Ms. Anne-Sophie Munser Profile

Anne-Sophie Munser

at Fraunhofer-IOF

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Publications (4)

Proceedings Article | 18 June 2024 Presentation

Surface and thin film characterization using angle resolved light scattering: from roughness and defect analysis to in-situ coating inspection

Anne-Sophie Munser, Tobias Herffurth, Christian Mühlig, Thomas Gischkat, Sven Schröder

Proceedings Volume PC13020, PC130200W (2024) https://doi.org/10.1117/12.3029579

KEYWORDS: Light scattering, Optical surfaces, Coating, Thin film coatings, Thin films, Surface finishing, Inspection, Sensors, Laser scattering, Fabrication

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Proceedings Article | 12 July 2023 Open Access

The art of characterizing light scattering from optical components and systems

Marcus Trost, Yusuf Sekman, Anne-Sophie Munser, Alexander Bergner, Nils Rommel, Tobias Herffurth, Paul Böttner, Matthias Goy

Proceedings Volume 12777, 127770Z (2023) https://doi.org/10.1117/12.2689035

KEYWORDS: Light scattering, Laser scattering, Optical gratings, Optical components, Scattering, Astronomical imaging, Mirrors, Light sources and illumination, Scattered light, Diffraction

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Proceedings Article | 2 December 2022 Poster + Presentation + Paper

Non-destructive testing of subsurface damage for early indication of laser-induced damage threshold in fused silica

Anne-Sophie Munser, Marcus Trost, Christian Mühlig, Nora Tadewaldt, Stefan Kuhn, Luisa Coriand, Ulf Hallmeyer

Proceedings Volume 12300, 123000K (2022) https://doi.org/10.1117/12.2642749

KEYWORDS: Light scattering, Scattering, Polishing, Nondestructive evaluation, Absorption, Laser induced damage, Etching, Surface finishing, Silica, Statistical analysis

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Proceedings Article | 4 March 2019 Presentation + Paper

Optical fiber based light scattering detection in microfluidic droplets

Shulin Wohlfeil, Sundar Hengoju, Anne-Sophie Munser, Miguel Tovar, Oksana Shvydkiv, Martin Roth, Sven Schröder, Erik Beckert, Ramona Eberhardt, Andreas Tünnermann

Proceedings Volume 10875, 1087516 (2019) https://doi.org/10.1117/12.2509248

KEYWORDS: Light scattering, Microfluidics, Optical fibers, Scatter measurement, System integration

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