Dr. Anil Karumuri
Sr Engineer at Micron Technology Inc
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 6 April 2015 Paper
Patrick Kearney, Tat Ngai, Anil Karumuri, Jung Yum, Hojune Lee, David Gilmer, Tuan Vo, Frank Goodwin
Proceedings Volume 9422, 94220H (2015) https://doi.org/10.1117/12.2087773
KEYWORDS: Photomasks, Extreme ultraviolet, Reflectivity, Sputter deposition, Multilayers, Semiconducting wafers, Ion beams, Manufacturing, Silicon, EUV optics

Proceedings Article | 6 April 2015 Paper
Proceedings Volume 9422, 94221B (2015) https://doi.org/10.1117/12.2176126
KEYWORDS: Photomasks, Extreme ultraviolet, Inspection, Extreme ultraviolet lithography, Silica, Deposition processes, Standards development, Manufacturing, Ruthenium, Reflectivity

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