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André Beauchesne
at National Research Council Canada
SPIE Involvement:
Author
Publications (2)
Proceedings Article | 11 March 2024 Presentation + Paper
SS-OCT technology for the in-process inspection of the automated fiber placement manufacturing process
Maxime Rivard, Marc Palardy-Sim, Steven Roy, Gil Lund, Matthew Zupan, Mark Benson, Christian Padioleau, André Beauchesne, Louis-Philippe Carignan, Ali Yousefpour, Guy Lamouche
Proceedings Volume 12893, 128930O (2024) https://doi.org/10.1117/12.3002630
KEYWORDS: Manufacturing, Head, Inspection, Fabrication, Optical coherence tomography, Distance measurement, Reflectivity, Reflection, Industry, System integration
Proceedings Article | 19 April 2017 Presentation
Ex-vivo evaluation of an early caries detector based on integrated OCT and polarized Raman spectroscopy (Conference Presentation)
Guy Lamouche, Christian Padioleau, Mark Hewko, Michael S. Smith, Bernie Schattka, Crystal Fulton, Bruno Gauthier, André Beauchesne, Alex Ko, Lin-P'ing Choo-Smith, Michael Sowa
Proceedings Volume 10044, 1004405 (2017) https://doi.org/10.1117/12.2253224
KEYWORDS: Dental caries, Raman spectroscopy, Optical coherence tomography, Sensors, Teeth, Space reconnaissance, Microelectromechanical systems, Image processing, Laser dentistry, Spectroscopes
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