

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Proceedings Article | 2 September 2010 Paper

Paper

Stress measurement of thin wafer using reflection grating method

Chi Seng Ng, Anand Asundi

Proceedings Volume 7792, 779210 (2010) https://doi.org/10.1117/12.861058

KEYWORDS: Semiconducting wafers, Reflection, Silicon, Manufacturing, Calibration, Phase shifts, LCDs, Microelectromechanical systems, Photovoltaics, Silicon films

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Proceedings Article | 18 August 2010 Paper

Paper

Full-field TN-LCSLM phase modulation characterization using digital holography

Kapil Dev, Vijay Raj Singh, Anand Asundi

Proceedings Volume 7775, 777519 (2010) https://doi.org/10.1117/12.860269

KEYWORDS: Digital holography, Phase shift keying, Phase modulation, Holograms, 3D image reconstruction, Spatial light modulators, Liquid crystals, Modulation, Wavefronts, Digital recording

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Proceedings Article | 14 May 2010 Paper

Paper

Characterization and inspection of micro-lens array by SCBS microscope

Weijuan Qu, Oi Choo Chee, Yingjie Yu, Hooi Leng Ng-Lee, Ailing Tian, Anand Asundi

Proceedings Volume 7718, 77180P (2010) https://doi.org/10.1117/12.854121

KEYWORDS: Inspection, Image transmission, Digital holography, Spherical lenses, Microscopes, Interferometers, Molybdenum, Geometrical optics, Objectives, Holograms

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Proceedings Article | 14 May 2010 Paper

Paper

Digital reflection holography based systems development for MEMS testing

Vijay Raj Singh, Sui Liansheng, Anand Asundi

Proceedings Volume 7718, 77180Z (2010) https://doi.org/10.1117/12.858451

KEYWORDS: Microelectromechanical systems, Digital holography, Holograms, 3D metrology, 3D image reconstruction, Holography, Software development, Charge-coupled devices, Inspection, Vibrometry

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Proceedings Article | 24 August 2009 Paper

Paper

Phase reconstruction of living human embryonic kidney 293 cells based on two off-axis holograms

Wenjing Zhou, Yingjie Yu, Yanhong Duan, Anand Asundi

Proceedings Volume 7375, 737502 (2009) https://doi.org/10.1117/12.838970

KEYWORDS: Holograms, Digital holography, Reconstruction algorithms, 3D image reconstruction, Liquids, Molybdenum, Kidney, Charge-coupled devices, Microscopes, Collimation

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SPIE Journal Paper | 1 February 2009

Deformation and shape measurement using multiple wavelength microscopic TV holography

U. Paul Kumar, Nandigana Krishna Mohan, Mahendra Kothiyal, Anand Asundi

OE, Vol. 48, Issue 02, 023601, (February 2009) https://doi.org/10.1117/12.10.1117/1.3083260

KEYWORDS: Microscopic TV holography, Holography, Line scan image sensors, Phase shifts, Shape analysis, Fringe analysis, Microelectromechanical systems, Ferroelectric materials, Speckle, Optical engineering

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Proceedings Article | 3 October 2008 Paper

Paper

Comparison of digital holographic microscope and confocal microscope methods for characterization of micro-optical diffractive components

Hao Yan, Anand Asundi

Proceedings Volume 7155, 71550B (2008) https://doi.org/10.1117/12.814509

KEYWORDS: Microscopes, Digital holography, Confocal microscopy, Molybdenum, Holography, 3D image processing, Refractive index, Charge-coupled devices, Holograms, Beam splitters

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Proceedings Article | 3 October 2008 Paper

Paper

Deformation analysis on micro objects using multiple wavelength microscopic TV holography

U. Paul Kumar, N. Krishna Mohan, M. Kothiyal, A. Asundi

Proceedings Volume 7155, 71550D (2008) https://doi.org/10.1117/12.814511

KEYWORDS: Phase shifts, Microscopic TV holography, Holography, Fringe analysis, Speckle, Ferroelectric materials, Microelectromechanical systems, Sensors, Imaging systems, Mirrors

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Proceedings Article | 3 October 2008 Paper

Paper

Adaptive confocal system for 3-D profiling

Ravi Kumar K., Vernon Jialiang Shen, Amitava Talukdar, Anand Asundi

Proceedings Volume 7155, 71551W (2008) https://doi.org/10.1117/12.814569

KEYWORDS: Confocal microscopy, Profilometers, 3D metrology, 3D image processing, LabVIEW, Profiling, Human-machine interfaces, Image resolution, Software, 3D profiling

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Proceedings Article | 3 October 2008 Paper

Paper

Microlens testing: an application

Hooi Leng Ng-Lee, Seach Chyr Ernest Goh, Chris Stephen Naveen Ranjit, . Maryanto, Jie Ying Sarah Ng, Anand Asundi

Proceedings Volume 7155, 71552L (2008) https://doi.org/10.1117/12.814595

KEYWORDS: Microlens, Microlens array, Lead, Cameras, CCD cameras, Glasses, Imaging systems, Light sources, Halogens, Light

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Proceedings Article | 3 October 2008 Paper

Paper

Phase measurement via in-line digital holographic microscopy

Weijuan Qu, Yingjie Yu, Wenjing Zhou, Hao Yan, Anand Asundi

Proceedings Volume 7155, 71550R (2008) https://doi.org/10.1117/12.814526

KEYWORDS: Holograms, Digital holography, 3D image reconstruction, Wavefronts, Charge-coupled devices, Spherical lenses, Phase measurement, Resolution enhancement technologies, Holography, Microscopy

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Proceedings Article | 3 October 2008 Paper

Paper

On-line digital holographic measurement of size and shape of microparticles for crystallization processes

Taslima Khanam, Emmanouil Darakis, Arvind Rajendran, Vinay Kariwala, Anand Asundi, Thomas Naughton

Proceedings Volume 7155, 71551K (2008) https://doi.org/10.1117/12.814557

KEYWORDS: Particles, Digital holography, Crystals, Holograms, Holography, Microscopy, Carbon, Digital recording, Spherical lenses, Ceramics

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Proceedings Article | 3 October 2008 Paper

Paper

Processing of digital holograms for size measurements of microparticles

Emmanouil Darakis, Taslima Khanam, Arvind Rajendran, Vinay Kariwala, Anand Asundi, Thomas Naughton

Proceedings Volume 7155, 715524 (2008) https://doi.org/10.1117/12.814578

KEYWORDS: Particles, Digital holography, Holograms, Digital recording, Holography, Edge detection, Scanning electron microscopy, 3D image reconstruction, Reconstruction algorithms, Microscopy

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Proceedings Article | 3 October 2008 Paper

Paper

Residual stress in silicon wafer using IR polariscope

Zhijia Lu, Pin Wang, Anand Asundi

Proceedings Volume 7155, 715512 (2008) https://doi.org/10.1117/12.814538

KEYWORDS: Silicon, Semiconducting wafers, Phase shifts, Infrared radiation, Stress analysis, Calibration, Photoelasticity, Wafer-level optics, Semiconductors, Phase shifting

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Proceedings Article | 3 October 2008 Paper

Paper

Reduction of speckle noise by multi-kinoforms in holographic three-dimensional display

Huadong Zheng, Yingjie Yu, Haiyan Qian, Anand Asundi

Proceedings Volume 7155, 71550C (2008) https://doi.org/10.1117/12.814510

KEYWORDS: 3D image reconstruction, Computer generated holography, Image quality, Speckle, Holography, Holograms, Electro optics, 3D displays, 3D image processing, Digital holography

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Proceedings Article | 3 October 2008 Paper

Paper

Surface measurement with Shack-Hartmann wavefront sensing technology

X. Li, L. P. Zhao, Z. P. Fang, A. Asundi, X. M. Yin

Proceedings Volume 7155, 715515 (2008) https://doi.org/10.1117/12.814541

KEYWORDS: Wavefronts, Wavefront sensors, Optical design, Wave propagation, Spherical lenses, Image processing, Manufacturing, Bridges, Optical components, Light sources

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Proceedings Article | 3 October 2008 Paper

Paper

A multipoint diffraction strain sensor using micro-lens array: review on variable sensitivity

J. Wang, Anand Asundi

Proceedings Volume 7155, 71551R (2008) https://doi.org/10.1117/12.814564

KEYWORDS: Sensors, Interferometers, Diffraction, Charge-coupled devices, Wavefront sensors, Microlens array, Wavefronts, Diffraction gratings, CCD image sensors, Microscopes

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Proceedings Article | 3 October 2008 Paper

Paper

Phase shift polarimetry for non-invasive detection of laser-induced damage

Pin Wang, Anand Asundi

Proceedings Volume 7155, 715511 (2008) https://doi.org/10.1117/12.814537

KEYWORDS: Laser induced damage, Phase shifts, Epoxies, Polarimetry, Phase shifting, Image processing, Imaging systems, Photoelasticity, Visible radiation, Calibration

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Proceedings Article | 3 October 2008 Paper

Paper

Characterisation of laser marks using digital holographic microscopy

Vijay Raj Singh, Oi Choo Chee, Eddy Sim, Anand Asundi

Proceedings Volume 7155, 715509 (2008) https://doi.org/10.1117/12.814729

KEYWORDS: Laser marking, Digital holography, Holograms, 3D metrology, Holography, Phase contrast, Confocal microscopy, Charge-coupled devices, Microscopy, Carbon dioxide lasers

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Proceedings Article | 3 October 2008 Paper

Paper

Whole field residual stress measurement using computer aided reflection grating

Chi Seng Ng, Yoke Chin Goh, Anand Asundi

Proceedings Volume 7155, 71552C (2008) https://doi.org/10.1117/12.814586

KEYWORDS: Semiconducting wafers, Reflection, Wafer-level optics, LCDs, Modulation, Beam splitters, Image analysis, Image processing, Image quality, Optics manufacturing

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Proceedings Article | 3 October 2008 Paper

Paper

Structure measurement of phase grating on post-magnification digital micro-holography

Wenjing Zhou, Yingjie Yu, Anand Asundi

Proceedings Volume 7155, 71550A (2008) https://doi.org/10.1117/12.814508

KEYWORDS: Holograms, Molybdenum, Digital holography, Charge-coupled devices, 3D image reconstruction, Reconstruction algorithms, Phase measurement, Optical filters, Holography, Digital signal processing

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Proceedings Article | 25 April 2008 Paper

Paper

Study of the holographic phase stitching technique

Cuixia Dai, Yingjie Yu, Gang Chen, Anand Asundi

Proceedings Volume 7000, 70001T (2008) https://doi.org/10.1117/12.783452

KEYWORDS: Holography, Digital holography, 3D image reconstruction, Reconstruction algorithms, Error analysis, Optical simulations, Holograms, Image processing, Charge-coupled devices, Systems modeling

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Proceedings Article | 25 April 2008 Paper

Paper

Full-field analysis of a liquid crystal cell using a low birefringence polariscope

Wang Pin, Anand Asundi

Proceedings Volume 6995, 69950X (2008) https://doi.org/10.1117/12.782261

KEYWORDS: Liquid crystals, Birefringence, Phase shifts, Polarizers, Image analysis, Wave plates, LCDs, Aerospace engineering, Optical alignment, Light

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Proceedings Article | 25 April 2008 Paper

Paper

Characterization of MEMS cantilevers using lensless digital holographic microscope

Vijay Raj Singh, Alexandru Andrei, Christophe Gorecki, Lukasz Nieradko, Anand Asundi

Proceedings Volume 6995, 69950F (2008) https://doi.org/10.1117/12.782981

KEYWORDS: Digital holography, 3D image reconstruction, Holography, Holograms, Microscopes, Microelectromechanical systems, Aluminum nitride, Beam splitters, Vibrometry, Charge-coupled devices

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Proceedings Article | 25 April 2008 Paper

Paper

A multipoint diffraction strain sensor using a micro-lens array: from theory to application

Jun Wang, Anand Asundi

Proceedings Volume 6995, 69950N (2008) https://doi.org/10.1117/12.782614

KEYWORDS: Diffraction, Sensors, Microlens array, Wavefronts, Confocal microscopy, Microscopes, Interferometers, Diffraction gratings, Fringe analysis, Charge-coupled devices

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Proceedings Article | 25 January 2008 Paper

Paper

Development of a simple user-friendly commercial digital holographic microscope

Oi Choo Chee, Vijay Raj Singh, Eddy Sim, Anand Asundi

Proceedings Volume 6912, 69120V (2008) https://doi.org/10.1117/12.760625

KEYWORDS: Digital holography, Holograms, Holography, Microscopes, 3D metrology, 3D image processing, Reflection, 3D image reconstruction, Glasses, Silicon

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Proceedings Article | 11 September 2007 Paper

Paper

Warpage of thin wafers using computer aided reflection moire method

Chi Seng Ng, Kok Yau Chua, Meng Tong Ong, Yoke Chin Goh, Anand Asundi

Proceedings Volume 6672, 667203 (2007) https://doi.org/10.1117/12.732783

KEYWORDS: Semiconducting wafers, Metals, LCDs, Packaging, Silicon, Beam splitters, Visualization, Reflection, Moire patterns, Analytical research

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Proceedings Article | 18 June 2007 Paper

Paper

Double exposure time-averaged in-line digital holography

Vijay Raj Singh, Anand Asundi, Jianmin Miao

Proceedings Volume 6616, 661630 (2007) https://doi.org/10.1117/12.724470

KEYWORDS: Holograms, Digital holography, 3D image reconstruction, Microelectromechanical systems, Charge-coupled devices, Holography, Bessel functions, Metrology, Aluminum, Image processing

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Proceedings Article | 18 June 2007 Paper

Paper

Phase measurement errors due to holographic interferograms compression

Emmanouil Darakis, Vijay Raj Singh, Anand Asundi, John Soraghan

Proceedings Volume 6616, 661612 (2007) https://doi.org/10.1117/12.725858

KEYWORDS: Image compression, Digital holography, Holograms, JPEG2000, Holography, Holographic interferometry, Phase measurement, Reflectivity, Beam splitters, Mirrors

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Proceedings Article | 26 April 2007 Paper

Paper

Optical fluorescence biosensor for plant water stress detection

Jenny Chong, O. Liew, B. Li, A. Asundi

Proceedings Volume 6535, 65350S (2007) https://doi.org/10.1117/12.740959

KEYWORDS: Luminescence, Spectroscopy, Agriculture, Signal detection, Microscopes, Fluorescence spectroscopy, Biosensors, Green fluorescent protein, Sensors, Chromophores

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SPIE Journal Paper | 1 March 2007

Whole-field optical strain sensor using a microlens array

Anand Asundi, Jun Wang, Anish Priyadarshi, Wei Zhou, Subodh Mhaisalkar, Lennie E. Lim

OE, Vol. 46, Issue 03, 034403, (March 2007) https://doi.org/10.1117/12.10.1117/1.2716372

KEYWORDS: Sensors, Diffraction gratings, Microlens array, Diffraction, Wavefront sensors, Interferometry, Optical engineering, CCD image sensors, Wavefronts, Objectives

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Proceedings Article | 14 August 2006 Paper

Paper

Multipoint diffraction strain sensor: an add-on to moiré interferometer

Salman Iqbal, Subodh Mhaisalkar, Anand Asundi

Proceedings Volume 6293, 62930S (2006) https://doi.org/10.1117/12.679893

KEYWORDS: Sensors, Diffraction, Interferometers, Diffraction gratings, Wavefronts, Moire patterns, CCD cameras, Aerospace engineering, Collimation, Charge-coupled devices

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Proceedings Article | 14 August 2006 Paper

Paper

Advances in dynamic metrology using in-line digital holographic interferometry

Vijay Raj Singh, Anand Asundi

Proceedings Volume 6293, 629306 (2006) https://doi.org/10.1117/12.679799

KEYWORDS: Digital holography, Holograms, Charge-coupled devices, 3D image reconstruction, Holographic interferometry, CCD image sensors, Holography, Spatial frequencies, Vibrometry, Digital recording

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Proceedings Article | 14 August 2006 Paper

Paper

Investigation of inherent wafer defects using reflection grating technique

Anand Asundi, Meng Tong Ong, Yoke Chin Goh, Teng Yong Khoo, Shen Fah Loo

Proceedings Volume 6293, 62930E (2006) https://doi.org/10.1117/12.679830

KEYWORDS: Semiconducting wafers, Gold, Phase shifts, LCDs, Beam splitters, Metals, Image processing, Reflectivity, Cameras, Aerospace engineering

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Proceedings Article | 27 April 2006 Paper

Paper

Fabrication technique of nanograting using AFM

Huimin Xie, Zhanwei Liu, Ming Zhang, Wei Zhang, Anand Asundi

Proceedings Volume 6188, 618807 (2006) https://doi.org/10.1117/12.663058

KEYWORDS: Nanolithography, Fabrication, Atomic force microscope, Phase shifting, Mechanics, Manufacturing, Silicon, Atomic force microscopy, Nanotechnology, Aerospace engineering

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Proceedings Article | 27 April 2006 Paper

Paper

Digital in-line holography for dynamic micrometrology

Vijay Raj Singh, Gopalkrishna Hedge, Anand Krishna Asundi

Proceedings Volume 6188, 618803 (2006) https://doi.org/10.1117/12.664812

KEYWORDS: Digital holography, Holograms, 3D image reconstruction, Vibrometry, Image processing, Holography, Charge-coupled devices, Digital recording, Holographic interferometry, CCD image sensors

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Proceedings Article | 7 March 2006 Paper

Paper

Digital microholointerferometry for microstructure studies

Lei Xu, Xiaoyuan Peng, Jianmin Miao, Anand Asundi

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498417

KEYWORDS: Digital holography, Microscopes, Imaging systems, 3D image reconstruction, Holograms, CCD image sensors, Holographic interferometry, Holography, Image resolution, Silicon

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Proceedings Article | 7 March 2006 Paper

Paper

Diffraction strain sensor for micromeasurements

Bing Zhao, Anand Asundi

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498412

KEYWORDS: Diffraction gratings, Sensors, Diffraction, Spatial resolution, CCD image sensors, Quantization, Interference (communication), CCD cameras, Data processing, Image processing

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Proceedings Article | 7 March 2006 Paper

Paper

AFM scanning moire method for nanodeformation measurement

Huimin Xie, Gin Chai, Anand Asundi, Jin Yu, Yunguang Lu, Bryan Ngoi, Zhaowei Zhong, Satoshi Kishimoto

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498437

KEYWORDS: Moire patterns, Mica, Atomic force microscopy, Picosecond phenomena, Adhesives, YAG lasers, Nd:YAG lasers, CRTs, Mechanical engineering, Product engineering

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Proceedings Article | 7 March 2006 Paper

Paper

Optical techniques for the evaluation of thermo-functional gradients in human dentine

Anil Kishen, Vadakke Murukeshan, Anand Asundi

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498411

KEYWORDS: Teeth, Moire patterns, Speckle pattern, Temperature metrology, Thermography, Interferometry, Fringe analysis, Spatial resolution, Composites, Interferometers

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Proceedings Article | 7 March 2006 Paper

Paper

Determination of lasing material properties using laser interferometry and finite-element method

Xiaoyuan Peng, Anand Asundi, Yihong Chen, Zhengjun Xiong, Gnian Cher Lim

Proceedings Volume 4101, (2006) https://doi.org/10.1117/12.498378

KEYWORDS: Crystals, Neodymium, Laser crystals, Laser interferometry, Interferometers, Thermal effects, 3D modeling, Finite element methods, Semiconductor lasers, Diode pumped solid state lasers

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Proceedings Article | 8 November 2005 Paper

Paper

Early detection of calcium deficiency in plants using red edge position

Bingqing Li, Oi Wah Liew, Anand Asundi

Proceedings Volume 5996, 599609 (2005) https://doi.org/10.1117/12.630061

KEYWORDS: Calcium, Reflectivity, Visualization, Aerospace engineering, Tissues, Spectroscopy, Nondestructive evaluation, Chemical elements, Composites, Absorption

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Proceedings Article | 1 September 2005 Paper

Paper

Amplitude contrast image enhancement in digital holography for particles analysis

Vijay Singh, Anand Asundi

Proceedings Volume 5878, 587817 (2005) https://doi.org/10.1117/12.613297

KEYWORDS: Particles, 3D image reconstruction, Digital holography, Holograms, Charge-coupled devices, Image quality, Glasses, Digital imaging, CCD image sensors, 3D image processing

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Proceedings Article | 23 August 2005 Paper

Paper

Effect of humidity on optical fiber-adhesive bonding

A. Priyadarshi, H. Kaur, Anand Asundi, S. Mhaisalkar, V. Kripesh

Proceedings Volume 5869, 58690N (2005) https://doi.org/10.1117/12.616470

KEYWORDS: Adhesives, Optical fibers, Polymers, Silicon, Capillaries, Aluminum, Deflectometry, Brain-machine interfaces, Humidity, Diffusion

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Proceedings Article | 22 June 2005 Paper

Paper

Photomechanical studies on non-carious-cervical-lesions of the teeth

A. Kishen, K. B. C. Tan, A. Asundi

Proceedings Volume 5771, (2005) https://doi.org/10.1117/12.634776

KEYWORDS: Teeth, Moire patterns, Fringe analysis, Diffraction gratings, Deflectometry, Tissues, Transformers, Interferometers, CCD cameras, Finite element methods

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Proceedings Article | 22 June 2005 Paper

Paper

Development of fiber optic spectroscopy for detection of genetically modified plants

O. Liew, X. Chean, J.-P. Chong, J.-Z. Ho, J. Chen, A. Asundi, O. Aiemwiwattanakul

Proceedings Volume 5771, (2005) https://doi.org/10.1117/12.634780

KEYWORDS: Luminescence, Fiber optics, Spectroscopy, Green fluorescent protein, Fluorescent proteins, Proteins, Signal detection, Blue light emitting diodes, Fluorescence spectroscopy, Tissues

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SPIE Journal Paper | 1 May 2005 Open Access

Open Access

Photomechanical investigations on the stress-strain relationship in dentine macrostructure

Anil Kishen, Anand Asundi

JBO, Vol. 10, Issue 03, 034010, (May 2005) https://doi.org/10.1117/12.10.1117/1.1924688

KEYWORDS: Teeth, Photoelasticity, 3D modeling, Bone, Digital photography, Fringe analysis, Deflectometry, Liquids, Interfaces, Minerals

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Proceedings Article | 12 April 2005 Paper

Paper

Moiré interferometric investigation on the role of hydration in the mechanical behavior of dentine

Anil Kishen, Anand Asundi

Proceedings Volume 5852, (2005) https://doi.org/10.1117/12.621895

KEYWORDS: Teeth, Deflectometry, Fringe analysis, Interferometry, Diffraction gratings, Interferometers, Epoxies, CCD cameras, Dentistry, Experimental mechanics

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Proceedings Article | 12 April 2005 Paper

Paper

Determination of phase-shift from two fringe patterns using windowed Fourier ridges

Kemao Qian, Hock Soon Seah, Anand Asundi

Proceedings Volume 5852, (2005) https://doi.org/10.1117/12.621484

KEYWORDS: Fringe analysis, Phase interferometry, Fourier transforms, Phase shifts, Convolution, Experimental mechanics, Computer engineering, Mechanical engineering, Product engineering, Interferometry

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Proceedings Article | 12 April 2005 Paper

Paper

Spatially sampling effect on fringe phase-shifting detection

Bing Zhao, Huimin Xie, Anand Asundi

Proceedings Volume 5852, (2005) https://doi.org/10.1117/12.621507

KEYWORDS: Signal to noise ratio, Phase measurement, Phase shifts, Fringe analysis, Quantization, Signal attenuation, Modulation, Interference (communication), Mechanics, Error analysis

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Proceedings Article | 12 April 2005 Paper

Paper

Laser interferometry method for measuring displacement field of crack tip of bimetal hot-dip specimen

Jiyong Chen, Anand Asundi

Proceedings Volume 5852, (2005) https://doi.org/10.1117/12.621893

KEYWORDS: Interfaces, Zinc, Iron, Aluminum, Chemical elements, Composites, Laser interferometry, Coating, Deflectometry, Scanning electron microscopy

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Proceedings Article | 12 April 2005 Paper

Paper

A compact remote controlled interferometer for photomechanics applications

Zhong Ming, Low Kelvin, Nadirah Mohamed, Andrew Sabaratnam, Anand Asundi, Gopalkrishna Hegde

Proceedings Volume 5852, (2005) https://doi.org/10.1117/12.621938

KEYWORDS: Interferometers, Mirrors, Internet, LabVIEW, Control systems, Human-machine interfaces, Cameras, Michelson interferometers, Experimental mechanics, Data acquisition

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Proceedings Article | 12 April 2005 Paper

Paper

Spectroscopic detection of fluorescent protein marker gene activity in genetically modified plants

O. W. Liew, Jenny Chong, Anand Asundi

Proceedings Volume 5852, (2005) https://doi.org/10.1117/12.621891

KEYWORDS: Luminescence, Proteins, Spectroscopy, Fiber optics, Fluorescence spectroscopy, Green fluorescent protein, Signal detection, Biological research, Fluorescent proteins, Light sources

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Proceedings Article | 12 April 2005 Paper

Paper

Use of reflectance spectroscopy for early detection of calcium deficiency in plants

Bingqing Li, Liew Oi Wah, Anand Asundi

Proceedings Volume 5852, (2005) https://doi.org/10.1117/12.621886

KEYWORDS: Calcium, Reflectivity, Reflectance spectroscopy, Chemical elements, Spectroscopy, Data acquisition, Color difference, Lithium, Tissues, Light sources

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Proceedings Article | 12 April 2005 Paper

Paper

Comparative study of all optical fibers in different smart structures and non-destructive evaluation

Gopalkrishna Hegde, Anand Asundi

Proceedings Volume 5852, (2005) https://doi.org/10.1117/12.621298

KEYWORDS: Optical fibers, Sensors, Composites, Fiber optics sensors, Smart structures, Nondestructive evaluation, Polarization, Polarimetry, Birefringence, Photodetectors

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Proceedings Article | 12 April 2005 Paper

Paper

Uncertainty principle and fringe image processing

Bing Zhao, Huimin Xie, Anand Asundi

Proceedings Volume 5852, (2005) https://doi.org/10.1117/12.621666

KEYWORDS: Spatial resolution, Fringe analysis, Phase measurement, Modulation, Fourier transforms, Phase shifting, Signal processing, Signal detection, Image processing, Frequency modulation

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Proceedings Article | 14 February 2005 Paper

Paper

A phase-shifting technique for Jamin laser interferometry

Bing Zhao, Ruhua Fang, Zhengyuang Cao, Anand Asundi

Proceedings Volume 5776, (2005) https://doi.org/10.1117/12.611691

KEYWORDS: Interferometers, Phase shifting, Phase shifts, Fringe analysis, Refractive index, Beam splitters, Polarization, Phase measurement, Wave plates, Algorithm development

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SPIE Journal Paper | 1 October 2004

Thermal lensing effects for diode-end-pumped Nd:YVO₄ and Nd:YAG lasers

Xiaoyuan Peng, Lei Xu, Anand Asundi

OE, Vol. 43, Issue 10, (October 2004) https://doi.org/10.1117/12.10.1117/1.1787529

KEYWORDS: Nd:YAG lasers, Crystals, Thermal effects, 3D modeling, Laser crystals, Thermal modeling, Semiconductor lasers, Refractive index, Neodymium lasers, Copper

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Proceedings Article | 1 September 2004 Paper

Paper

Numerical and experimental study diode-pumped Nd:YVO₄ laser with undoped end cap

Xiaoyuan Peng, Lei Xu, Anand Asundi

Proceedings Volume 5460, (2004) https://doi.org/10.1117/12.545657

KEYWORDS: Crystals, Composites, Laser crystals, Thermal effects, Semiconductor lasers, Interfaces, 3D modeling, Copper, Neodymium, Surface finishing

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Proceedings Article | 20 August 2004 Paper

Paper

Optical techniques to understand biofunctional adaptation in human dentine

Anil Kishen, Anand Asundi

Proceedings Volume 5474, (2004) https://doi.org/10.1117/12.578378

KEYWORDS: Teeth, Moire patterns, Interferometry, Fringe analysis, 3D modeling, Photoelasticity, Speckle pattern, Bone, Digital photography, Deflectometry

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Proceedings Article | 17 August 2004 Paper

Paper

Hybrid analysis of micromachined silicon thin film based on digital microscopic holography

Lei Xu, Xiaoyuan Peng, Jianmin Miao, Anand Asundi

Proceedings Volume 5458, (2004) https://doi.org/10.1117/12.546600

KEYWORDS: Sensors, Digital holography, Holography, Thin films, Silicon films, Silicon, Crystals, Chemical elements, Numerical analysis, Data modeling

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Proceedings Article | 17 August 2004 Paper

Paper

A plastic fiber polarimetric sensor for dynamic applications

Gopalkrishna Hegde, E. Purnomo, E. Ang, Andrew Sabaratnam, Anand Asundi

Proceedings Volume 5458, (2004) https://doi.org/10.1117/12.545210

KEYWORDS: Sensors, Fiber optics sensors, Phase only filters, Glasses, Polarimetry, Structured optical fibers, Birefringence, Structural health monitoring, Signal attenuation, Polarization

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Proceedings Article | 17 August 2004 Paper

Paper

Performance of a multifiber polarimetric strain sensor

Gopalkrishna Hegde, Eluska Sukia, Lim Choo Min, Anand Asundi

Proceedings Volume 5458, (2004) https://doi.org/10.1117/12.544179

KEYWORDS: Polarization, Sensors, Polarimetry, Phase modulation, Composites, Structured optical fibers, Smart structures, Beam propagation method, Structural health monitoring, Fiber optics sensors

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Proceedings Article | 17 August 2004 Paper

Paper

Application on multichannel V-groove inspection

Chongxiang Li, Anand Asundi, Zhong Ping Fang

Proceedings Volume 5458, (2004) https://doi.org/10.1117/12.544171

KEYWORDS: Inspection, Optical alignment, Silicon, Semiconducting wafers, 3D metrology, Sensors, Microelectromechanical systems, Anisotropic etching, Etching, Photomasks

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Proceedings Article | 2 August 2004 Paper

Paper

Optical diffraction strain sensor

Anand Asundi

Proceedings Volume 5532, (2004) https://doi.org/10.1117/12.555654

KEYWORDS: Sensors, Diffraction, Brain-machine interfaces, Interferometers, Diffraction gratings, Fringe analysis, Objectives, Composites, Deflectometry, Interferometry

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Proceedings Article | 2 August 2004 Paper

Paper

Micro optical probe sensor (MOPS) for dynamic in-plane displacement sensing

Anand Asundi, Xiaoming Luo

Proceedings Volume 5532, (2004) https://doi.org/10.1117/12.557504

KEYWORDS: Sensors, Actuators, Diffraction gratings, Laser beam diagnostics, Positron emission tomography, Spatial frequencies, Optical resolution, Objectives, Wave plates, Photodetectors

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Proceedings Article | 2 August 2004 Paper

Paper

Study of high temperature loading on optical fiber-adhesive bonding

Anish Priyadarshi, L. Hsueh Fen, Anand Asundi, S. Mhaisalkar, V. Kripesh

Proceedings Volume 5532, (2004) https://doi.org/10.1117/12.564236

KEYWORDS: Silicon, Optical fibers, Adhesives, Epoxies, Single mode fibers, Temperature metrology, Moire patterns, Interfaces, Deflectometry, Optical components

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Proceedings Article | 2 August 2004 Paper

Paper

A simple phase unwrapping approach using windowed Fourier filtering

Qian Kemao, Seah Hock Soon, Anand Asundi

Proceedings Volume 5531, (2004) https://doi.org/10.1117/12.557603

KEYWORDS: Fourier transforms, Image filtering, Convolution, Optical filters, Optical interferometry, Algorithm development, Computer engineering, Mechanical engineering, Product engineering, Fringe analysis

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Proceedings Article | 4 March 2004 Paper

Paper

Compact broadband tunable short-pulse high-repetition-rate optical parametric oscillator

Xiaoyuan Peng, Lei Xu, Anand Asundi

Proceedings Volume 5270, (2004) https://doi.org/10.1117/12.515967

KEYWORDS: Optical parametric oscillators, Crystals, Neodymium lasers, Laser crystals, Semiconductor lasers, Coating, Nonlinear crystals, Wavelength tuning, Pulsed laser operation, Q switched lasers

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Proceedings Article | 23 December 2003 Paper

Paper

Automated full-field interferometric characterization of micromachined silicon membrane

Lei Xu, Xiaoyuan Peng, Jianmin Miao, Anand Asundi

Proceedings Volume 5343, (2003) https://doi.org/10.1117/12.524977

KEYWORDS: Sensors, Silicon, Interferometry, Digital holography, Crystals, Microscopes, Imaging systems, Computing systems, Charge-coupled devices, Spatial resolution

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Proceedings Article | 14 October 2003 Paper

Paper

Fiber optic polarimetric sensor (FOPS) prototype and applications

Anand Asundi

Proceedings Volume 5062, (2003) https://doi.org/10.1117/12.514566

KEYWORDS: Sensors, Fiber optics sensors, Polarimetry, Fiber optics, Polarization, Prototyping, Birefringence, Composites, Bridges, Smart structures

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Proceedings Article | 14 October 2003 Paper

Paper

Performance of a fiber optic polarimetric sensor in health monitoring of different smart structures

Gopalkrishna Hegde, Anand Asundi

Proceedings Volume 5062, (2003) https://doi.org/10.1117/12.514903

KEYWORDS: Sensors, Fiber optics sensors, Structured optical fibers, Composites, Smart structures, Polarimetry, Aluminum, Fiber optics, Damage detection, Structural health monitoring

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Proceedings Article | 13 October 2003 Paper

Paper

A fiber-optic-based biosensor to monitor mutans streptococci in saliva

Anil Kishen, M. John, Chu Lim, Anand Asundi

Proceedings Volume 5068, (2003) https://doi.org/10.1117/12.518766

KEYWORDS: Fiber optics sensors, Fiber optics, Spectroscopy, Sensors, Biosensors, Dental caries, Absorption, Glasses, Sol-gels, Optical fibers

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Proceedings Article | 3 October 2003 Paper

Paper

MEMS deep-RIE fabrication process and device characterization

Jing Li, Qing Xin Zhang, Anand Krishna Asundi, Ai Qun Liu

Proceedings Volume 5145, (2003) https://doi.org/10.1117/12.500343

KEYWORDS: Etching, Oxides, Silicon, Reactive ion etching, Optical switching, Microelectromechanical systems, Deep reactive ion etching, Semiconducting wafers, Plasma enhanced chemical vapor deposition, Anisotropic etching

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Proceedings Article | 3 October 2003 Paper

Paper

MEMS optical switch control and integrated packaging

Hong Cai, Chong Wei Chan, Yixin Wang, Chao Lu, Anand Asundi, Ai Qun Liu

Proceedings Volume 5145, (2003) https://doi.org/10.1117/12.500339

KEYWORDS: Switches, Microelectromechanical systems, Control systems, Optical switching, Packaging, Reflectivity, Optical fibers, Optical components, Control systems design, Computing systems

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Proceedings Article | 3 October 2003 Paper

Paper

Micro/nano moire methods

Anand Asundi, Haixia Shang, Huimin Xie, Biao Li

Proceedings Volume 5145, (2003) https://doi.org/10.1117/12.500902

KEYWORDS: Atomic force microscopy, Scanning electron microscopy, Moire patterns, Microelectromechanical systems, Mica, Crystals, Mechanics, Spatial resolution, Scanners, Electronic components

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Proceedings Article | 3 October 2003 Paper

Paper

Photonic bandgap crystals: a breakthrough for new-generation integrated optical device

Ai Qun Liu, Anand Asundi

Proceedings Volume 5145, (2003) https://doi.org/10.1117/12.501211

KEYWORDS: Photonic crystals, Crystals, Photonic crystal devices, Silicon, Integrated optics, Microelectromechanical systems, Photons, Glasses, Nanofabrication, Semiconductors

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SPIE Journal Paper | 1 October 2003

Filtering the complex field in phase shifting interferometry

Kemao Qian, Hock Soon Seah, Anand Asundi

OE, Vol. 42, Issue 10, (October 2003) https://doi.org/10.1117/12.10.1117/1.1609457

KEYWORDS: Fourier transforms, Fringe analysis, Phase interferometry, Phase shifts, Phase retrieval, Optical filters, Speckle, Interference (communication), Computer engineering, Mechanical engineering

SPIE Journal Paper | 1 September 2003

Noise suppression in spatial carrier phase shifting method

Kemao Qian, Seah Hock Soon, Anand Asundi

OE, Vol. 42, Issue 09, (September 2003) https://doi.org/10.1117/12.10.1117/1.1592169

KEYWORDS: Bandpass filters, Phase shifting, Fringe analysis, Linear filtering, Fourier transforms, Computer simulations, Optical filters, Convolution, Computer engineering, Mechanical engineering

Proceedings Article | 18 August 2003 Paper

Paper

Parameters affecting the quality of acquired signals for the global health monitoring of mobile bridges using fiber optic polarimetric sensors

Anand Asundi, Paul Neo Tien Song

Proceedings Volume 5057, (2003) https://doi.org/10.1117/12.482681

KEYWORDS: Bridges, Foam, Fiber optics sensors, Sensors, Signal processing, Polarimetry, Epoxies, Fiber optics, Reliability, Structural health monitoring

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SPIE Journal Paper | 1 August 2003

Digital microholointerferometer: development and validation

Lei Xu, Xiaoyuan Peng, Anand Asundi, Jianmin Miao

OE, Vol. 42, Issue 08, (August 2003) https://doi.org/10.1117/12.10.1117/1.1589026

KEYWORDS: Digital holography, Microscopes, Chemical elements, Holograms, Numerical analysis, Objectives, Optical engineering, 3D image reconstruction, Numerical simulations, Interferometry

Proceedings Article | 1 August 2003 Paper

Paper

Sensitivity analysis of all fibers in polarimetric fiber optic sensor for structural health monitoring of composites

Kar Lee, Adele Peiyi, Fai Chan, Jianheng Ho, John Shelly, Anand Asundi, Gopalkrishna Hegde

Proceedings Volume 5046, (2003) https://doi.org/10.1117/12.484294

KEYWORDS: Optical fibers, Composites, Fiber optics sensors, Sensors, Birefringence, Polarimetry, Structural health monitoring, Phase modulation, Polarization, Nondestructive evaluation

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SPIE Journal Paper | 1 June 2003

Algorithm for directly retrieving the phase difference: a generalization

Kemao Qian, Anand Asundi

OE, Vol. 42, Issue 06, (June 2003) https://doi.org/10.1117/12.10.1117/1.1573640

KEYWORDS: Phase measurement, Phase shifting, Fringe analysis, Fourier transforms, Phase shifts, Speckle, Interferometry, LCDs, Interferometers, Sensors

Proceedings Article | 27 May 2003 Paper

Paper

Sampled speckles and applications

Anand Asundi

Proceedings Volume 4933, (2003) https://doi.org/10.1117/12.516570

KEYWORDS: Speckle, Speckle pattern, Optical filters, Digital imaging, Visibility, Fourier transforms, Error analysis, Photography, Fringe analysis, Image enhancement

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Proceedings Article | 29 April 2003 Paper

Paper

Evaluation of binary speckle correlation

Kemao Qian, Hock Soon Seah, Asundi Anand

Proceedings Volume 5058, (2003) https://doi.org/10.1117/12.509764

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Proceedings Article | 23 December 2002 Paper

Paper

Comparative study on thermal effects of diode-pumped Nd:YVO4 and Nd:YAG lasers

Xiaoyuan Peng, Lei Xu, Anand Asundi

Proceedings Volume 4832, (2002) https://doi.org/10.1117/12.486432

KEYWORDS: Thermal effects, Nd:YAG lasers, Crystals, Neodymium lasers, 3D modeling, Laser crystals, Thermal modeling, Refractive index, Copper, Semiconductor lasers

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Proceedings Article | 23 December 2002 Paper

Paper

Discretization effects on imaging performance of digital holographic systems

Lei Xu, Xiaoyuan Peng, Jianmin Miao, Anand Asundi

Proceedings Volume 4832, (2002) https://doi.org/10.1117/12.486433

KEYWORDS: Imaging systems, Digital holography, CCD image sensors, Holograms, Holography, Digital imaging, Image resolution, 3D image reconstruction, Charge-coupled devices, Distortion

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Proceedings Article | 4 September 2002 Paper

Paper

Light source fluctuation effect on confocal imaging system

Anand Asundi, Chongxiang Li, Yanfeng Zhang, Zhong Fang

Proceedings Volume 4768, (2002) https://doi.org/10.1117/12.482183

KEYWORDS: Light sources, Confocal microscopy, Imaging systems, Stereoscopy, Inspection, Error analysis, 3D metrology, 3D modeling, Image resolution, Light

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Proceedings Article | 4 September 2002 Paper

Paper

Double-detector-array 3D profile inspection system

Chongxiang Li, Zhong Fang, Anand Asundi

Proceedings Volume 4768, (2002) https://doi.org/10.1117/12.482184

KEYWORDS: Confocal microscopy, Light sources, 3D metrology, Inspection, 3D image processing, Sensors, Optical fibers, Imaging systems, Fiber couplers, Signal detection

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Proceedings Article | 19 June 2002 Paper

Paper

Development and validation of digital microholo interferometric system for micromechanical testing

Lei Xu, Xiaoyuan Peng, Jianmin Miao, Anand Asundi

Proceedings Volume 4778, (2002) https://doi.org/10.1117/12.473541

KEYWORDS: Interferometry, Digital holography, Imaging systems, Microscopes, Bridges, Chemical elements, Molecular bridges, Numerical analysis, Objectives, Numerical simulations

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SPIE Journal Paper | 1 June 2002

Strain contouring using gabor filters: principle and algorithm

Anand Asundi, Jun Wang

OE, Vol. 41, Issue 06, (June 2002) https://doi.org/10.1117/12.10.1117/1.1477440

KEYWORDS: Fringe analysis, Optical filters, Gaussian filters, Optical engineering, Image segmentation, Convolution, Fourier transforms, Algorithm development, Interferometry, Spatial filters

Proceedings Article | 29 May 2002 Paper

Paper

Thermal deformation of electronic package using scanning moire method with high-resolution microscopy

Anand Asundi, Huimin Xie, Chai Boay

Proceedings Volume 4537, (2002) https://doi.org/10.1117/12.468790

KEYWORDS: Moire patterns, Electron beams, Atomic force microscopy, Scanning electron microscopy, Microscopy, Fringe analysis, Scanners, Deflectometry, Electron beam lithography, Metals

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Proceedings Article | 29 May 2002 Paper

Paper

Strain contouring using Gabor filters: filter bank design

Jun Wang, W. Chen, Anand Asundi

Proceedings Volume 4537, (2002) https://doi.org/10.1117/12.468859

KEYWORDS: Moire patterns, Optical filters, Fringe analysis, Gaussian filters, Atrial fibrillation, Algorithm development, Fourier transforms, Image segmentation, Bandpass filters, Optical design

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SPIE Journal Paper | 1 April 2002

Diffraction image in an optical microscope: application to detection of birefringence

Bing Zhao, Zhengyuan Cao, Ruhua Fang, Anand Asundi

OE, Vol. 41, Issue 04, (April 2002) https://doi.org/10.1117/12.10.1117/1.1458550

KEYWORDS: Diffraction, Birefringence, Microscopes, Polarization, Objectives, Statistical analysis, Optical microscopes, Visualization, Polarizers, Image acquisition

SPIE Journal Paper | 1 April 2002 Open Access

Open Access

Photomechanical investigations on post-endodontically rehabilitated teeth

Anil Kishen, Anand Asundi

JBO, Vol. 7, Issue 02, (April 2002) https://doi.org/10.1117/12.10.1117/1.1463046

KEYWORDS: Teeth, Photoelasticity, Resistance, Digital photography, Scanning electron microscopy, Fringe analysis, Cements, Failure analysis, Phase shifts, Bone

Proceedings Article | 26 November 2001 Paper

Paper

Strain contouring using Gabor filters

Anand Asundi, Jun Wang

Proceedings Volume 4448, (2001) https://doi.org/10.1117/12.449383

KEYWORDS: Fringe analysis, Image segmentation, Image filtering, Deflectometry, Algorithm development, Fourier transforms, Optical filters, Gaussian filters, Mechanical engineering, Product engineering

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Proceedings Article | 26 November 2001 Paper

Paper

Phase-shifting AFM moire method

Anand Asundi, Huimin Xie, Jin Yu, Zhaowei Zhong

Proceedings Volume 4448, (2001) https://doi.org/10.1117/12.449366

KEYWORDS: Atomic force microscopy, Phase shifting, Phase shifts, Phase measurement, Scanners, Ferroelectric materials, Moire patterns, Holography, Fringe analysis, Sensors

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SPIE Journal Paper | 1 November 2001

Hybrid holographic microscope for interferometric measurement of microstructures

Lei Xu, Xiaoyuan Peng, Anand Asundi, Jianmin Miao

OE, Vol. 40, Issue 11, (November 2001) https://doi.org/10.1117/12.10.1117/1.1412621

KEYWORDS: Digital holography, Holography, Microscopes, 3D image reconstruction, Interferometry, Holograms, Holographic interferometry, Image resolution, Microelectromechanical systems, CCD image sensors

Proceedings Article | 30 October 2001 Paper

Paper

Dynamic phase-shift photoelasticity

Tong Liu, Chai Boay, Anand Asundi

Proceedings Volume 4596, (2001) https://doi.org/10.1117/12.447355

KEYWORDS: Digital filtering, Phase shifts, Photoelasticity, CCD cameras, Sensors, Optical filters, Image processing, Image filtering, Charge-coupled devices, Prisms

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Proceedings Article | 30 October 2001 Paper

Paper

Micro-moire for thermal deformation investigation in electronics packaging

Zhaowei Zhong, S. Lim, Anand Asundi, Tai Chai

Proceedings Volume 4596, (2001) https://doi.org/10.1117/12.447350

KEYWORDS: Tin, Silver, Deflectometry, Copper, Electronics, Diffraction gratings, Fringe analysis, Packaging, Interferometers, Microelectronics

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Proceedings Article | 30 October 2001 Paper

Paper

Development of fiber optic spectroscopy for in-vitro and in-planta detection of fluorescent proteins

Oi Wah Liew, Jun-Wei Chen, Anand Asundi

Proceedings Volume 4596, (2001) https://doi.org/10.1117/12.447345

KEYWORDS: Luminescence, Fluorescent proteins, Spectroscopy, Blue light emitting diodes, Tungsten, Halogens, Proteins, Light sources, In vitro testing, Fiber optics

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The objective of this project is to apply photonics technology to bio-safety management of genetically modified (GM) plants. The conventional method for screening GM plants is through selection using antibiotic resistance markers. There is public concern with such approaches and these are associated with food safety issues, escape of antibiotic resistance genes to pathogenic microorganisms and interference with antibiotic therapy. Thus, the strategy taken in this project is to replace antibiotic resistance markers with fluorescent protein markers that allow for rapid and non-invasive optical screening of genetically modified plants. In this paper, fibre optic spectroscopy was developed to detect and quantify recombinant green (EGFP) and red (DsRED) fluorescent proteins in vitro and in planta. In vitro detection was first carried out to optimize the sensitivity of the optical system. The bacterial expression vectors carrying the coding regions of EGFP and DsRED were introduced into Escherichia coli host cells and fluorescent proteins were produced following induction with IPTG. Soluble EGFP and DsRED proteins were isolated from lysed bacterial cells and serially diluted for quantitative analysis by fibre optic spectroscopy using different light sources, namely, blue LED (475 nm), tungsten halogen (350 - 1000 nm) and double frequency Nd:YAG green laser (532 nm). Fluorescence near the expected emission wavelengths could be detected up to 320X dilution for EGFP and DsRED with blue LED and 532 nm green laser, respectively, as the excitation source. Tungsten halogen was found to be unsuitable for excitation of both EGFP and DsRED. EGFP was successfully purified by size separation under non-denaturing electrophoretic conditions and quantified. The minimum concentration of EGFP detectable with blue LED excitation was 5 mg/ml. To determine the capability of spectroscopy detection in planta, transgenic potato hairy roots and whole modified plant lines expressing the fluorescent markers were regenerated. T

Proceedings Article | 30 October 2001 Paper

Paper

Multichannel 3D profilometry

Chongxiang Li, Anand Asundi, Zhong Fang

Proceedings Volume 4596, (2001) https://doi.org/10.1117/12.447340

KEYWORDS: Confocal microscopy, 3D metrology, Fiber couplers, Light sources, Sensors, Photodetectors, 3D image processing, Semiconductor lasers, Interferometry, Spatial resolution

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Proceedings Article | 30 October 2001 Paper

Paper

Use of Matlab filtering techniques in digital speckle pattern interferometry

Vadakke Murukeshan, Lai Fei, V. Krishnakumar, Seng Ong, Anand Asundi

Proceedings Volume 4596, (2001) https://doi.org/10.1117/12.447356

KEYWORDS: Fringe analysis, Image filtering, MATLAB, Software development, Digital filtering, Speckle, Fourier transforms, Image processing, Interferometry, Signal processing

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Proceedings Article | 30 October 2001 Paper

Paper

Simple extrashort external-cavity laser self-mixing interferometer for acceleration sensing

Franck Chollet, Gopalkrishna Hegde, Anand Asundi, Ai Liu

Proceedings Volume 4596, (2001) https://doi.org/10.1117/12.447353

KEYWORDS: Mirrors, Actuators, Sensors, Semiconductor lasers, Interference (communication), Interferometers, Modulation, Micromirrors, Photodetectors, Photonics

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Proceedings Article | 30 October 2001 Paper

Paper

Tele-shearography for nondestructive evaluation (NDE) of aircraft/composite panels: an analysis

Chee Keong Ng, Vadakke Murukeshan, Seng Ong, Brian Wong, Anand Asundi

Proceedings Volume 4596, (2001) https://doi.org/10.1117/12.447337

KEYWORDS: Nondestructive evaluation, Shearography, Composites, Fringe analysis, Thermography, Ultrasonics, Speckle pattern, Signal processing, Image processing, Cameras

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Proceedings Article | 30 October 2001 Paper

Paper

Fiber Optic Polarimetric Sensor (FOPS) for dynamic applications

M. Shelly John, Vadakke Murukeshan, Anand Asundi

Proceedings Volume 4596, (2001) https://doi.org/10.1117/12.447328

KEYWORDS: Fiber optics sensors, Sensors, Optical fibers, Fiber optics, Polarimetry, Birefringence, Composites, Reliability, Polarization, Optical sensing

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Proceedings Article | 30 October 2001 Paper

Paper

Simultaneous microstress and strain measurement with an optical microscope

Bing Zhao, Anand Asundi

Proceedings Volume 4596, (2001) https://doi.org/10.1117/12.447349

KEYWORDS: Diffraction gratings, Diffraction, Microscopes, Photoelasticity, Optical microscopes, Light sources, Laser sources, Objectives, Crystals, Optical testing

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Proceedings Article | 30 October 2001 Paper

Paper

High-resolution micro-moire methods: principles and applications

Anand Asundi, Huimin Xie, Chai Boay

Proceedings Volume 4596, (2001) https://doi.org/10.1117/12.447352

KEYWORDS: Atomic force microscopy, Electron beams, Phase shifting, Scanners, Picosecond phenomena, Deflectometry, Scanning electron microscopy, Ferroelectric materials, Moire patterns, Sensors

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Proceedings Article | 30 October 2001 Paper

Paper

Surface inspection using radon transform of projected grating patterns

Krishnakumar Venkateswaran, Anand Asundi

Proceedings Volume 4596, (2001) https://doi.org/10.1117/12.447326

KEYWORDS: Radon, Radon transform, Inspection, Glasses, Phase shifting, Fringe analysis, Image processing, Spatial frequencies, Superposition, Optical sensors

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Proceedings Article | 30 October 2001 Paper

Paper

Fourier transform method for phase retrieving from fringe patterns with carrier: window selection

Kemao Qian, Xiaoping Wu, Anand Asundi

Proceedings Volume 4596, (2001) https://doi.org/10.1117/12.447366

KEYWORDS: Fringe analysis, Fourier transforms, Computer simulations, Sensors, Optical filters, Mechanics, Optical metrology, Photodetectors, Image filtering

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Proceedings Article | 25 October 2001 Paper

Paper

Fiber optic evanescent wave (FOEW) microbial sensor for dental application

Anil Kishen, M. John, Jun-Wei Chen, Chu Lim, Xiao Hu, Anand Asundi

Proceedings Volume 4597, (2001) https://doi.org/10.1117/12.446654

KEYWORDS: Sensors, Optical fibers, Fiber optics, Dental caries, Spectroscopy, Fiber optics sensors, Sol-gels, Wave sensors, Chemical analysis, Silicon

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Proceedings Article | 23 October 2001 Paper

Paper

Three-dimensional biofunctional adaptation in human tooth

Anil Kishen, Chu Lim, Anand Asundi

Proceedings Volume 4512, (2001) https://doi.org/10.1117/12.446757

KEYWORDS: Teeth, 3D modeling, X-ray imaging, Minerals, X-rays, Bone, Digital photography, Photoelasticity, Stress analysis, Silicon

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Proceedings Article | 23 October 2001 Paper

Paper

Study of parameters affecting the sensitivity of a 3D measurement system using the phase shifting technique

Zhaowei Zhong, Chew Han, Anand Asundi

Proceedings Volume 4398, (2001) https://doi.org/10.1117/12.445561

KEYWORDS: Projection systems, Cameras, Phase shifting, 3D metrology, Calibration, Image processing, Image acquisition, Imaging systems, LCDs, MATLAB

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Proceedings Article | 6 August 2001 Paper

Paper

FMCW reflectometric optical fiber strain sensor

Pei Won, Leong Seah, Anand Asundi

Proceedings Volume 4328, (2001) https://doi.org/10.1117/12.435539

KEYWORDS: Optical fibers, Semiconductor lasers, Sensing systems, Signal detection, Phase shifts, Signal processing, Sensors, Modulation, Heterodyning, Bandpass filters

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SPIE Journal Paper | 1 August 2001

Full field automated photoelasticity using two-load-step method

Tong Liu, Anand Asundi, Chai Boay

OE, Vol. 40, Issue 08, (August 2001) https://doi.org/10.1117/12.10.1117/1.1386372

KEYWORDS: Photoelasticity, Phase shifts, Optical engineering, Phase shifting, Algorithm development, Mechanical engineering, Product engineering, Digital photography, Stress analysis, Image analysis

Proceedings Article | 13 June 2001 Paper

Paper

Polarimetric sensors for damage detection of aluminum materials

Wee Chang, Poh Ng, Su-fern Sng, Jianjun Ma, Anand Asundi, Jayanth Puttappa

Proceedings Volume 4317, (2001) https://doi.org/10.1117/12.429577

KEYWORDS: Aluminum, Sensors, Fiber optics sensors, Polarimetry, Optical fibers, Damage detection, Fourier transforms, Temperature metrology, Electromagnetic interference, Signal processing

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Proceedings Article | 13 June 2001 Paper

Paper

Thermal deformation measurement of electronic packaging component using AFM scanning moire method

Huimin Xie, Gin Chai, Anand Asundi, Yu Jin, Yunguang Lu, Bryan Ngoi, Zhaowei Zhong

Proceedings Volume 4317, (2001) https://doi.org/10.1117/12.429567

KEYWORDS: Moire patterns, Electronic components, Packaging, Atomic force microscopy, Picosecond phenomena, Scanners, Microelectromechanical systems, Holography, Sensors, Mechanical engineering

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Proceedings Article | 13 June 2001 Paper

Paper

Photoelastic stress analysis of internal fixation techniques for femur shaft crack

Tong Liu, Gin Chai, Anand Asundi, Arumaaran Murugiah

Proceedings Volume 4317, (2001) https://doi.org/10.1117/12.429618

KEYWORDS: Photoelasticity, Stress analysis, Bone, Fringe analysis, Manufacturing, Design for manufacturability, Phase shifting, Digital photography, Tissues, Finite element methods

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Proceedings Article | 13 June 2001 Paper

Paper

Dynamic photoelasticity by TDI imaging

Anand Asundi, M. Sajan

Proceedings Volume 4317, (2001) https://doi.org/10.1117/12.429561

KEYWORDS: Photoelasticity, Cameras, Imaging systems, Photography, Charge-coupled devices, Wave propagation, Sensors, Visualization, Mechanics, Video

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Proceedings Article | 13 June 2001 Paper

Paper

Inspection of defects in wineglasses using Gabor-filter demodulation method

Jun Wang, Anand Asundi

Proceedings Volume 4317, (2001) https://doi.org/10.1117/12.429591

KEYWORDS: Inspection, Demodulation, Image filtering, Distortion, Feature extraction, Computing systems, Fringe analysis, Spatial frequencies, Optical filters, Glasses

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Proceedings Article | 13 June 2001 Paper

Paper

Measurement of residual stresses in polymer composites using moire interferometry

Krishnakumar Shankar, Huimin Xie, Anand Asundi, Kim Oh, Gin Chai

Proceedings Volume 4317, (2001) https://doi.org/10.1117/12.429571

KEYWORDS: Deflectometry, Fringe analysis, Composites, Epoxies, Polymers, Interferometry, Temperature metrology, Collimation, Optics manufacturing, Moire patterns

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Proceedings Article | 13 June 2001 Paper

Paper

Diffraction strain sensor for micromeasurements

Bing Zhao, Anand Asundi

Proceedings Volume 4317, (2001) https://doi.org/10.1117/12.429584

KEYWORDS: Sensors, Diffraction, Diffraction gratings, Spatial resolution, CCD image sensors, Quantization, Interference (communication), CCD cameras, Data processing, Signal processing

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Proceedings Article | 13 June 2001 Paper

Paper

FMCW reflectometric optical fiber strain sensor

Pei Won, Leong Seah, Anand Asundi

Proceedings Volume 4317, (2001) https://doi.org/10.1117/12.429574

KEYWORDS: Optical fibers, Semiconductor lasers, Phase shifts, Signal processing, Signal detection, Sensors, Modulation, Sensing systems, Computing systems, Heterodyning

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Proceedings Article | 5 June 2001 Paper

Paper

Characterization of microstructures with in-line digital micro-holo-interferometry

Lei Xu, Xiaoyuan Peng, Jianmin Miao, Anand Asundi

Proceedings Volume 4275, (2001) https://doi.org/10.1117/12.429363

KEYWORDS: Digital holography, Holography, Holograms, 3D image reconstruction, Computer simulations, Microscopes, Imaging systems, Image resolution, Microelectromechanical systems, Interferometry

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SPIE Journal Paper | 1 June 2001

Heating measurements in diode-end-pumped Nd:YVO4 lasers

Xiaoyuan Peng, Anand Asundi, Yihong Chen, Zhengjun Xiong

OE, Vol. 40, Issue 06, (June 2001) https://doi.org/10.1117/12.10.1117/1.1365105

KEYWORDS: Thermal effects, Crystals, Temperature metrology, Thermography, Laser crystals, Semiconductor lasers, Infrared radiation, Interferometers, Refractive index, Laser beam diagnostics

Proceedings Article | 8 May 2001 Paper

Paper

Micro-moire methods: optical and scanning techniques

Anand Asundi, Huimin Xie, Chongxiang Li, Chai Boay, Kim Oh

Proceedings Volume 4416, (2001) https://doi.org/10.1117/12.426994

KEYWORDS: Moire patterns, Atomic force microscopy, Deflectometry, Interferometry, Interferometers, Fringe analysis, Collimation, Scanners, Atomic force microscope, Electronic components

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Proceedings Article | 8 May 2001 Paper

Paper

Spectroscopy detection of green and red fluorescent proteins in genetically modified plants using a fiber optics system

Oi Wah Liew, Anand Asundi, Jun-Wei Chen, Yiwen Chew, Shangjuan Yu, Gare Yeo

Proceedings Volume 4416, (2001) https://doi.org/10.1117/12.427067

KEYWORDS: Luminescence, Fluorescent proteins, Spectroscopy, Fiber optics, Proteins, Binary data, Fluorescence spectroscopy, Green fluorescent protein, In vitro testing, Microscopes

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Proceedings Article | 8 May 2001 Paper

Paper

Noninvasive detection of plant nutrient stress using fiber optic spectrophotometry

Jun-Wei Chen, Anand Asundi, Oi Wah Liew, William Boey

Proceedings Volume 4416, (2001) https://doi.org/10.1117/12.427069

KEYWORDS: Reflectivity, Fiber optics, Spectrophotometry, Calcium, Nondestructive evaluation, Nitrogen, Chemical elements, Optical engineering, Optical sensing, Nanotechnology

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Proceedings Article | 16 April 2001 Paper

Paper

Evaluation of scaling output power of diode-end-pumped vanadate lasers

Xiaoyuan Peng, Lei Xu, Anand Asundi, Yihong Chen, Zhengjun Xiong

Proceedings Volume 4267, (2001) https://doi.org/10.1117/12.424621

KEYWORDS: Crystals, Laser crystals, Semiconductor lasers, Transmission electron microscopy, Absorption, Thermal effects, Diffraction, Resonators, Neodymium, Solid state lasers

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SPIE Journal Paper | 1 April 2001 Open Access

Open Access

Advanced digital photoelastic investigations on the tooth-bone interface

Anand Asundi, Anil Kishen

JBO, Vol. 6, Issue 02, (April 2001) https://doi.org/10.1117/12.10.1117/1.1344587

KEYWORDS: Bone, Teeth, Interfaces, Cements, Fringe analysis, Photoelasticity, Digital photography, Optical signal processing, Stress analysis, CCD cameras

SPIE Journal Paper | 1 March 2001

Opto-digital system for curvature measurement

V. Krishnakumar, Vadakke Murukeshan, Anil Kishen, Anand Asundi

OE, Vol. 40, Issue 03, (March 2001) https://doi.org/10.1117/12.10.1117/1.1346586

KEYWORDS: Gaussian filters, Fringe analysis, Image filtering, Bandpass filters, Photography, Linear filtering, Instrumentation engineering, Fiber optics, Mechanical engineering, Optical instrument design

SPIE Journal Paper | 1 December 2000

Properties of digital holography based on in-line configuration

Lei Xu, Jianmin Miao, Anand Asundi

OE, Vol. 39, Issue 12, (December 2000) https://doi.org/10.1117/12.10.1117/1.1327503

KEYWORDS: Digital holography, 3D image reconstruction, CCD image sensors, Charge-coupled devices, Holograms, Spatial resolution, Diffraction, Holography, Digital recording, Speckle

Proceedings Article | 16 November 2000 Paper

Paper

Criteria for phase reconstruction using Fourier transformation method

Bing Zhao, Anand Asundi

Proceedings Volume 4123, (2000) https://doi.org/10.1117/12.409279

KEYWORDS: Spatial resolution, Fourier transforms, Phase measurement, Optical filters, Fringe analysis, Spatial frequencies, Signal processing, Signal to noise ratio, Spatial filters, Filtering (signal processing)

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Proceedings Article | 23 October 2000 Paper

Paper

Measurement of thermal deformation of IC packages using the AFM scanning moire technique

Zhaowei Zhong, Yunguang Lu, Huimin Xie, Bryan Ngoi, Jin Yu, Gin Chai, Anand Asundi

Proceedings Volume 4229, (2000) https://doi.org/10.1117/12.404871

KEYWORDS: Moire patterns, Diffraction gratings, Atomic force microscopy, Fringe analysis, CCD cameras, Raster graphics, Scanners, Scanning electron microscopy, Spatial resolution, Microelectronics

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SPIE Journal Paper | 1 October 2000

Novel full-field automated photoelastic analysis technique

Tong Liu, Chai Boay, Anand Asundi

OE, Vol. 39, Issue 10, (October 2000) https://doi.org/10.1117/12.10.1117/1.1290468

KEYWORDS: Phase shifts, Photoelastic analysis, Photoelasticity, Optical engineering, Shape analysis, Image compression, Polarizers, Phase shifting, Fringe analysis, Mechanical engineering

SPIE Journal Paper | 1 October 2000

Discussion on spatial resolution and sensitivity of fourier transform fringe detection

Bing Zhao, Anand Asundi

OE, Vol. 39, Issue 10, (October 2000) https://doi.org/10.1117/12.10.1117/1.1290683

KEYWORDS: Spatial resolution, Fourier transforms, Optical filters, Phase measurement, Fringe analysis, Image filtering, Spatial filters, Signal to noise ratio, Spatial frequencies, Signal processing

SPIE Journal Paper | 1 June 2000

Optical strain sensor using position-sensitive detector and diffraction grating: error analysis

Anand Asundi, Bing Zhao

OE, Vol. 39, Issue 06, (June 2000) https://doi.org/10.1117/12.10.1117/1.602541

KEYWORDS: Sensors, Diffraction gratings, Diffraction, Interference (communication), Spatial resolution, Quantization, Position sensors, Error analysis, Optical engineering, Signal processing

Proceedings Article | 14 April 2000 Paper

Paper

Laser interferometric studies of thermal effects of diode-pumped solid state lasing medium

Xiaoyuan Peng, Anand Asundi, Lei Xu, Yihong Chen, Zhengjun Xiong, Gnian Cher Lim

Proceedings Volume 3929, (2000) https://doi.org/10.1117/12.382764

KEYWORDS: Thermal effects, Crystals, Laser crystals, Neodymium, Semiconductor lasers, Solid state lasers, Interferometry, Interferometers, Nd:YAG lasers, Diode pumped solid state lasers

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Proceedings Article | 11 November 1999 Paper

Paper

Development and application of micro-moire interferometer

Kim Oh, Gin Chai, Anand Asundi, Kai Chan, Tai Chai

Proceedings Volume 3897, (1999) https://doi.org/10.1117/12.369364

KEYWORDS: Moire patterns, Interferometers, Fringe analysis, Electronics, Interfaces, Silicon, Deflectometry, Spatial resolution, Composites, Temperature metrology

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Proceedings Article | 11 November 1999 Paper

Paper

Comparison of grating structures in optical fibers and integrated optics for MEMS applications

Seriampalayam Natarajan, Vadakke Murukeshan, Anand Asundi

Proceedings Volume 3897, (1999) https://doi.org/10.1117/12.369331

KEYWORDS: Fiber Bragg gratings, Optical fibers, Ultraviolet radiation, Refractive index, Microelectromechanical systems, Integrated optics, Sensors, Switching, Prisms, Micromachining

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Proceedings Article | 11 November 1999 Paper

Paper

Portable system approach of monitoring plant nutrient deficiency using fiber optic spectrophotometry

Anand Asundi, Jun-Wei Chen, Duo-Min He, Oi Wah Liew

Proceedings Volume 3897, (1999) https://doi.org/10.1117/12.369310

KEYWORDS: Reflectivity, Calcium, Fiber optics, Spectroscopy, Nitrogen, Spectrophotometry, Data acquisition, Chemical elements, Sensing systems, Optical sensing

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Proceedings Article | 11 November 1999 Paper

Paper

Fiber optic vibration sensor-based smart civil structures

Jinsong Leng, Anand Asundi

Proceedings Volume 3897, (1999) https://doi.org/10.1117/12.369347

KEYWORDS: Fiber optics sensors, Sensors, Fiber optics, Optical fibers, Composites, Speckle, Speckle pattern, Smart materials, Vibrometry, Bridges

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Proceedings Article | 11 November 1999 Paper

Paper

Simultaneous strain and displacement measurements in micromechanics

Bing Zhao, Anand Asundi

Proceedings Volume 3897, (1999) https://doi.org/10.1117/12.369335

KEYWORDS: Diffraction gratings, Microscopes, Diffraction, Phase shifts, Objectives, Spatial resolution, Phase shifting, Refraction, CCD image sensors, Image quality

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Proceedings Article | 11 November 1999 Paper

Paper

Grid method for strain measurement in electronic packaging using optical, electronic, and atomic force microscope

Bing Zhao, Anand Asundi, Kim Oh

Proceedings Volume 3897, (1999) https://doi.org/10.1117/12.369315

KEYWORDS: Spatial resolution, Fourier transforms, Moire patterns, Packaging, Scanning electron microscopy, Optical microscopes, Atomic force microscope, Microscopes, Image processing, Microscopy

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Proceedings Article | 11 November 1999 Paper

Paper

Micro-electro-mechanical fiber optical switches

Ai Liu, Franck Chollet, Anand Asundi, Jianmin Miao

Proceedings Volume 3897, (1999) https://doi.org/10.1117/12.369330

KEYWORDS: Diffraction gratings, Switches, Diffraction, Semiconducting wafers, Optical design, Fiber optics, Mirrors, Photodetectors, Switching, Actuators

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Proceedings Article | 11 November 1999 Paper

Paper

Mechanical behavior measurement of wood by ESPI method

Lijun Jiang, Anand Asundi, Kathrin Winkelmann

Proceedings Volume 3897, (1999) https://doi.org/10.1117/12.369340

KEYWORDS: Speckle pattern, Speckle, Interferometry, Nondestructive evaluation, CCD cameras, Interferometers, Semiconductor lasers, Phase shift keying, Lithium, Mechanical engineering

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Proceedings Article | 11 November 1999 Paper

Paper

Optical time-domain reflectometry for distributed sensing of the structural strain and deformation

Guangping Xie, Leong Seah, Anand Asundi

Proceedings Volume 3897, (1999) https://doi.org/10.1117/12.369346

KEYWORDS: Sensors, Spatial resolution, Switches, Micro optical fluidics, Signal attenuation, Multimode fibers, Optical fibers, Reflectometry, Fiber optics sensors, Signal to noise ratio

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Proceedings Article | 11 November 1999 Paper

Paper

Full-field stress/birefringence analysis with a polarizing microscope

Anand Asundi, Bing Zhao

Proceedings Volume 3897, (1999) https://doi.org/10.1117/12.369314

KEYWORDS: Microscopes, Phase shifts, Phase shifting, Photoelasticity, Fringe analysis, Polarizers, Polymers, Light sources, Image processing, Composites

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Proceedings Article | 11 November 1999 Paper

Paper

Detection of cracks in aluminum beams using fiber optic polarimetric sensor

Jianjun Ma, Anand Asundi

Proceedings Volume 3897, (1999) https://doi.org/10.1117/12.369372

KEYWORDS: Fiber optics sensors, Sensors, Polarimetry, Aluminum, Fiber optics, Helium neon lasers, Fiber lasers, Light, Birefringence, Safety

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Proceedings Article | 11 November 1999 Paper

Paper

Fiber optic Raman spectroscopy: an application for the in-situ measurement of water content in methanol

Anand Asundi, Vasudevarao Veeredhi

Proceedings Volume 3897, (1999) https://doi.org/10.1117/12.369303

KEYWORDS: Raman spectroscopy, Fiber optics, Spectroscopy, Fiber optics tests, Silicon, Bioalcohols, Sensors, Semiconductor lasers, Calibration, Reliability

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Proceedings Article | 9 November 1999 Paper

Paper

Improved silicon micromachined 3D mirror for acceleration sensing using an extrashort external-cavity laser self-mixing interferometer

Franck Chollet, Ai Liu, Ludi Zheng, Anand Asundi, LiWie Lin

Proceedings Volume 3899, (1999) https://doi.org/10.1117/12.369381

KEYWORDS: Mirrors, Actuators, Sensors, Reflectivity, Semiconductor lasers, Gold, Diffraction, Silicon, 3D surface sensing, Interferometers

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Proceedings Article | 4 November 1999 Paper

Paper

Thermal effects of diode-end-pumped Nd:YVO4 solid state laser

Anand Asundi, Xiaoyuan Peng, Yihong Chen, Zhengjun Xiong, Gnian Cher Lim, HongYu Zheng

Proceedings Volume 3898, (1999) https://doi.org/10.1117/12.368474

KEYWORDS: Thermal effects, Neodymium lasers, Resonators, Refractive index, Crystals, Semiconductor lasers, Laser crystals, Laser resonators, Diodes, Interferometers

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Proceedings Article | 20 July 1999 Paper

Paper

Polysilicon surface micromachined optical rotating sensor

Ludi Zheng, Anand Asundi, Ai Liu, Franck Chollet

Proceedings Volume 3673, (1999) https://doi.org/10.1117/12.354270

KEYWORDS: Mirrors, Sensors, Resonators, Semiconductor lasers, Signal processing, Modulation, Reflectivity, Surface micromachining, Micromirrors, Geometrical optics

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Proceedings Article | 9 June 1999 Paper

Paper

Vibration active control of smart structures incorporating ER actuators and fiber optic vibration sensors based on speckle detection

Jinsong Leng, Anand Asundi

Proceedings Volume 3668, (1999) https://doi.org/10.1117/12.350771

KEYWORDS: Fiber optics sensors, Control systems, Smart structures, Actuators, Sensors, Fiber optics, Optical fibers, Fluid dynamics, Speckle, Vibration control

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Proceedings Article | 31 May 1999 Paper

Paper

Toward realization of a smart polarimetric sensor

Vadakke Murukeshan, Peng-Yang Chan, Lin Ong, Anand Asundi

Proceedings Volume 3670, (1999) https://doi.org/10.1117/12.349714

KEYWORDS: Sensors, Optical fibers, Fiber optics sensors, Polarimetry, Composites, Fiber coatings, Defect detection, Structured optical fibers, Smart structures, Coating

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Proceedings Article | 7 May 1999 Paper

Paper

Using field bus for optical gas monitoring

Xiangyin Cheng, Leong Seah, Lin Ong, Anand Asundi

Proceedings Volume 3740, (1999) https://doi.org/10.1117/12.347794

KEYWORDS: Sensors, Telecommunications, Data communications, Gas sensors, Receivers, Control systems, Signals intelligence, Toxic gases, Opacity, Optical testing

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Proceedings Article | 7 May 1999 Paper

Paper

Fiber optic spectrophotometry monitoring of plant nutrient deficiency under hydroponic culture conditions

Oi Wah Liew, William Boey, Anand Asundi, Jun-Wei Chen, Duo-Min He

Proceedings Volume 3740, (1999) https://doi.org/10.1117/12.347795

KEYWORDS: Reflectivity, Calcium, Fiber optics, Nitrogen, Spectrophotometry, Tissues, Nondestructive evaluation, Chemical elements, Visualization, Spectroscopy

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Proceedings Article | 7 May 1999 Paper

Paper

Residual stresses in unsymmetric laminated carbon fiber composites

Yu Liu, Meng Quek, Anand Asundi

Proceedings Volume 3740, (1999) https://doi.org/10.1117/12.347779

KEYWORDS: Composites, Deflectometry, Carbon, Diffraction gratings, Mechanical engineering, Product engineering, Moire patterns, Optical engineering, Optical sensing, Nanotechnology

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Proceedings Article | 7 May 1999 Paper

Paper

Industrial applications of residual stress determination using 2D in-plane sensitive fiber ESPI and hole drilling

Anand Asundi, Jingbo Zhang

Proceedings Volume 3740, (1999) https://doi.org/10.1117/12.347761

KEYWORDS: Fringe analysis, Interferometry, Speckle pattern, Visibility, Beam splitters, Reliability, Mechanical engineering, Product engineering, Illumination engineering, Structural engineering

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Proceedings Article | 7 May 1999 Paper

Paper

Fiber optic spectrophotometry for monitoring dissolved oxygen in a tropical ornamental fish tank environment

Anand Asundi, Jun-Wei Chen, Duo-Min He

Proceedings Volume 3740, (1999) https://doi.org/10.1117/12.347744

KEYWORDS: Oxygen, Sensors, Fiber optics, Fiber optics sensors, Luminescence, Environmental monitoring, Environmental sensing, Spectrophotometry, Signal detection, Ruthenium

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Proceedings Article | 7 May 1999 Paper

Paper

Measurement for thickness variation of a latex membrane by ESPI method

Anand Asundi, Lijun Jiang

Proceedings Volume 3740, (1999) https://doi.org/10.1117/12.347771

KEYWORDS: Speckle pattern, Latex, Interferometry, Speckle, CCD cameras, Beam splitters, Ultrasonics, Microscopes, Reflectivity, Speckle metrology

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Proceedings Article | 29 April 1999 Paper

Paper

Moire interferometric strain sensor

Anand Asundi, Bing Zhao

Proceedings Volume 3729, (1999) https://doi.org/10.1117/12.346814

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Proceedings Article | 28 April 1999 Paper

Paper

Health monitoring of structures using fiber optic sensors

Anand Asundi

Proceedings Volume 3666, (1999) https://doi.org/10.1117/12.347969

KEYWORDS: Fiber optics sensors, Sensors, Composites, Polarimetry, Optical fibers, Aluminum, Birefringence, Fiber optics, Fiber coatings, Nondestructive evaluation

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Proceedings Article | 8 February 1999 Paper

Paper

FOPSESPI for nondestructive evaluation (NDE) of composites

Vadakke Murukeshan, Sant Malhotra, Anand Asundi

Proceedings Volume 3585, (1999) https://doi.org/10.1117/12.339857

KEYWORDS: Phase shifting, Nondestructive evaluation, Composites, Fringe analysis, Fiber optics, Glasses, Modulators, Ferroelectric materials, Signal processing, Speckle pattern

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Proceedings Article | 3 February 1999 Paper

Paper

Vibration measurement of smart composite structures using a new intensity-modulated optical fiber sensor

Jinsong Leng, Anand Asundi, Shanyi Du, Danfu Wang

Proceedings Volume 3541, (1999) https://doi.org/10.1117/12.339081

KEYWORDS: Sensors, Fiber optics sensors, Optical fibers, Modulation, Composites, Smart materials, Fiber optics, Vibrometry, Capillaries, Multimode fibers

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SPIE Journal Paper | 1 February 1999

Mapping algorithm for 360-deg profilometry with time delayed integration imaging

Anand Asundi, Wensen Zhou

OE, Vol. 38, Issue 02, (February 1999) https://doi.org/10.1117/12.10.1117/1.602093

KEYWORDS: CCD cameras, Cameras, Fringe analysis, Imaging systems, Distortion, Optical engineering, Phase shifts, Profiling, Phase measurement, Reconstruction algorithms

SPIE Journal Paper | 1 January 1999

Strain microscope with grating diffraction method

Bing Zhao, Anand Asundi

OE, Vol. 38, Issue 01, (January 1999) https://doi.org/10.1117/12.10.1117/1.602072

KEYWORDS: Diffraction gratings, Diffraction, Microscopes, Image quality, Spatial resolution, Objectives, CCD image sensors, Image processing, Light sources, Optical engineering

Proceedings Article | 8 December 1998 Paper

Paper

Underwater modulable hollow retro-reflector in ocean

Duo-Min He, Anand Asundi

Proceedings Volume 3430, (1998) https://doi.org/10.1117/12.332472

KEYWORDS: Retroreflectors, Ocean optics, Telecommunications, Modulation, Channel projecting optics, Reflectors, Glasses, Laser communications, Transponders, Optical components

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Proceedings Article | 2 October 1998 Paper

Paper

Salt water for optical breakdown laser-generated sound

Duo-Min He, Anand Asundi

Proceedings Volume 3464, (1998) https://doi.org/10.1117/12.323151

KEYWORDS: Pulsed laser operation, Acoustics, Laser optics, Laser energy, Ocean optics, Liquids, Electroluminescence, Stereolithography, Power supplies, Scanning probe lithography

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Proceedings Article | 2 October 1998 Paper

Paper

Optical breakdown laser-generated sound in water

Duo-Min He, Anand Asundi

Proceedings Volume 3464, (1998) https://doi.org/10.1117/12.323152

KEYWORDS: Pulsed laser operation, Acoustics, Laser energy, Laser optics, Electroluminescence, Stereolithography, Liquids, Ocean optics, Water, Signal detection

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Proceedings Article | 29 September 1998 Paper

Paper

Grating diffraction for strain measurement in a microscope

Bing Zhao, Anand Asundi

Proceedings Volume 3407, (1998) https://doi.org/10.1117/12.323364

KEYWORDS: Diffraction gratings, Diffraction, Microscopes, Image quality, Image processing, Spatial resolution, CCD image sensors, Light sources, Objectives, Image sensors

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Proceedings Article | 29 September 1998 Paper

Paper

Digital moire: techniques and applications

Anand Asundi

Proceedings Volume 3407, (1998) https://doi.org/10.1117/12.323358

KEYWORDS: Moire patterns, LCDs, Fringe analysis, Digital imaging, Phase shifting, Imaging systems, Superposition, Diffraction gratings, Binary data, Phase shifts

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Proceedings Article | 16 April 1998 Paper

Paper

Polarimetric sensors for strain measurement and damage detection

Anand Asundi

Proceedings Volume 3321, (1998) https://doi.org/10.1117/12.305563

KEYWORDS: Polarization, Sensors, Fiber optics sensors, Polarimetry, Composites, Damage detection, Optical fibers, Photoelasticity, Beam splitters, Interferometry

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Proceedings Article | 2 January 1998 Paper

Paper

Recent advances in photoelastic applications

Anand Asundi

Proceedings Volume 3211, (1998) https://doi.org/10.1117/12.345563

KEYWORDS: Photoelasticity, Stress analysis, Finite element methods, Image processing, Fringe analysis, Fiber optics sensors, Stereolithography

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Proceedings Article | 14 November 1997 Paper

Paper

Micro-optical filter using a polysilicon surface micromachining process

Anand Asundi, Liren Zheng, Norman Tien, Z. Chen, Ai Liu

Proceedings Volume 3241, (1997) https://doi.org/10.1117/12.293535

KEYWORDS: Optical filters, Camera shutters, Surface micromachining, Optical fabrication, Silicon, Diffraction gratings, Microelectromechanical systems, Sensors, Optics manufacturing, Photodetectors

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SPIE Journal Paper | 1 September 1997

Time delay and integration imaging for inspection and profilometry of moving objects

Sajan Marokkey, Cho Tay, Huai Shang, Anand Asundi

OE, Vol. 36, Issue 09, (September 1997) https://doi.org/10.1117/12.10.1117/1.601497

KEYWORDS: Inspection, Sensors, Fourier transforms, Cameras, Modulation, Semiconductor lasers, Imaging systems, Line scan sensors, Profiling, Scanners

Proceedings Article | 20 March 1997 Paper

Paper

Inspection and profiling of moving objects using a TDI camera

M. Sajan, Cho Tay, Huai Shang, Anand Asundi

Proceedings Volume 2921, (1997) https://doi.org/10.1117/12.269877

KEYWORDS: Inspection, Cameras, Sensors, Profiling, Moire patterns, Fourier transforms, Modulation, CCD cameras, Semiconductor lasers, Imaging systems

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Proceedings Article | 20 March 1997 Paper

Paper

Phase unwrapping in photoelasticity

Xianyu Su, Anand Asundi, M. Sajan

Proceedings Volume 2921, (1997) https://doi.org/10.1117/12.269839

KEYWORDS: Phase shift keying, Photoelasticity, Modulation, Fringe analysis, Binary data, Phase shifting, Quantitative analysis, Reliability, Inspection, 3D modeling

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Proceedings Article | 20 March 1997 Paper

Paper

Fourier transform profilometry for 360-deg shape using TDI camera

Xianyu Su, M. Sajan, Anand Asundi

Proceedings Volume 2921, (1997) https://doi.org/10.1117/12.269875

KEYWORDS: Cameras, Fourier transforms, Fringe analysis, Image processing, Head, Optical filters, 3D metrology, Sensors, Distortion, Structured light

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Proceedings Article | 20 March 1997 Paper

Paper

Defect measurement using structured light system

Siew-Lok Toh, W. Low, Cho Tay, Huai Shang, Anand Asundi

Proceedings Volume 2921, (1997) https://doi.org/10.1117/12.269871

KEYWORDS: Fringe analysis, Moire patterns, Cameras, CCD cameras, Process control, Optical inspection, Inspection, Modulation, Optics manufacturing, Structured light

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Proceedings Article | 5 August 1996 Paper

Paper

Effect of input polarization angle on force sensitivity of embedded single-mode polarimetric sensors

Anand Asundi, H. Cheng, Siew-Lok Toh, Cho Tay

Proceedings Volume 2872, (1996) https://doi.org/10.1117/12.245569

KEYWORDS: Polarization, Polarizers, Coating, Polarimetry, Fiber coatings, Sensors, Single mode fibers, Plastic coatings, Photodiodes, Birefringence

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SPIE Journal Paper | 1 June 1996

Digital drum camera for dynamic recording

Anand Asundi, Sajan Marokkey

OE, Vol. 35, Issue 06, (June 1996) https://doi.org/10.1117/12.10.1117/1.600746

KEYWORDS: Cameras, Photoelasticity, Digital cameras, Digital recording, Charge-coupled devices, Inspection, Sensors, Imaging systems, Semiconductor lasers, Video

Proceedings Article | 30 May 1995 Paper

Paper

Low-cost digital dynamic visualization system

Anand Asundi, M. Sajan

Proceedings Volume 2513, (1995) https://doi.org/10.1117/12.209612

KEYWORDS: Cameras, Light emitting diodes, Photoelasticity, Visualization, Charge-coupled devices, Photography, Fluid dynamics, Imaging systems, Digital recording, Dynamical systems

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Proceedings Article | 8 May 1995 Paper

Paper

Use of optical fiber strain sensor for damage detection in composite structures

Prafulla Masalkar, Sant Malhotra, Rajpal Sirohi, Anand Asundi

Proceedings Volume 2443, (1995) https://doi.org/10.1117/12.208260

KEYWORDS: Composites, Polarization, Optical fibers, Birefringence, Sensors, Damage detection, Beam splitters, Fiber optics sensors, Epoxies, Single mode fibers

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Proceedings Article | 20 April 1995 Paper

Paper

Fiber optic strain sensor: comparison of HiBi fibers

Anand Asundi, Prafulla Masalkar

Proceedings Volume 2574, (1995) https://doi.org/10.1117/12.207753

KEYWORDS: Polarization, Birefringence, Coating, Sensors, Optical fibers, Cladding, Single mode fibers, Beam splitters, Fiber optics sensors, Fiber optics

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Proceedings Article | 27 March 1995 Paper

Paper

High-speed TDI imaging for peripheral inspection

Anand Asundi, Marokkey Sajan, Gaylord Olson, Jo Walker

Proceedings Volume 2423, (1995) https://doi.org/10.1117/12.205504

KEYWORDS: Cameras, Moire patterns, Inspection, Modulation, Imaging systems, Machine vision, Fringe analysis, Semiconductor lasers, Fourier transforms, Structured light

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Proceedings Article | 13 October 1994 Paper

Paper

Phase-shifting digital projection system for surface profile measurement

Chi-Shing Chan, Anand Asundi

Proceedings Volume 2354, (1994) https://doi.org/10.1117/12.189113

KEYWORDS: Projection systems, Phase shifting, LCDs, Metals, Cameras, Phase shifts, Moire patterns, CCD cameras, Nondestructive evaluation, Optical scanning

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Proceedings Article | 3 October 1994 Paper

Paper

Digital moire applications in automated inspection

Anand Asundi, Sajan Marokkey, Gaylord Olson, Jo Walker

Proceedings Volume 2347, (1994) https://doi.org/10.1117/12.188738

KEYWORDS: Moire patterns, Inspection, Cameras, Machine vision, Charge-coupled devices, Imaging systems, Sensors, Visualization, Semiconductor lasers, Structured light

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SPIE Journal Paper | 1 September 1994

Low-cost digital polariscope for dynamic photoelasticity

Anand Asundi, Sajan Marokkey

OE, Vol. 33, Issue 09, (September 1994) https://doi.org/10.1117/12.10.1117/12.177512

KEYWORDS: Photoelasticity, Light emitting diodes, Cameras, CCD cameras, Fringe analysis, Photography, Digital recording, Visualization, Imaging systems, Stress analysis

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SPIE Journal Paper | 1 August 1994

360-deg profilometry: new techniques for display and acquisition

Anand Asundi, Chi-Shing Chan, Sajan Marokkey

OE, Vol. 33, Issue 08, (August 1994) https://doi.org/10.1117/12.10.1117/12.176507

KEYWORDS: Moire patterns, Modulation, Data acquisition, Semiconductor lasers, Cameras, Head, Defect detection, Phase shifting, Imaging systems, Structured light

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Proceedings Article | 27 August 1993 Paper

Paper

Computer gratings display and applications

Anand Asundi

Proceedings Volume 1910, (1993) https://doi.org/10.1117/12.151160

KEYWORDS: Moire patterns, LCDs, Diffraction gratings, Reflection, CRTs, Visualization, Fringe analysis, Neodymium, Mechanical engineering, Display technology

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Proceedings Article | 6 May 1993 Paper

Paper

Distortion and defect identification on curved objects

Anand Asundi, Marokkey Sajan

Proceedings Volume 1907, (1993) https://doi.org/10.1117/12.144811

KEYWORDS: Distortion

Proceedings Article | 18 January 1993 Paper

Paper

Computer gratings for vibration analysis

C. Wong, Anand Asundi

Proceedings Volume 1713, (1993) https://doi.org/10.1117/12.138485

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Proceedings Article | 18 January 1993 Paper

Paper

Automated visual inspection of moving objects

Anand Asundi, M Sajan

Proceedings Volume 1713, (1993) https://doi.org/10.1117/12.138476

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Proceedings Article | 18 January 1993 Paper

Paper

Structured-light-assisted CAD/CAM

Chi-Shing Chan, Anand Asundi

Proceedings Volume 1713, (1993) https://doi.org/10.1117/12.138498

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Proceedings Article | 18 January 1993 Paper

Paper

Image filtering using 2D fast Hartley transformation

K. Lo, Anand Asundi

Proceedings Volume 1713, (1993) https://doi.org/10.1117/12.138475

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SPIE Journal Paper | 1 January 1993

Moiré methods using computer-generated gratings

Anand Asundi

OE, Vol. 32, Issue 01, (January 1993) https://doi.org/10.1117/12.10.1117/12.60083

KEYWORDS: Moire patterns, LCDs, Fringe analysis, Phase shifting, Interferometry, Visualization, Projection systems, Binary data, Image enhancement, Vibrometry

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Proceedings Article | 1 January 1992 Paper

Paper

Hologram interferometry using PSALM

Anand Asundi

Proceedings Volume 1553, (1992) https://doi.org/10.1117/12.135316

KEYWORDS: Moire patterns, Holography, Phase shifting, Fringe analysis, Holographic interferometry, Interferometry, Phase shifts, Binary data, Holograms, Laser interferometry

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Proceedings Article | 1 December 1991 Paper

Paper

Novel grating methods for optical inspection

Anand Asundi

Proceedings Volume 1554, (1991) https://doi.org/10.1117/12.57462

KEYWORDS: Moire patterns, LCDs, Fringe analysis, Phase shifting, Optical inspection, Reflection, Image enhancement, Diffraction gratings, Holographic interferometry, Mechanics

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Proceedings Article | 1 December 1991 Paper

Paper

Projection moire using PSALM

Anand Asundi

Proceedings Volume 1554, (1991) https://doi.org/10.1117/12.57495

KEYWORDS: Moire patterns, Phase shifting, Binary data, Algorithm development, Phase shifts, Phase shift keying, Holographic interferometry, Mechanics, Frame grabbers, LCDs

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Proceedings Article | 1 December 1991 Paper

Paper

Fringe analysis in moire interferometry

Anand Asundi

Proceedings Volume 1554, (1991) https://doi.org/10.1117/12.57431

KEYWORDS: Moire patterns, Fringe analysis, Deflectometry, Interferometry, Phase shifting, Finite element methods, Holographic interferometry, Mechanics, Composites, Fourier transforms

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Proceedings Article | 1 March 1991 Paper

Paper

Contouring using gratings created on a LCD panel

Anand Asundi, C. Wong

Proceedings Volume 1400, (1991) https://doi.org/10.1117/12.26117

KEYWORDS: LCDs, Moire patterns, Digital imaging, Switches, Optical fabrication, Optical testing, Software development, Frame grabbers, CCD cameras, Binary data

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Proceedings Article | 1 March 1991 Paper

Paper

Defocused white light speckle method for object contouring

Anand Asundi

Proceedings Volume 1385, (1991) https://doi.org/10.1117/12.25362

KEYWORDS: Speckle pattern, Speckle, Reflectivity, Binary data, Optical spheres, Optical filters, Projection systems, Cameras, Spatial frequencies, Machine vision

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Showing 5 of 266 publications

Proceedings Volume Editor (33)

SPIE Conference Volume | 18 September 2020

Advances in Metrology for X-Ray and EUV Optics IX

SPIE Conference Volume | 16 October 2019

Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019)

SPIE Conference Volume | 4 October 2019

Advances in Metrology for X-Ray and EUV Optics VIII

SPIE Conference Volume | 9 August 2018

Optical Micro- and Nanometrology VII

SPIE Conference Volume | 4 January 2018

AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing

Showing 5 of 33 publications

Conference Committee Involvement (69)

Optical Measurement Systems for Industrial Inspection XIV

23 June 2025 | Munich, Germany

Applied Optical Metrology V

22 August 2023 | San Diego, California, United States

Optical Measurement Systems for Industrial Inspection XIII

26 June 2023 | Munich, Germany

Applied Optical Metrology IV

4 August 2021 | San Diego, California, United States

Optical Measurement Systems for Industrial Inspection XII

21 June 2021 | Online Only, Germany

Advances in Metrology for X-Ray and EUV Optics IX

24 August 2020 | Online Only, California, United States

Applied Optical Metrology III

13 August 2019 | San Diego, California, United States

Advances in Metrology for X-Ray and EUV Optics VIII

11 August 2019 | San Diego, California, United States

Seventh International Conference on Optical and Photonic Engineering (icOPEN 2019)

16 July 2019 | Phuket, Thailand

Optical Measurement Systems for Industrial Inspection XI

24 June 2019 | Munich, Germany

Optical Micro- and Nanometrology

25 April 2018 | Strasbourg, France

Applied Optical Metrology II

8 August 2017 | San Diego, California, United States

Advances in Metrology for X-Ray and EUV Optics VII

6 August 2017 | San Diego, California, United States

Optical Measurement Systems for Industrial Inspection X

26 June 2017 | Munich, Germany

3D Measurement Technology for Intelligent Manufacturing

4 June 2017 | Beijing, China

icOPEN2017

4 April 2017 |

Fifth International Conference on Optical and Photonics Engineering

4 April 2017 | Singapore, Singapore

Second International Conference on Photonics and Optical Engineering

14 October 2016 | Xi'an, China

Fourth International Conference on Optical and Photonics Engineering

26 September 2016 | Chengdu, China

icOPEN2016

26 September 2016 |

Interferometry XVIII

30 August 2016 | San Diego, California, United States

Advances in Metrology for X-Ray and EUV Optics VI

29 August 2016 | San Diego, California, United States

Optical Micro- and Nanometrology

5 April 2016 | Brussels, Belgium

Applied Advanced Optical Metrology Solutions

11 August 2015 | San Diego, California, United States

International Conference on Photonics Solutions 2015

6 July 2015 | Hua Hin, Thailand

Optical Measurement Systems for Industrial Inspection IX

22 June 2015 | Munich, Germany

Dimensional Optical Metrology and Inspection for Practical Applications IV

20 April 2015 | Baltimore, MD, United States

International Conference on Optical and Photonic Engineering (icOPEN 2015)

14 April 2015 | Singapore, Singapore

International Conference on Experimental Mechanics 2014

15 November 2014 | Singapore, Singapore

The International Conference on Photonics and Optical Engineering and the Annual West China Photonics Conference (icPOE 2014)

13 October 2014 | Xi'an, China

Interferometry XVII: Advanced Applications

19 August 2014 | San Diego, California, United States

Advances in Metrology for X-Ray and EUV Optics V

18 August 2014 | San Diego, California, United States

Dimensional Optical Metrology and Inspection for Practical Applications III

5 May 2014 | Baltimore, MD, United States

Optical Micro- and Nanometrology

15 April 2014 | Brussels, Belgium

Dimensional Optical Metrology and Inspection for Practical Applications II

25 August 2013 | San Diego, California, United States

Optical Measurement Systems for Industrial Inspection VIII

13 May 2013 | Munich, Germany

International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)

9 April 2013 | Singapore, Singapore

Interferometry XVI: Applications

14 August 2012 | San Diego, California, United States

Advances in Metrology for X-Ray and EUV Optics IV

12 August 2012 | San Diego, California, United States

Optical Micro- and Nanometrology

16 April 2012 | Brussels, Belgium

Dimensional Optical Metrology and Inspection for Practical Applications

22 August 2011 | San Diego, California, United States

Optical Measurement Systems for Industrial Inspection

23 May 2011 | Munich, Germany

Interferometry XV: Applications

3 August 2010 | San Diego, California, United States

Advances in Metrology for X-Ray and EUV Optics III

1 August 2010 | San Diego, California, United States

Optical Micro- and Nanometrology

13 April 2010 | Brussels, Belgium

Fourth International Conference on Experimental Mechanics

18 November 2009 | Singapore, Singapore

International Conference on Experimental Mechanics

18 November 2009 |

Second International Conference on Smart Materials and Nanotechnology in Engineering

8 July 2009 | Weihai, China

Optical Measurement Systems for Industrial Inspection

16 June 2009 | Munich, Germany

Interferometry XIV: Applications

13 August 2008 | San Diego, California, United States

Ninth International Symposium on Laser Metrology

30 June 2008 | Singapore, Singapore

Optical Micro- and Nanometrology in Microsystems Technology

8 April 2008 | Strasbourg, France

International Conference on Smart Materials and Nanotechnology in Engineering

1 July 2007 | Harbin, China

Optical Measurement Systems for Industrial Inspection

18 June 2007 | Munich, Germany

Interferometry XIII: Applications

16 August 2006 | San Diego, California, United States

Optical Micro- and Nanometrology in Microsystems Technology

5 April 2006 | Strasbourg, France

Optical Measurement Systems for Industrial Inspection IV

13 June 2005 | Munich, Germany

Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics

29 November 2004 | -, Singapore

Interferometry XII: Applications

4 August 2004 | Denver, Colorado, United States

Optical Micro- and Nanometrology in Manufacturing Technology

29 April 2004 | Strasbourg, France

Optical Metrology in Production Engineering

27 April 2004 | Strasbourg, France

Optical Diagnostics for Fluids, Solids, and Combustion II

3 August 2003 | San Diego, California, United States

Microsystems Engineering: Metrology and Inspection III

23 June 2003 | Munich, Germany

Optical Measurement Systems for Industrial Inspection III

23 June 2003 | Munich, Germany

Transducing Materials and Devices

31 October 2002 | Bruges, Belgium

Advanced Photonics Sensors and Applications II

28 November 2001 | Singapore, Singapore

International Symposium on Photonics and Applications

26 November 2001 | Singapore, Singapore

Advanced Photonic Sensors and Applications

30 November 1999 | Singapore, Singapore

International Conference on Manufacturing Automation

2 August 1992 | Hong Kong, Hong Kong

Showing 5 of 69 Conference Committees

Course Instructor

NON-SPIE: Basic Optical Engineering

Introduction to Optical Engineering with basic principles of Optics and Photonics

Expand Description +

NON-SPIE: Workshop in Aspheric Optics

Aspheric Optics design, manufacturing and testing.

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