Dr. Arul N. Selvan
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 October 2001 Paper
Axel Buerkle, Ferdinand Schmoeckel, Matthias Kiefer, Bala Amavasai, Fabio Caparrelli, Arul Selvan, Jon Travis
Proceedings Volume 4568, (2001) https://doi.org/10.1117/12.444125
KEYWORDS: Scanning electron microscopy, Control systems, Object recognition, Algorithm development, Telecommunications, Databases, Optical scanning systems, Optical microscopes, Electron microscopes, Sensors

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