Dr. Antonela Comisso Profile

Dr. Antonela Comisso

at CNR-IFN Padova

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 23 August 2024 Poster + Paper

In-flight star calibration and simulation methodology for the Metis coronagraph on board solar orbiter

Chiara Casini, Paolo Chioetto, Antonela Comisso, Alain Jody Corso, Silvano Fineschi, Fabio Frassetto, Federico Landini, Marco Romoli, Paola Zuppella, Vania Da Deppo

Proceedings Volume 13092, 130927C (2024) https://doi.org/10.1117/12.3019854

KEYWORDS: Stars, Vignetting, Coronagraphy, Calibration, Device simulation, Sensors, Ultraviolet radiation, Matrices, Reflection

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SPIE Journal Paper | 14 September 2016

Optical constants of e-beam evaporated titanium dioxide thin films in the 25.5- to 612-eV energy region

Antonela Comisso, Marco Nardello, Angelo Giglia, Piergiorgio Nicolosi

OE, Vol. 55, Issue 09, 095102, (September 2016) https://doi.org/10.1117/12.10.1117/1.OE.55.9.095102

KEYWORDS: Titanium dioxide, Reflectivity, Titanium, Thin films, Silicon, X-rays, Statistical modeling, Contamination, Interfaces, Extreme ultraviolet

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Proceedings Article | 12 May 2015 Paper

Optical and structural characterization of CeO2/B4C multilayers near boron K-edge energy

M. G. Sertsu, A. Giglia, S. Brose, A. Comisso, Z. S. Wang, L. Juschkin, P. Nicolosi

Proceedings Volume 9510, 95100T (2015) https://doi.org/10.1117/12.2181820

KEYWORDS: Reflectivity, Scanning electron microscopy, Extreme ultraviolet, Extreme ultraviolet lithography, Boron, Multilayers, Interfaces, X-rays, Diffusion, Grazing incidence

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Proceedings Article | 12 May 2015 Paper

Characterization of TiO2 thin films in the EUV and soft x-ray region

A. Comisso, A. Giglia, M. Nardello, E. Tessarolo, L. Calvillo, M. G. Sertsu, G. Granozzi, F. Gerlin, L. Brigo, P. Nicolosi

Proceedings Volume 9510, 95100Z (2015) https://doi.org/10.1117/12.2178142

KEYWORDS: Thin films, Reflectivity, Extreme ultraviolet, X-rays, Surface roughness, Titanium, Refractive index, Silicon, X-ray optics, Titanium dioxide

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