Arnold Deal
at US Conec Ltd.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 11 March 2024 Presentation + Paper
Proceedings Volume 12892, 128920P (2024) https://doi.org/10.1117/12.3003234
KEYWORDS: Connectors, Contamination, Particles, Temperature metrology, High power lasers, Air temperature, Reliability, Photonic integrated circuits, Optical surfaces

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