Aoi Onishi
at Wakayama Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 April 2020 Presentation
Takanori Nomura, Koshi Komuro, Naru Yoneda, Shunsuke Kakei, Aoi Onishi, Yusuke Saita
Proceedings Volume 11402, 114020H (2020) https://doi.org/10.1117/12.2559867
KEYWORDS: Phase imaging, Interferometry, Inspection, Cameras

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